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| CMS-PAS-SUS-20-004 | ||
| Search for higgsinos in channels with two Higgs bosons and missing transverse momentum in proton-proton collisions at $\sqrt{s}=$ 13 TeV | ||
| CMS Collaboration | ||
| July 2021 | ||
| Abstract: Results are presented from a search for physics beyond the standard model in proton-proton collisions at $\sqrt{s}=$ 13 TeV in final states containing two Higgs bosons, each decaying via the process $\text{H}\rightarrow\mathrm{b\overline{b}}$, and large missing transverse momentum. The search uses a data sample accumulated by the CMS experiment at the CERN LHC corresponding to an integrated luminosity of 137 fb$^{-1}$. The search is motivated by models of supersymmetry that predict the production of neutralinos, the neutral partners of the electroweak gauge and Higgs bosons. The observed event yields in the signal regions are found to be consistent with the standard model background expectations based on control regions in the data. The results are interpreted using simplified models of supersymmetry. For the electroweak production of nearly degenerate higgsinos, each of whose decay chains yields a neutralino state $\tilde{\chi}^0_1$ that in turn decays to a massless goldstino and a Higgs boson, $\tilde{\chi}^0_1$ masses in the range 175 to 1025 GeV are excluded at the 95% confidence level. For the strong production of gluino pairs decaying via a slightly lighter $\tilde{\chi}^0_2$ to H and a light $\tilde{\chi}^0_1$, gluino masses below 2330 GeV are excluded. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, Submitted to JHEP. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Diagrams for (left) the TChiHH-G signal model, $\tilde{\chi}^0_1 \tilde{\chi}^0_1 \to \mathrm{H} \mathrm{H} \tilde{\mathrm{G}} \tilde{\mathrm{G}} $, in which the $\tilde{\chi}^0_1$ NLSPs are produced indirectly through the cascade decays of several combinations of neutralinos and charginos, as described in the text; (center) TChiHH, in which the electroweak production of two neutralinos leads to two Higgs bosons and two neutralinos ($\tilde{\chi}^0_1 $); (right) T5HH, the strong production of a pair of gluinos, each of which decays via a three-body process to quarks and a neutralino, the neutralino subsequently decaying to a Higgs boson and a $\tilde{\chi}^0_1$ LSP. In each diagram, the filled circle represents the sum of processes that can lead to the SUSY particles shown. |
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Figure 1-a:
Diagrams for (left) the TChiHH-G signal model, $\tilde{\chi}^0_1 \tilde{\chi}^0_1 \to \mathrm{H} \mathrm{H} \tilde{\mathrm{G}} \tilde{\mathrm{G}} $, in which the $\tilde{\chi}^0_1$ NLSPs are produced indirectly through the cascade decays of several combinations of neutralinos and charginos, as described in the text; (center) TChiHH, in which the electroweak production of two neutralinos leads to two Higgs bosons and two neutralinos ($\tilde{\chi}^0_1 $); (right) T5HH, the strong production of a pair of gluinos, each of which decays via a three-body process to quarks and a neutralino, the neutralino subsequently decaying to a Higgs boson and a $\tilde{\chi}^0_1$ LSP. In each diagram, the filled circle represents the sum of processes that can lead to the SUSY particles shown. |
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Figure 1-b:
Diagrams for (left) the TChiHH-G signal model, $\tilde{\chi}^0_1 \tilde{\chi}^0_1 \to \mathrm{H} \mathrm{H} \tilde{\mathrm{G}} \tilde{\mathrm{G}} $, in which the $\tilde{\chi}^0_1$ NLSPs are produced indirectly through the cascade decays of several combinations of neutralinos and charginos, as described in the text; (center) TChiHH, in which the electroweak production of two neutralinos leads to two Higgs bosons and two neutralinos ($\tilde{\chi}^0_1 $); (right) T5HH, the strong production of a pair of gluinos, each of which decays via a three-body process to quarks and a neutralino, the neutralino subsequently decaying to a Higgs boson and a $\tilde{\chi}^0_1$ LSP. In each diagram, the filled circle represents the sum of processes that can lead to the SUSY particles shown. |
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Figure 1-c:
