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| CMS-PAS-TOP-21-011 | ||
| Measurement of the cross section of top quark-antiquark pair production in association with a W boson in proton-proton collisions at $\sqrt{s}=$ 13 TeV | ||
| CMS Collaboration | ||
| March 2022 | ||
| Abstract: The cross section for the production of a top quark-antiquark pair in association with a W boson in proton-proton collisions at a center-of-mass energy of 13 TeV is measured in a data sample recorded by the CMS experiment that corresponds to an integrated luminosity of 138 fb$^{-1}$. Events with two or three leptons, electrons or muons, and additional jets are selected. A cross section of 868 $\pm$ 40 (stat) $^{+52}_{-50}$ (syst) fb is measured. The production cross sections of a top quark pair with a W$^{+}$ and a W$^{-}$ boson are measured as 553$^{+30}_{-29}$ (stat) $^{+31}_{-30}$ (syst) fb and 343 $\pm$ 26 (stat) $\pm$ 25 (syst) fb, respectively, and the corresponding ratio of the two cross sections is 1.61$^{+0.15}_{-0.14}$ (stat) $^{+0.07}_{-0.05}$ (syst). The measured cross sections for the studied processes are in agreement with standard model predictions within two standard deviations. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, Submitted to JHEP. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Representative Feynman diagrams that contribute to the $\mathrm{t\bar{t}}$W production at LO (top) and NLO (bottom), where "${\rm q_u}$'' and "${\rm q_d}$'' refer to up- and down-type quarks, respectively. |
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Figure 1-a:
Representative Feynman diagrams that contribute to the $\mathrm{t\bar{t}}$W production at LO (top) and NLO (bottom), where "${\rm q_u}$'' and "${\rm q_d}$'' refer to up- and down-type quarks, respectively. |
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Figure 1-b:
Representative Feynman diagrams that contribute to the $\mathrm{t\bar{t}}$W production at LO (top) and NLO (bottom), where "${\rm q_u}$'' and "${\rm q_d}$'' refer to up- and down-type quarks, respectively. |
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Figure 1-c:
Representative Feynman diagrams that contribute to the $\mathrm{t\bar{t}}$W production at LO (top) and NLO (bottom), where "${\rm q_u}$'' and "${\rm q_d}$'' refer to up- and down-type quarks, respectively. |
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Figure 1-d:
Representative Feynman diagrams that contribute to the $\mathrm{t\bar{t}}$W production at LO (top) and NLO (bottom), where "${\rm q_u}$'' and "${\rm q_d}$'' refer to up- and down-type quarks, respectively. |
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Figure 2:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-a:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-b:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-c:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-d:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-e:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 2-f:
Comparison between the number of observed and predicted events for the leading (upper left) and the subleading (upper right) lepton ${p_{\mathrm {T}}}$, the leading jet ${p_{\mathrm {T}}}$ (middle left), the total number of jets (middle right), the number of loose b-tagged jets (lower left), and ${{p_{\mathrm {T}}} ^\text {miss}}$ (lower right) in same-sign dileptonic events. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. The last bins include the overflows. |
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Figure 3:
Comparison between the observed and predicted number of events in the trileptonic channel. Events with positive or negative sum of lepton charges are categorized by the number of jets j and b-tagged jets. The lower panels of each plot show the ratio between the number of observed events in data and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 4:
Expected and observed number of events in the validation region enriched in nonprompt leptons. The distributions of the total number of jets (left) and loose b-tagged jets (right) are shown. The lower panel shows the ratio between the number of observed events in data and the total number of predicted events. The error bars represent statistical uncertainty in data, whereas the hatched bands refer to the total systematic uncertainty. |
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Figure 4-a:
Expected and observed number of events in the validation region enriched in nonprompt leptons. The distributions of the total number of jets (left) and loose b-tagged jets (right) are shown. The lower panel shows the ratio between the number of observed events in data and the total number of predicted events. The error bars represent statistical uncertainty in data, whereas the hatched bands refer to the total systematic uncertainty. |
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Figure 4-b:
Expected and observed number of events in the validation region enriched in nonprompt leptons. The distributions of the total number of jets (left) and loose b-tagged jets (right) are shown. The lower panel shows the ratio between the number of observed events in data and the total number of predicted events. The error bars represent statistical uncertainty in data, whereas the hatched bands refer to the total systematic uncertainty. |
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Figure 5:
Expected and observed number of events in the control region enriched in WZ and $\mathrm{t\bar{t}}$Z events. Events are categorized by the number of jets (j) and b-tagged jets (b). The lower panel shows the ratio between the number of observed events in data and the total number of predicted events. The error bars represent statistical uncertainty in data, whereas the hatched bands refer to the total systematic uncertainty. |
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Figure 6:
Comparison for the number of selected events in the ZZ control region between data and prediction. Events with two Z boson candidates are included in the first bin, while the other bins contain events with one Z boson candidate and no selected jets, exactly one b-tagged jet, and more than one b-tagged jet. The lower panel shows the ratio between the number of observed events in data and the total number of events expected from the prediction. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. Small contribution from background processes with nonprompt leptons is estimated using simulation. |
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Figure 7:
