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| CMS-SMP-24-005 ; CERN-EP-2024-293 | ||
| Measurement of the inclusive WZ production cross section in pp collisions at $ \sqrt{s}= $ 13.6 TeV | ||
| CMS Collaboration | ||
| 3 December 2024 | ||
| Submitted to J. High Energy Phys. | ||
| Abstract: The inclusive WZ production cross section is measured in proton-proton collisions at a centre-of-mass energy of 13.6 TeV, using data collected during 2022 with the CMS detector, corresponding to an integrated luminosity of 34.7 fb$ ^{-1} $. The measurement uses multileptonic final states and a simultaneous likelihood fit to the number of events in four different lepton flavour categories: $ \mathrm{e}\mathrm{e}\mathrm{e} $, $ \mathrm{e}\mathrm{e}\mu $, $ \mu\mu\mathrm{e} $, and $ \mu\mu\mu $. The selection is optimized to minimize the number of background events, and relies on an efficient prompt lepton discrimination strategy. The WZ production cross section is measured in a phase space defined within a 30 GeV window around the Z boson mass, as $ \sigma_{\text{total}}(\mathrm{p}\mathrm{p}\to\mathrm{W}\mathrm{Z})= $ 55.2 $ \pm $ 1.2 (stat) $ \pm $ 1.2 (syst) $ \pm $ 0.8 (lumi) $ \pm $ 0.1 (theo) pb. In addition, the cross section is measured in a fiducial phase space closer to the detector-level requirements. All the measurements presented in this paper are in agreement with standard model predictions. | ||
| Links: e-print arXiv:2412.02477 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; CADI line (restricted) ; | ||
| Figures | |
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Figure 1:
Leading-order Feynman diagrams for WZ production in pp collisions from the $ s $ channel (left), $ t $ channel (centre), and $ u $ channel (right). |
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Figure 1-a:
Leading-order Feynman diagrams for WZ production in pp collisions from the $ s $ channel (left), $ t $ channel (centre), and $ u $ channel (right). |
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Figure 1-b:
Leading-order Feynman diagrams for WZ production in pp collisions from the $ s $ channel (left), $ t $ channel (centre), and $ u $ channel (right). |
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Figure 1-c:
Leading-order Feynman diagrams for WZ production in pp collisions from the $ s $ channel (left), $ t $ channel (centre), and $ u $ channel (right). |
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Figure 2:
Distribution of observables in the ZZ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $3. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 2-a:
Distribution of observables in the ZZ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $3. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 2-b:
Distribution of observables in the ZZ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $3. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 2-c:
Distribution of observables in the ZZ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $3. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 2-d:
Distribution of observables in the ZZ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $3. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 3:
Distribution of the invariant mass of $ \ell $Z1 and $ \ell $Z2 in the ZZ CR accounting for the fit to data. The left (right) distribution shows the case in which the leptons are electrons (muons). The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 3-a:
Distribution of the invariant mass of $ \ell $Z1 and $ \ell $Z2 in the ZZ CR accounting for the fit to data. The left (right) distribution shows the case in which the leptons are electrons (muons). The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 3-b:
Distribution of the invariant mass of $ \ell $Z1 and $ \ell $Z2 in the ZZ CR accounting for the fit to data. The left (right) distribution shows the case in which the leptons are electrons (muons). The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 4:
Distribution of observables in the $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{Z} $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 4-a:
Distribution of observables in the $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{Z} $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 4-b:
Distribution of observables in the $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{Z} $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 4-c:
Distribution of observables in the $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{Z} $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 4-d:
Distribution of observables in the $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{Z} $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 5:
Distribution of observables in the $ \mathrm{X}\gamma $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 5-a:
Distribution of observables in the $ \mathrm{X}\gamma $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 5-b:
Distribution of observables in the $ \mathrm{X}\gamma $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 5-c:
Distribution of observables in the $ \mathrm{X}\gamma $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 5-d:
Distribution of observables in the $ \mathrm{X}\gamma $ CR accounting for the fit to data, described in Section 8. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched bands show the total uncertainty in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 6:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched band includes all systematic uncertainties in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 6-a:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched band includes all systematic uncertainties in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 6-b:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched band includes all systematic uncertainties in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 6-c:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched band includes all systematic uncertainties in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 6-d:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: flavour composition, $ p_{\mathrm{T}} $ of $ \ell $Z1, $ p_{\mathrm{T}} $ of $ \ell $Z2, and $ p_{\mathrm{T}} $ of $ \ell $W. The hatched band includes all systematic uncertainties in the MC prediction. The vertical bars of the data account for the statistical uncertainty. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 7:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: sum of charge of the final-state leptons, missing transverse momentum, invariant mass of the two leptons assigned to the Z boson decay, and that of the trilepton system. The hatched band includes all systematic uncertainties. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 7-a:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: sum of charge of the final-state leptons, missing transverse momentum, invariant mass of the two leptons assigned to the Z boson decay, and that of the trilepton system. The hatched band includes all systematic uncertainties. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
