CMS-SUS-17-012 ; CERN-EP-2018-277 | ||
Search for supersymmetry in events with a photon, a lepton, and missing transverse momentum in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
CMS Collaboration | ||
10 December 2018 | ||
JHEP 01 (2019) 154 | ||
Abstract: Results of a search for supersymmetry are presented using events with a photon, an electron or muon, and large missing transverse momentum. The analysis is based on a data sample corresponding to an integrated luminosity of 35.9 fb$^{-1}$ of proton-proton collisions at $\sqrt{s} = $ 13 TeV, produced by the LHC and collected with the CMS detector in 2016. Theoretical models with gauge-mediated supersymmetry breaking predict events with photons in the final state, as well as electroweak gauge bosons decaying to leptons. Searches for events with a photon, a lepton, and missing transverse momentum are sensitive probes of these models. No excess of events is observed beyond expectations from standard model processes. The results of the search are interpreted in the context of simplified models inspired by gauge-mediated supersymmetry breaking. These models are used to derive upper limits on the production cross sections and set lower bounds on masses of supersymmetric particles. Gaugino masses below 930 GeV are excluded at the 95% confidence level in a simplified model with electroweak production of a neutralino and chargino. For simplified models of gluino and squark pair production, gluino masses up to 1.75 TeV and squark masses up to 1.43 TeV are excluded at the 95% confidence level. | ||
Links: e-print arXiv:1812.04066 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; CADI line (restricted) ; |
Figures | |
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Figure 1:
Diagrams showing the production and decay modes of the signal models T5Wg (left), T6Wg (center), and TChiWg (right) considered in this analysis. |
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Figure 1-a:
Diagram showing the production and decay modes of the signal model T5Wg considered in this analysis. |
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Figure 1-b:
Diagram showing the production and decay modes of the signal model T6Wg considered in this analysis. |
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Figure 1-c:
Diagram showing the production and decay modes of the signal model TChiWg considered in this analysis. |
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Figure 2:
Verification of the e-to-${{\gamma}}$ misidentification estimation method using simulated data. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution for events with misidentified photons in the e$\gamma$ (left) and $\mu {\gamma}$ (right) channels from prediction using the control sample estimation method (histograms) and direct simulation (points), as obtained from the generator-level information of the simulated data. The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The dashed vertical line shows the boundary between the control and signal regions. The lower panels show the ratio of the predictions from direct simulation to those estimated with control samples. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 2-a:
Verification of the e-to-${{\gamma}}$ misidentification estimation method using simulated data. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution for events with misidentified photons in the e$\gamma$ channel from prediction using the control sample estimation method (histograms) and direct simulation (points), as obtained from the generator-level information of the simulated data. The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The dashed vertical line shows the boundary between the control and signal regions. The lower panel shows the ratio of the predictions from direct simulation to those estimated with control samples. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 2-b:
Verification of the e-to-${{\gamma}}$ misidentification estimation method using simulated data. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution for events with misidentified photons in the $\mu {\gamma}$ channel from prediction using the control sample estimation method (histograms) and direct simulation (points), as obtained from the generator-level information of the simulated data. The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The dashed vertical line shows the boundary between the control and signal regions. The lower panel shows the ratio of the predictions from direct simulation to those estimated with control samples. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 3:
The $ < \Delta \phi (\ell, \vec{p}_{\mathrm {T}}^{\,\text {miss}}) >$ distributions for the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region (points) and the estimated V${{\gamma}}$ (dashed line) and misidentified-lepton (solid line) backgrounds for the e$\gamma$ (left) and $\mu {{\gamma}}$ (right) channels. The filled histogram shows the result of the overall fit and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty in the data. The lower panels show the ratio of the fit result to the data. |
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Figure 3-a:
The $ < \Delta \phi (\ell, \vec{p}_{\mathrm {T}}^{\,\text {miss}}) >$ distributions for the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region (points) and the estimated V${{\gamma}}$ (dashed line) and misidentified-lepton (solid line) backgrounds for the e$\gamma$ channel. The filled histogram shows the result of the overall fit and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty in the data. The lower panel shows the ratio of the fit result to the data. |
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Figure 3-b:
The $ < \Delta \phi (\ell, \vec{p}_{\mathrm {T}}^{\,\text {miss}}) >$ distributions for the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region (points) and the estimated V${{\gamma}}$ (dashed line) and misidentified-lepton (solid line) backgrounds for the $\mu {{\gamma}}$ channel. The filled histogram shows the result of the overall fit and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty in the data. The lower panel shows the ratio of the fit result to the data. |
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Figure 4:
Distributions of $ {{p_{\mathrm {T}}} ^\text {miss}} $ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and ${H_{\mathrm {T}}}$ (e, f) from data (points) and estimated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {{\gamma}}$ (right) channels. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panels display the ratio of the data to the total background prediction. |
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Figure 4-a:
Distribution of $ {{p_{\mathrm {T}}} ^\text {miss}} $ from data (points) and estimated SM predictions (stacked histograms) for the e$\gamma$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 4-b:
Distribution of $ {{p_{\mathrm {T}}} ^\text {miss}} $ from data (points) and estimated SM predictions (stacked histograms) for the $\mu {{\gamma}}$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 4-c:
Distribution of $ {p_{\mathrm {T}}} ^{{\gamma}}$ from data (points) and estimated SM predictions (stacked histograms) for the e$\gamma$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 4-d:
Distribution of $ {p_{\mathrm {T}}} ^{{\gamma}}$ from data (points) and estimated SM predictions (stacked histograms) for the $\mu {{\gamma}}$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 4-e:
Distribution of ${H_{\mathrm {T}}}$ from data (points) and estimated SM predictions (stacked histograms) for the e$\gamma$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 4-f:
Distribution of ${H_{\mathrm {T}}}$ from data (points) and estimated SM predictions (stacked histograms) for the $\mu {{\gamma}}$ channel. Simulated signal distributions from the TChiWg model (dotted) with $m_{{\tilde{\chi}^0} / {\tilde{\chi}^\pm}} = $ 800 GeV and the T5Wg model (solid) with $m_{{\mathrm {\tilde{g}}}} = $ 1700 GeV are overlaid. The $ {{p_{\mathrm {T}}} ^\text {miss}} $ distribution includes all events with $ {m_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and ${H_{\mathrm {T}}}$ distributions only include events with $ {m_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data and the horizontal bars show the bin widths. The hatched area represents the quadratic sum of the statistical and systematic uncertainties in the simulated background. The lower panel displays the ratio of the data to the total background prediction. |
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Figure 5:
The number of data events (points) and predicted background events (shaded histograms) for the 18 search regions in $ {{p_{\mathrm {T}}} ^\text {miss}} $, ${H_{\mathrm {T}}}$, and $ {p_{\mathrm {T}}} ^{{\gamma}}$ (separated by dashed vertical lines) in the e$\gamma$ (regions 1-18) and the $\mu {{\gamma}}$ (regions 19-36) channels. For each $ {{p_{\mathrm {T}}} ^\text {miss}} $ range, the first, second, and last bins correspond to the ${H_{\mathrm {T}}}$ regions 0-100, 100-400, and $ > $ 400 GeV, respectively. The lower panel displays the ratio of the data to the background predictions. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 6:
The observed (solid line) and expected (dashed line) 95% CL upper limits on the production cross sections for the TChiWg simplified model, together with the NLO theoretical cross sections as a function of the NLSP mass. The inner (darker) band and outer (lighter) band around the expected upper limits indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The dotted lines around the theoretical cross section gives the $ \pm $1 standard deviation uncertainty in the cross section. |
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Figure 7:
The observed (solid line) and expected (dashed line) 95% CL exclusion contours for (a) $m_{{\mathrm {\tilde{g}}}}$ versus $m_{{\tilde{\chi}}}$ and (b) $m_{{\mathrm {\tilde{q}}}}$ versus $m_{{\tilde{\chi}}}$ (regions to the left of the curves are excluded), and the 95% CL upper limits on the pair production cross sections for (a) ${{\mathrm {\tilde{g}}} {\mathrm {\tilde{g}}}}$ in the T5Wg and (b) ${{\mathrm {\tilde{q}}} {\mathrm {\tilde{q}}}}$ in the T6Wg simplified models (use the scales to the right of the plots). The upper limits on the cross sections assume a 50% branching fraction for $ {\mathrm {\tilde{g}}}\to {\mathrm {q}} {\mathrm {\overline {q}}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $ and $ {\mathrm {\tilde{q}}}\to {\mathrm {q}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
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Figure 7-a:
The observed (solid line) and expected (dashed line) 95% CL exclusion contours for $m_{{\mathrm {\tilde{g}}}}$ versus $m_{{\tilde{\chi}}}$ (regions to the left of the curves are excluded), and the 95% CL upper limits on the pair production cross sections for ${{\mathrm {\tilde{g}}} {\mathrm {\tilde{g}}}}$ in the T5Wg simplified model (use the scales to the right of the plots). The upper limits on the cross sections assume a 50% branching fraction for $ {\mathrm {\tilde{g}}}\to {\mathrm {q}} {\mathrm {\overline {q}}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $ and $ {\mathrm {\tilde{q}}}\to {\mathrm {q}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
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Figure 7-b:
The observed (solid line) and expected (dashed line) 95% CL exclusion contours for $m_{{\mathrm {\tilde{q}}}}$ versus $m_{{\tilde{\chi}}}$ (regions to the left of the curves are excluded), and the 95% CL upper limits on the pair production cross sections for ${{\mathrm {\tilde{q}}} {\mathrm {\tilde{q}}}}$ in the T6Wg simplified model (use the scales to the right of the plots). The upper limits on the cross sections assume a 50% branching fraction for $ {\mathrm {\tilde{g}}}\to {\mathrm {q}} {\mathrm {\overline {q}}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $ and $ {\mathrm {\tilde{q}}}\to {\mathrm {q}} {\tilde{\chi}^0} / {\tilde{\chi}^\pm} $. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
Tables | |
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Table 1:
The relative systematic uncertainties in the SM background processes (third column) and the expected SUSY signal (fourth column). The ranges refer to the uncertainties over the different kinematic regions. |
Summary |
A search for supersymmetry with general gauge mediation in events with a photon, an electron or muon, and large missing transverse momentum has been presented. This analysis is based on a sample of proton-proton collisions at $\sqrt{s} = $ 13 TeV, corresponding to an integrated luminosity of 35.9 fb$^{-1}$ recorded by the CMS experiment in 2016. The data are examined in bins of the photon transverse energy, the magnitude of the missing transverse momentum, and the scalar sum of jet energies. The standard model background is evaluated primarily using control samples in the data, with simulation used to evaluate backgrounds from electroweak processes. The data are found to agree with the standard model expectation, without significant excess in the search region. The results of the search are interpreted as 95% confidence level upper limits on the production cross sections of supersymmetric particles in the context of simplified models [23] motivated by gauge-mediated supersymmetry breaking. For strong production models, such as the T5Wg simplified model of gluino pair production and the T6Wg model of squark pair production, this search excludes gluinos (squarks) with masses up to 1.75 (1.43) TeV in the T5Wg (T6Wg) scenarios. The TChiWg simplified model, based on direct electroweak production of a neutralino and chargino, is excluded for next-to-lightest supersymmetric particle masses below 930 GeV, extending the current best limit by about 150 GeV [19]. |
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Compact Muon Solenoid LHC, CERN |