Comparison between observed and predicted events for the NN output score distributions in final states with two leptons of positive (left) and negative (right) charges. The results are shown before (top) and after (bottom) the fit. The lower panels show the ratio between the number of observed events in data, and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 7-a:
Comparison between observed and predicted events for the NN output score distributions in final states with two leptons of positive (left) and negative (right) charges. The results are shown before (top) and after (bottom) the fit. The lower panels show the ratio between the number of observed events in data, and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 7-b:
Comparison between observed and predicted events for the NN output score distributions in final states with two leptons of positive (left) and negative (right) charges. The results are shown before (top) and after (bottom) the fit. The lower panels show the ratio between the number of observed events in data, and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 7-c:
Comparison between observed and predicted events for the NN output score distributions in final states with two leptons of positive (left) and negative (right) charges. The results are shown before (top) and after (bottom) the fit. The lower panels show the ratio between the number of observed events in data, and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 7-d:
Comparison between observed and predicted events for the NN output score distributions in final states with two leptons of positive (left) and negative (right) charges. The results are shown before (top) and after (bottom) the fit. The lower panels show the ratio between the number of observed events in data, and the total number of predicted events. The error bars show the statistical uncertainty in data, whereas the hatched bands represent the total systematic uncertainty. |
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Figure 8:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the positive sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 8-a:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the positive sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 8-b:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the positive sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 8-c:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the positive sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 8-d:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the positive sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 9:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the negative sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 9-a:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the negative sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 9-b:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the negative sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 9-c:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the negative sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 9-d:
Distributions of the invariant mass of three leptons in events with two (left) and three (right) jets, with two additional b-tagged jets for the negative sum of lepton charges. The results are shown before (top) and after (bottom) the fit. The last bins include the overflows. |
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Figure 10:
Measured cross sections for the $\mathrm{t\bar{t}}$W production in different final states are compared to theoretical predictions [12,16]. The cross sections are measured in dilepton (ee, $\mu \mu $, e$\mu $) and trilepton events, as well as in combination of channels. |
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Figure 11:
The 68% and 95% CL intervals in the likelihood fit with the $\mathrm{t\bar{t}}$W$^{+}$ and $\mathrm{t\bar{t}}$W$^{-}$ cross sections measured independently. The intervals are shown as contours. The best fit value is indicated by the black cross, while the predicted value [11] is shown as the red circle. The prediction that is used in the presented comparison does not include the improved FxFx matrix element merging procedure, which is described in Ref. [16]. |
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Figure 12:
Distributions of the negative log-likelihood value difference from the best fit value for the scan of the ratio of the $\mathrm{t\bar{t}}$W$^{+}$ and $\mathrm{t\bar{t}}$W$^{-}$ cross sections. The blue (green) bands indicate the 68% and 95% CL limits on the ratio of the cross sections. The SM prediction (red line) and its uncertainty (red band) are taken from Ref. [11]. |
| Tables | |
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Table 1:
Number of predicted and observed events in the signal regions after the dileptonic and trileptonic selections. The last column shows the ratio between the number of predicted events after and before the fit. The total uncertainty in the number of predicted events is shown. The symbol "--'' indicates that the corresponding background does not apply. |
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Table 2:
Uncertainties in predicted signal and background events and their impacts on the measured cross section of the $\mathrm{t\bar{t}}$W process. Relative variations of uncertainties are shown when fixing the nuisance parameters associated with that uncertainty in the fit. Systematic uncertainties with an impact larger than 0.1% are shown. Production cross sections of the $\mathrm{t\bar{t}}$W, WZ, ZZ and $\mathrm{t\bar{t}}$Z processes are simultaneously constrained in the fit. |
| Summary |
| The cross section for the associated production of a W boson with a pair of top quarks ($\mathrm{t\bar{t}}$W) in proton-proton collisions at a center-of-mass energy of 13 TeV is measured using 138 fb$^{-1}$ of data collected by the CMS detector. The measurement is performed in final states with two or three leptons. The measured cross section is 868 $\pm$ 40 (stat) $^{+52}_{-50}$ (syst) fb. The cross sections for the associated production of a top quark pair with a W$^{+}$ and a W$^{-}$ boson are 553$^{+30}_{-29}$ (stat) $^{+31}_{-30}$ (syst) fb and 343 $\pm$ 26 (stat) $\pm$ 25 (syst) fb, respectively. The measured ratio between these production cross sections is 1.61$^{+0.15}_{-0.14}$ (stat) $^{+0.07}_{-0.05}$ (syst). The obtained results are in agreement with standard model predictions within two standard deviations. |
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