Diagrams for (left) the TChiHH-G signal model, $\tilde{\chi}^0_1 \tilde{\chi}^0_1 \to \mathrm{H} \mathrm{H} \tilde{\mathrm{G}} \tilde{\mathrm{G}} $, in which the $\tilde{\chi}^0_1$ NLSPs are produced indirectly through the cascade decays of several combinations of neutralinos and charginos, as described in the text; (center) TChiHH, in which the electroweak production of two neutralinos leads to two Higgs bosons and two neutralinos ($\tilde{\chi}^0_1 $); (right) T5HH, the strong production of a pair of gluinos, each of which decays via a three-body process to quarks and a neutralino, the neutralino subsequently decaying to a Higgs boson and a $\tilde{\chi}^0_1$ LSP. In each diagram, the filled circle represents the sum of processes that can lead to the SUSY particles shown. |
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Figure 2:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 2-a:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 2-b:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 2-c:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 2-d:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 2-e:
Distributions in the primary variables of the resolved signature for events satisfying the baseline requirements plus $ {N_{\text {b}}} =$ 3 or 4, except for those on the variable plotted: (upper left) ${\Delta m_{\mathrm{b} \mathrm{b}}}$, (upper right) ${\Delta R_{\text {max}}}$, (middle left) ${< m_{\mathrm{b} \mathrm{b}}>}$, (middle right) ${N_{\text {b}}}$, and (lower) ${{p_{\mathrm {T}}} ^\text {miss}}$. The rightmost bin includes overflow entries. The data are shown as black markers with error bars, simulated SM backgrounds by the stacked histograms (scaled by factors of 0.93-0.97 to match the total data yield in each plot), and simulations of $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ signals by the lines. Gray shading represents the statistical uncertainties of the simulation. Vertical dashed lines indicate the boundaries for SR selection (dashed), or for the SR binning discussed in Section 7 (dotted). The lower panel shows the ratio of data to (scaled) simulation. |
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Figure 3:
Distributions in the most pertinent variables after the baseline requirements for the boosted signature, except for those on the variable shown: (upper left) ${{p_{\mathrm {T}}} ^\text {miss}}$, (upper right) jet ${p_{\mathrm {T}}}$, (lower left) ${D_{ {\mathrm{b} \mathrm{b}}}}$, and (lower right) ${m_{\text {J}}}$. Except for the ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution, each plot contains two entries per event, for each of the two ${p_{\mathrm {T}}}$-leading wide-cone jets. The data are shown by the black markers with error bars, and SM backgrounds from simulation (scaled by 86% to match the data integral) by the filled histograms. Line histograms show simulations of the signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ or $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$. In the lower-left plot, the vertical dashed line denotes the ${D_{ {\mathrm{b} \mathrm{b}}}} $ threshold for classification of the jet as a ${\mathrm{H} \to b {}\mathrm{\bar{b}}}$ candidate; in the lower-right plot, the vertical dashed lines denote the boundaries of the H mass window. The lower panel in each plot shows the ratio of observed to (scaled) simulated yields. |
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Figure 3-a:
Distributions in the most pertinent variables after the baseline requirements for the boosted signature, except for those on the variable shown: (upper left) ${{p_{\mathrm {T}}} ^\text {miss}}$, (upper right) jet ${p_{\mathrm {T}}}$, (lower left) ${D_{ {\mathrm{b} \mathrm{b}}}}$, and (lower right) ${m_{\text {J}}}$. Except for the ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution, each plot contains two entries per event, for each of the two ${p_{\mathrm {T}}}$-leading wide-cone jets. The data are shown by the black markers with error bars, and SM backgrounds from simulation (scaled by 86% to match the data integral) by the filled histograms. Line histograms show simulations of the signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ or $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$. In the lower-left plot, the vertical dashed line denotes the ${D_{ {\mathrm{b} \mathrm{b}}}} $ threshold for classification of the jet as a ${\mathrm{H} \to b {}\mathrm{\bar{b}}}$ candidate; in the lower-right plot, the vertical dashed lines denote the boundaries of the H mass window. The lower panel in each plot shows the ratio of observed to (scaled) simulated yields. |
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Figure 3-b:
