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| CMS-PAS-HIG-20-013 | ||
| Measurements of properties of the Higgs boson in the W boson pair decay channel in proton-proton collisions at $\sqrt{s}=$ 13 TeV | ||
| CMS Collaboration | ||
| March 2022 | ||
| Abstract: Production cross sections of the standard model Higgs boson decaying to a pair of W bosons are measured. The analysis targets Higgs bosons produced via gluon fusion, vector boson fusion and in association with a W or Z boson. Candidate events, in which at least one of the W bosons originating from the Higgs boson decays leptonically, are identified by selecting final states with at least two charged leptons and moderate missing transverse momentum. Results are presented in the form of inclusive and differential cross sections, as well as coupling modifiers of the Higgs boson to vector bosons and fermions. The full data set collected by the CMS detector during Run 2 of the LHC is used, corresponding to an integrated luminosity of 138 fb$^{-1}$. The signal strength modifier $\mu$, defined as the ratio of the observed production rate to the standard model expectation, is measured to be $\mu = $ 0.95$^{+0.10}_{-0.09}$. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, EPJC 83 (2023) 667. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 0-jet ggH $p_{\mathrm {T2}} > $ 20 GeV (left) and $p_{\mathrm {T2}} < $ 20 GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 1-a:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 0-jet ggH $p_{\mathrm {T2}} > $ 20 GeV (left) and $p_{\mathrm {T2}} < $ 20 GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 1-b:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 0-jet ggH $p_{\mathrm {T2}} > $ 20 GeV (left) and $p_{\mathrm {T2}} < $ 20 GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 1-c:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 0-jet ggH $p_{\mathrm {T2}} > $ 20 GeV (left) and $p_{\mathrm {T2}} < $ 20 GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 1-d:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 0-jet ggH $p_{\mathrm {T2}} > $ 20 GeV (left) and $p_{\mathrm {T2}} < $ 20 GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 2:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 1-jet ggH $p_{\mathrm {T2}} > 20$ GeV (left) and $p_{\mathrm {T2}} < 20$ GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 2-a:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 1-jet ggH $p_{\mathrm {T2}} > 20$ GeV (left) and $p_{\mathrm {T2}} < 20$ GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 2-b:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 1-jet ggH $p_{\mathrm {T2}} > 20$ GeV (left) and $p_{\mathrm {T2}} < 20$ GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 2-c:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 1-jet ggH $p_{\mathrm {T2}} > 20$ GeV (left) and $p_{\mathrm {T2}} < 20$ GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 2-d:
Observed distributions of the ${m_{\ell \ell}}$ (top) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (bottom) fit variables in the 1-jet ggH $p_{\mathrm {T2}} > 20$ GeV (left) and $p_{\mathrm {T2}} < 20$ GeV (right) DF categories. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 3:
Observed distributions of the ${m_{\ell \ell}}$ (left) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (right) fit variables in the 2-jet ggH DF category. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 3-a:
Observed distributions of the ${m_{\ell \ell}}$ (left) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (right) fit variables in the 2-jet ggH DF category. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 3-b:
Observed distributions of the ${m_{\ell \ell}}$ (left) and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ (right) fit variables in the 2-jet ggH DF category. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 4:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 4-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 4-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 5:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 5-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 5-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 6:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 6-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 6-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF top quark control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 7:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 7-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 7-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 0-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 8:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 8-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 8-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 1-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 9:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 9-a:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 9-b:
Observed distributions of the ${m_{\ell \ell}}$ and ${{m_{\mathrm {T}}} ^{\mathrm{H}}}$ variables in the 2-jet DF $\text {DY}\rightarrow {\tau^{+} \tau^{-}} $ control region. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 10:
Distributions for the $C_{VBF}$ (left) and $C_{ggH}$ (right) classifiers in the \textit {VBF-like} and \textit {ggH-like} VBF DF categories, respectively. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The superimposed ggH and VBF signals are separately stacked. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 10-a:
Distributions for the $C_{VBF}$ (left) and $C_{ggH}$ (right) classifiers in the \textit {VBF-like} and \textit {ggH-like} VBF DF categories, respectively. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The superimposed ggH and VBF signals are separately stacked. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 10-b:
Distributions for the $C_{VBF}$ (left) and $C_{ggH}$ (right) classifiers in the \textit {VBF-like} and \textit {ggH-like} VBF DF categories, respectively. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The superimposed ggH and VBF signals are separately stacked. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 11:
Distribution of the $C_{VBF}$ classifier in a category defined using the VBF DF SR global selection requirements, before the further event categorization based on the classifier outputs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. |
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Figure 12:
Observed distributions of the $\\tilde{m}_{\mathrm {H}}$ fit variable in the WHSS 1-jet e$\mu$ (top left), 2-jet e$\mu$ (top right), 1-jet $\mu\mu$ (bottom left) and 2-jet $\mu\mu$ (bottom right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 12-a:
Observed distributions of the $\\tilde{m}_{\mathrm {H}}$ fit variable in the WHSS 1-jet e$\mu$ (top left), 2-jet e$\mu$ (top right), 1-jet $\mu\mu$ (bottom left) and 2-jet $\mu\mu$ (bottom right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 12-b:
Observed distributions of the $\\tilde{m}_{\mathrm {H}}$ fit variable in the WHSS 1-jet e$\mu$ (top left), 2-jet e$\mu$ (top right), 1-jet $\mu\mu$ (bottom left) and 2-jet $\mu\mu$ (bottom right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 12-c:
Observed distributions of the $\\tilde{m}_{\mathrm {H}}$ fit variable in the WHSS 1-jet e$\mu$ (top left), 2-jet e$\mu$ (top right), 1-jet $\mu\mu$ (bottom left) and 2-jet $\mu\mu$ (bottom right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 12-d:
Observed distributions of the $\\tilde{m}_{\mathrm {H}}$ fit variable in the WHSS 1-jet e$\mu$ (top left), 2-jet e$\mu$ (top right), 1-jet $\mu\mu$ (bottom left) and 2-jet $\mu\mu$ (bottom right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 13:
Observed distributions of the BDT score in the WH3$\ell$ OSSF (left) and SSSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 13-a:
Observed distributions of the BDT score in the WH3$\ell$ OSSF (left) and SSSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 13-b:
Observed distributions of the BDT score in the WH3$\ell$ OSSF (left) and SSSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 14:
Observed distributions of the $ {{m_{\mathrm {T}}} ^{\mathrm{H}}} $ fit variable in the ZH3$\ell$ 1-jet (left) and 2-jet (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 14-a:
Observed distributions of the $ {{m_{\mathrm {T}}} ^{\mathrm{H}}} $ fit variable in the ZH3$\ell$ 1-jet (left) and 2-jet (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 14-b:
Observed distributions of the $ {{m_{\mathrm {T}}} ^{\mathrm{H}}} $ fit variable in the ZH3$\ell$ 1-jet (left) and 2-jet (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 15:
Observed distributions of the BTD score in the ZH4$\ell$ XDF (left) and XSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
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Figure 15-a:
Observed distributions of the BTD score in the ZH4$\ell$ XDF (left) and XSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
png pdf |
Figure 15-b:
Observed distributions of the BTD score in the ZH4$\ell$ XDF (left) and XSF (right) SRs. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
png pdf |
Figure 16:
Observed distribution of the $m_{\ell \ell}$ fit variable in the VH2j DF SR. The uncertainty band corresponds to the total systematic uncertainty in the templates after the fit to data. The signal template is shown both stacked on top of the backgrounds as well as superimposed. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. |
png pdf |
Figure 17:
STXS Stage 1.2 binning scheme. Bins fused together with solid colors are measured as a single bin. |
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Figure 18:
Signal composition in each STXS bin. Generator level bins are reported in the horizontal axis, corresponding analysis categories on the vertical axis. All quantities in the definitions of bins are measured in GeV. |
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Figure 19:
Expected relative fractions of different STXS signal processes in each category. The total number of expected ${\mathrm{H} \to \mathrm{W^{+}} \mathrm{W^{-}}}$ signal events in each category is also shown. |