png pdf |
Figure 7-b:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: sum of charge of the final-state leptons, missing transverse momentum, invariant mass of the two leptons assigned to the Z boson decay, and that of the trilepton system. The hatched band includes all systematic uncertainties. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 7-c:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: sum of charge of the final-state leptons, missing transverse momentum, invariant mass of the two leptons assigned to the Z boson decay, and that of the trilepton system. The hatched band includes all systematic uncertainties. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 7-d:
Distributions of several observables in the SR accounting for the fit to data. Clockwise from upper left to lower right: sum of charge of the final-state leptons, missing transverse momentum, invariant mass of the two leptons assigned to the Z boson decay, and that of the trilepton system. The hatched band includes all systematic uncertainties. When present, overflow events are included in the last bin of the observables. The ratio panels show the ratio between data (black markers) with respect to the total prediction after the fit to data. Processes with a small contribution to this region are grouped in the ``Other'' category. |
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Figure 8:
Total WZ production cross section for each of the flavour-exclusive and for the flavour-inclusive categories. The vertical bands show different theoretical predictions for the WZ cross section at NLO in QCD (red dashed line) and NNLO QCD $\times$ NLO EW (blue solid line), as well as their corresponding scale uncertainties. For each measurement, the best fit value is denoted with a purple point, with two delimiters on the error bars that account for the statistical and total uncertainties. |
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Figure 9:
Measurement obtained in this analysis (red filled marker) together with other WZ production cross section measurements at different centre-of-mass energies by the CMS [6,1,7] Collaboration, compared to the NNLO QCD $\times$ NLO EW predictions, as well as the pure NLO prediction, computed in all cases with MATRIX. |
| Tables | |
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Table 1:
Requirements for the definition of the signal and control regions of the analysis. Objects in parentheses relate to the ZZ CR. |
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Table 2:
Summary of the input relative uncertainties. Numbers are presented in percentages over the total yields of the associated process on which they have an effect. All uncertainties are treated as shape variations on the templates used for the fit, with the exception of the normalization uncertainties in the backgrounds that are treated as flat variations of the corresponding yield. |
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Table 3:
Definition of the fiducial and total regions. The lepton related quantities refer to ``dressed'' leptons. A dash symbol is used in cases the selection is not considered for the corresponding phase space. |
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Table 4:
Number of selected events and their total uncertianty (by flavour channel) for the relevant processes in the signal region of the analysis accounting for the fit to data. The ``Background'' yield is the sum of all processes that are not WZ signal, and ``Prediction'' is the sum of all the processes, including WZ. |
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Table 5:
Measured fiducial cross sections and their corresponding uncertainties for the flavour-exclusive and flavour-inclusive categories. The predictions from both POWHEG at NLO in QCD and LO EW as well as several ones obtained from MATRIX (NLO QCD, NNLO QCD, NNLO QCD $\times$ NLO EW) are also included. |
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Table 6:
Flavour-inclusive total cross section result. The predictions from both POWHEG at NLO in QCD and LO EW as well as several ones obtained from MATRIX (NLO QCD, NNLO QCD, NNLO QCD $\times$ NLO EW) are also included. |
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Table 7:
Breakdown of different sources of systematic uncertainties and their relative impact in each channel, as well as in the inclusive measurement; as a percentage of the total uncertainty. The dash symbol indicates that the specific uncertainty does not apply. |
| Summary |
| The inclusive WZ production cross section is measured in proton-proton collisions at a centre-of-mass energy of 13.6 TeV, using data collected during 2022 with the CMS detector, corresponding to an integrated luminosity of 34.7 fb$ ^{-1} $. The production cross sections in the total and fiducial phase spaces are measured in the inclusive case as well as in four combinations of final state flavour composition. The cross sections are measured in a fiducial phase space as $ \sigma_{\text{fiducial}}(\mathrm{p}\mathrm{p}\to\mathrm{W}\mathrm{Z})= $ 297.6 $ \pm $ 6.4 (stat) $ \pm $ 6.4 (syst) $ \pm $ 4.2 (lumi) $ \pm $ 0.5 (theo) fb, and in a less restricted phase space as $ \sigma_{\text{total}}(\mathrm{p}\mathrm{p}\to\mathrm{W}\mathrm{Z})= $ 55.2 $ \pm $ 1.2 (stat) $ \pm $ 1.2 (syst) $ \pm $ 0.8 (lumi) $ \pm $ 0.1 (theo) pb. All these measurements are shown to be in good agreement with the SM predictions at NNLO QCD $\times$ NLO EW. |
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