Distributions in the most pertinent variables after the baseline requirements for the boosted signature, except for those on the variable shown: (upper left) ${{p_{\mathrm {T}}} ^\text {miss}}$, (upper right) jet ${p_{\mathrm {T}}}$, (lower left) ${D_{ {\mathrm{b} \mathrm{b}}}}$, and (lower right) ${m_{\text {J}}}$. Except for the ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution, each plot contains two entries per event, for each of the two ${p_{\mathrm {T}}}$-leading wide-cone jets. The data are shown by the black markers with error bars, and SM backgrounds from simulation (scaled by 86% to match the data integral) by the filled histograms. Line histograms show simulations of the signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ or $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$. In the lower-left plot, the vertical dashed line denotes the ${D_{ {\mathrm{b} \mathrm{b}}}} $ threshold for classification of the jet as a ${\mathrm{H} \to b {}\mathrm{\bar{b}}}$ candidate; in the lower-right plot, the vertical dashed lines denote the boundaries of the H mass window. The lower panel in each plot shows the ratio of observed to (scaled) simulated yields. |
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Figure 3-c:
Distributions in the most pertinent variables after the baseline requirements for the boosted signature, except for those on the variable shown: (upper left) ${{p_{\mathrm {T}}} ^\text {miss}}$, (upper right) jet ${p_{\mathrm {T}}}$, (lower left) ${D_{ {\mathrm{b} \mathrm{b}}}}$, and (lower right) ${m_{\text {J}}}$. Except for the ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution, each plot contains two entries per event, for each of the two ${p_{\mathrm {T}}}$-leading wide-cone jets. The data are shown by the black markers with error bars, and SM backgrounds from simulation (scaled by 86% to match the data integral) by the filled histograms. Line histograms show simulations of the signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ or $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$. In the lower-left plot, the vertical dashed line denotes the ${D_{ {\mathrm{b} \mathrm{b}}}} $ threshold for classification of the jet as a ${\mathrm{H} \to b {}\mathrm{\bar{b}}}$ candidate; in the lower-right plot, the vertical dashed lines denote the boundaries of the H mass window. The lower panel in each plot shows the ratio of observed to (scaled) simulated yields. |
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Figure 3-d:
Distributions in the most pertinent variables after the baseline requirements for the boosted signature, except for those on the variable shown: (upper left) ${{p_{\mathrm {T}}} ^\text {miss}}$, (upper right) jet ${p_{\mathrm {T}}}$, (lower left) ${D_{ {\mathrm{b} \mathrm{b}}}}$, and (lower right) ${m_{\text {J}}}$. Except for the ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution, each plot contains two entries per event, for each of the two ${p_{\mathrm {T}}}$-leading wide-cone jets. The data are shown by the black markers with error bars, and SM backgrounds from simulation (scaled by 86% to match the data integral) by the filled histograms. Line histograms show simulations of the signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ or $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$. In the lower-left plot, the vertical dashed line denotes the ${D_{ {\mathrm{b} \mathrm{b}}}} $ threshold for classification of the jet as a ${\mathrm{H} \to b {}\mathrm{\bar{b}}}$ candidate; in the lower-right plot, the vertical dashed lines denote the boundaries of the H mass window. The lower panel in each plot shows the ratio of observed to (scaled) simulated yields. |
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Figure 4:
Configuration of the search and control regions for the (left) resolved and (right) boosted signatures. The patterns shown are repeated in each of several bins in kinematic or topological variables for improved sensitivity, as discussed in the text. |
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Figure 5:
The double ratio $\kappa = ({N_{\text {SR}}} / {N_{\text {SB}}})/({N_{\text {CSR}}} / {N_{\text {CSB}}})$ from the SM simulation for the 3b and 4b search samples for each $({{p_{\mathrm {T}}} ^\text {miss}}, {\Delta R_{\text {max}}})$ bin of the resolved signature. The value $\Delta $ gives the deviation of ${\kappa}$ from unity, and $\sigma $ its relative statistical uncertainty. |
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Figure 6:
Distributions in (left) the ratio from the SM simulation of the yield in the ${m_{\text {J}}}$ signal region to the yield in the sideband for each of the 0H, 1H, and 2H analysis regions of the boosted signature, and (right) $ {{p_{\mathrm {T}}} ^\text {miss}} $ for the 2H and 1H SRs and the 0H+b control region from SM simulation (MC, solid points), and for the control region in data (open black points). In the right-hand plot the upper panel shows the distributions normalized to unit area. The blue points, and in one bin the open point, are hidden under the solid black points. The lower panel shows the (unnormalized) ratios to the 0H+b yields of the SRs 1H (blue) and 2H (red) for the simulation. The error bars show the statistical uncertainties. |
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Figure 6-a:
Distributions in (left) the ratio from the SM simulation of the yield in the ${m_{\text {J}}}$ signal region to the yield in the sideband for each of the 0H, 1H, and 2H analysis regions of the boosted signature, and (right) $ {{p_{\mathrm {T}}} ^\text {miss}} $ for the 2H and 1H SRs and the 0H+b control region from SM simulation (MC, solid points), and for the control region in data (open black points). In the right-hand plot the upper panel shows the distributions normalized to unit area. The blue points, and in one bin the open point, are hidden under the solid black points. The lower panel shows the (unnormalized) ratios to the 0H+b yields of the SRs 1H (blue) and 2H (red) for the simulation. The error bars show the statistical uncertainties. |
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Figure 6-b:
Distributions in (left) the ratio from the SM simulation of the yield in the ${m_{\text {J}}}$ signal region to the yield in the sideband for each of the 0H, 1H, and 2H analysis regions of the boosted signature, and (right) $ {{p_{\mathrm {T}}} ^\text {miss}} $ for the 2H and 1H SRs and the 0H+b control region from SM simulation (MC, solid points), and for the control region in data (open black points). In the right-hand plot the upper panel shows the distributions normalized to unit area. The blue points, and in one bin the open point, are hidden under the solid black points. The lower panel shows the (unnormalized) ratios to the 0H+b yields of the SRs 1H (blue) and 2H (red) for the simulation. The error bars show the statistical uncertainties. |
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Figure 7:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots show the low- and high- ${\Delta R_{\text {max}}}$ plane, respectively. |
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Figure 7-a:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots show the low- and high- ${\Delta R_{\text {max}}}$ plane, respectively. |
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Figure 7-b:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots show the low- and high- ${\Delta R_{\text {max}}}$ plane, respectively. |
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Figure 7-c:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots show the low- and high- ${\Delta R_{\text {max}}}$ plane, respectively. |
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Figure 7-d:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots show the low- and high- ${\Delta R_{\text {max}}}$ plane, respectively. |
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Figure 8:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots represent the $ {{p_{\mathrm {T}}} ^\text {miss}} < $ 200 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} \geq $ 300 GeV plane, respectively. |
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Figure 8-a:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots represent the $ {{p_{\mathrm {T}}} ^\text {miss}} < $ 200 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} \geq $ 300 GeV plane, respectively. |
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Figure 8-b:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots represent the $ {{p_{\mathrm {T}}} ^\text {miss}} < $ 200 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} \geq $ 300 GeV plane, respectively. |
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Figure 8-c:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots represent the $ {{p_{\mathrm {T}}} ^\text {miss}} < $ 200 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} \geq $ 300 GeV plane, respectively. |
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Figure 8-d:
Distributions in ${< m_{\mathrm{b} \mathrm{b}}>}$ for (above) 3b and (below) 4b data, denoted by black markers, with error bars indicating the statistical uncertainties. The overlaid cyan histogram shows the corresponding distribution of the 2b data multiplied by ${\kappa}$ and scaled in area to the 3b or 4b distribution, with statistical uncertainties indicated by the cyan shading. The ratio of these distributions appears in the lower panel. The red, green, and black histograms show simulations of representative signals, denoted $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ in the legends. The left and right plots represent the $ {{p_{\mathrm {T}}} ^\text {miss}} < $ 200 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} \geq $ 300 GeV plane, respectively. |
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Figure 9:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
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Figure 9-a:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
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Figure 9-b:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
png pdf |
Figure 9-c:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
png |
Figure 9-d:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
png pdf |
Figure 9-e:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
png |
Figure 9-f:
Distributions in ${m_{\text {J}}}$ for the boosted signature, integrated in ${{p_{\mathrm {T}}} ^\text {miss}}$. The projections (left) contain two entries per event, with statistical uncertainties in the data and simulation given by the vertical bars and gray shading, respectively. The SM components are scaled to the data integral, by factors of 0.84, 0.92, and 1.13 in the 0H (upper), 1H (middle), and 2H (lower) plot, respectively. The data to simulation ratio appears in each lower panel. Simulated signals $\text {TChiHH-G}(m(\tilde{\chi}^0_1),m(\tilde{\mathrm{G}}))$ and $\text {T5HH}(m({\mathrm{\tilde{g}}}),m(\tilde{\chi}^0_1))$ are also shown. In the correlation plots (right) the continuous color scale represents the SM background, black dots the data, and red dots the expected signal. The dashed lines and box denote the boundaries of the SR. |
png pdf |
Figure 10:
Observed and predicted yields in the search regions identified by the legend text. The points with error bars represent the observed yields, the magenta outline bands the background yields derived from the data sidebands with their total uncertainty, and blue shaded bands the values determined by the background-only fit. |
png pdf |
Figure 11:
Observed and expected upper limits at 95% CL on the cross section for the gauge-mediated symmetry breaking signal model $\tilde{\chi}^0_1 \tilde{\chi}^0_1 \to \mathrm{H} \mathrm{H} \tilde{\mathrm{G}} \tilde{\mathrm{G}} $. The thin dashed black line with green and yellow bands shows the expected limit with its 1- and 2-standard deviation uncertainties, while the solid black line shows the observed limit. The theoretical cross section is indicated by the dashed red line under the assumption that the decay chains leading to the $\tilde{\chi}^0_1 \tilde{\chi}^0_1 $ intermediate state include a degenerate set of all charginos and neutralinos, and by the dotted magenta lines under the assumption that only the combination $\tilde{\chi}^0_1$ $\tilde{\chi}^{0}_2$ is accessible. |
png pdf |
Figure 12:
Limits at 95% CL on the cross section for the TChiHH signal model in which production of the intermediate state $\tilde{\chi}^{0}_2$ $\tilde{\chi}^{0}_2$ (assumed mass degenerate) is followed by the decay of each to $\tilde{\chi}^0_1$ $\mathrm{H}$. The color scale gives the cross section limit as a function of $(m(\tilde{\chi}^{0}_2),m(\tilde{\chi}^0_1))$. The red solid and dashed contours show the expected limit with its 1-standard deviation uncertainty. At its central value the observed cross section surface does not exclude any part of the plane for this model; only the $+1$-standard deviation (dashed black) surface intersects the theoretical cross section, near $m(\tilde{\chi}^{0}_2) = $ 300 GeV for the smallest values of $m(\tilde{\chi}^0_1)$. |
png pdf |
Figure 13:
Observed and expected upper limits at 95% CL on the cross section for the simplified model T5HH, the strong production of a pair of gluinos each of which decays via a three-body process to quarks and a neutralino, the neutralino subsequently decaying to a Higgs boson and a $\tilde{\chi}^0_1$ LSP. The thin dashed black line with green and yellow bands shows the expected limit with its 1- and 2-standard deviation uncertainties; the solid black line shows the observed limit, and the dashed red line the theoretical cross section. |