png pdf |
Figure 20:
Distribution of events as a function of the statistical significance of their corresponding bin in the analysis template, including all channels. Signal and background contributions are shown after the fit to data. |
png pdf |
Figure 21:
Observed likelihood profile for the global signal strength modifier $\mu $. The dashed curve corresponds to likelihood profile obtained considering statistical uncertainties only. |
png pdf |
Figure 22:
Observed signal strength modifiers for the main SM production modes. |
png pdf |
Figure 23:
Correlation matrix between the signal strength modifiers of the main production modes of the Higgs boson. |
png pdf |
Figure 24:
Two-dimensional likelihood profile as a function of the coupling modifiers $\kappa _V$ and $\kappa _f$, using the $\kappa $-framework parametrization. The 95% and 68% CL contours are shown as continuous and dashed lines, respectively. |
png pdf |
Figure 25:
Observed cross sections in each STXS bin, normalized to the SM expectation. |
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Figure 26:
Correlation matrix between the measured STXS bins. All quantities in bin definitions are measured in GeV. |
| Tables | |
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Table 1:
Trigger requirements on the data set used in the analysis. |
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Table 2:
Overview of the selection defining the analysis categories. |
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Table 3:
Summary of the selection used in different flavor ggH categories. |
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Table 4:
Summary of the selection used in same flavor ggH categories. The DYMVA threshold is optimized separately in each sub-category and data set. |
png pdf |
Table 5:
Selection used in the different flavor VBF categories. |
png pdf |
Table 6:
Selection used in the same flavor VBF categories. The DYMVA threshold is optimized separately in each sub-category and data set. |
png pdf |
Table 7:
Event selection and categorization in the WHSS channel. |
png pdf |
Table 8:
Event selection and categorization in the WH3$\ell$ channel. |
png pdf |
Table 9:
Event selection and categorization in the ZH3$\ell$ channel. |
png pdf |
Table 10:
Event selection and categorization in the ZH4$\ell$ channel. |
png pdf |
Table 11:
Summary of the selection applied to different flavor VH2j categories. |
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Table 12:
Contributions of different sources of uncertainty in the signal strength measurement. The systematic component includes the combined effect from all sources besides background normalization and the size of the dataset, which make up the statistical part. |
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Table 13:
Number of events by process in ggH DF tagged categories after the fit to data (scaling the 4 main production modes separately). Numbers in parenthesis indicate expected yields. |
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Table 14:
Number of events by process in ggH SF tagged categories after the fit to data (scaling the 4 main production modes separately). Numbers in parenthesis indicate expected yields. |
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Table 15:
Number of events by process in VBF and VH2j tagged categories after the fit to data (scaling the 4 main production modes separately). Numbers in parenthesis indicate expected yields. |
png pdf |
Table 16:
Number of events by process in WHSS, WH3$\ell$, ZH3$\ell$ and ZH4$\ell$ tagged categories after the fit to data (scaling the 4 main production modes separately). Numbers in parenthesis indicate expected yields. |
png pdf |
Table 17:
Observed cross sections in each STXS bin. The uncertainties on the observed cross sections and their ratio to the SM expectation do not include the theoretical uncertainties on the latter. In cases where the ratio to the SM cross section is measured below zero, an upper limit at 68% confidence level on the observed cross section is reported. All masses and momenta in STXS bin definitions are measured in GeV. |
| Summary |
| A measurement of production cross sections for the Higgs boson have been performed targeting the ggH, VBF, WH, and ZH modes in the ${\mathrm{H}\to\mathrm{W^{+}}\mathrm{W^{-}}} $ decay channel. Results are presented in terms of signal strength modifiers, coupling modifiers, and STXS cross sections. The measurement has been performed on data from pp collisions recorded by the CMS detector at a center-of-mass energy of 13 TeV in 2016, 2017, and 2018, corresponding to an integrated luminosity of 138 fb$^{-1}$. Specific event selections targeting different final states have been employed, and results have been extracted via a simultaneous maximum likelihood fit to all analysis categories. The overall signal strength for production of a Higgs boson is found to be $\mu = $ 0.95$^{+0.10}_{-0.09}$, in good agreement with the SM expectation. |
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