| Tables | |
png pdf |
Table 1:
Summary of background uncertainties for the resolved signature. The sources are statistical uncertainties in the determination of ${\kappa}$ and the uncertainties $\Delta (\text {data, MC})$ derived from the comparison of simulation with data in the single-lepton, dilepton, and low-$ {\Delta \phi}$ control samples. The unit of ${{p_{\mathrm {T}}} ^\text {miss}}$ is GeV, and the last column gives the bin-to-bin correlation $\rho $. |
png pdf |
Table 2:
Summary of systematic uncertainties in the background estimation for the boosted signature alongside the data sideband statistical uncertainties. The values from the ABCD measurement with the ${p_{\mathrm {T}}}$-integrated sample appear in the rows labeled $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 300 GeV. The row labeled $\Delta (\text {data, MC})$ gives the contribution derived from the comparison of simulation with data in the one-lepton control sample, and those labeled "MC corrections'' refer to the corrections to simulation discussed in Section 5. |
png pdf |
Table 3:
Sources of systematic uncertainties and their typical impact on the signal yields obtained from simulation. The range is reported as the median 68% among all signal regions for every signal mass point considered. Entries reported as 0 correspond to values smaller than 0.5%. |
png pdf |
Table 4:
For each SR of the resolved signature, the MC closure factor ${\kappa}$, predicted background yield $N_{\text {bkg}}$ (pre-fit), background yield from the background-only fit $N_{\text {bkg}}$ (post-fit), and observed yield $N_{\text {obs}}$. The first and second uncertainties in the ${\kappa}$ factors are statistical and systematic, respectively. The uncertainties in the predictions, extracted from the maximum-likelihood fit described in the text, include both statistical and systematic contributions. The interpretation of results in the bin corresponding to $ {\Delta R_{\text {max}}} < $ 1.1, $ {N_{\text {b}}} =$ 3, 300 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 400 GeV is discussed in the text. |
png pdf |
Table 5:
For each ${N_{{\mathrm{H}}}}$ SR of the boosted signature, the total predicted background yield ${{N_{\text {SR}}}}$, and for each ${{p_{\mathrm {T}}} ^\text {miss}}$ bin the fraction ${f_{\text {bkg}}}$, both with their statistical uncertainties, the predicted background yield $N_{\text {bkg}}$-pre-fit, the yield from the background-only fit $N_{\text {bkg}}$-post-fit, and the observed yield $N_{\text {obs}}$. Both ${{N_{\text {SR}}}}$ and ${f_{\text {bkg}}}$ are determined from data control samples. The $N_{\text {bkg}}$ values are extracted from the maximum-likelihood fit described in the text, with uncertainties that include both statistical and systematic contributions. |
| Summary |
|
A search is presented for physics beyond the standard model in final states with pairs of Higgs bosons and an imbalance of transverse momentum, produced in proton-proton collisions at $\sqrt{s} = $ 13 TeV. The data, collected by the CMS experiment at the LHC, correspond to an integrated luminosity of 137 fb$^{-1}$. The Higgs bosons are reconstructed via their decay to a pair of b quarks, observed either as distinct b quark jets or as wide-cone jets each containing the pair of b quarks. No significant excess of events beyond those predicted by standard model processes is observed. This finding is used to set limits on the cross sections for the production of SUSY particles, considering both the direct production of neutralinos and their production through intermediate states with gluinos. For the electroweak production of nearly-degenerate higgsinos each of whose decay cascades yield a $\tilde{\chi}^0_1$ that in turn decays through a Higgs boson to the lightest SUSY particle (LSP), a massless goldstino, $\tilde{\chi}^0_1$ masses in the range 175 to 1025 GeV are excluded at the 95% confidence level. For a model with a mass splitting between the directly produced higgsinos and a bino LSP, the cross section upper limit lies slightly above the model cross section over the entire mass-parameter region where the experiment has expected sensitivity. For the strong production of gluino pairs decaying via a slightly lighter $\tilde{\chi}^0_2$ to a Higgs boson and a light $\tilde{\chi}^0_1$ LSP, gluino masses below 2330 GeV are excluded. |
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