| CMS-HIG-24-009 ; CERN-EP-2025-169 | ||
| Search for a Higgs boson produced in association with a charm quark and decaying to a W boson pair in proton-proton collisions at $ \sqrt{s}= $ 13 TeV | ||
| CMS Collaboration | ||
| 20 August 2025 | ||
| Submitted to J. High Energy Phys. | ||
| Abstract: This paper presents a search for a Higgs boson produced in association with a charm quark (cH) which allows to probe the Higgs-charm Yukawa coupling strength modifier $ \kappa_\mathrm{c} $. Higgs boson decays to a pair of W bosons are considered, where one W boson decays to an electron and a neutrino, and the other W boson decays to a muon and a neutrino. The data, corresponding to an integrated luminosity of 138 fb$ ^{-1} $, were collected between 2016 and 2018 with the CMS detector at the LHC at a center-of-mass energy of $ \sqrt{s}= $ 13 TeV. Upper limits at the 95% confidence level (CL) are set on the ratio of the measured yield to the standard model expectation for cH production. The observed (expected) upper limit is 1065 (506 ). When combined with the previous search for cH in the diphoton decay channel of the Higgs boson, the limits are interpreted as observed (expected) constraints at 95% CL on the value of $ \kappa_\mathrm{c} $, $ |\kappa_\mathrm{c}| < $ 47 (51 ). | ||
| Links: e-print arXiv:2508.14988 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; CADI line (restricted) ; | ||
| Figures | |
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Figure 1:
Leading-order Feynman diagrams that contribute to the $ \mathrm{p}\mathrm{p}\to\mathrm{c}\mathrm{H} $ process. The red dots indicate vertices where the Higgs-charm coupling modifier $ \kappa_\mathrm{c} $ is involved. |
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Figure 1-a:
Leading-order Feynman diagrams that contribute to the $ \mathrm{p}\mathrm{p}\to\mathrm{c}\mathrm{H} $ process. The red dots indicate vertices where the Higgs-charm coupling modifier $ \kappa_\mathrm{c} $ is involved. |
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Figure 1-b:
Leading-order Feynman diagrams that contribute to the $ \mathrm{p}\mathrm{p}\to\mathrm{c}\mathrm{H} $ process. The red dots indicate vertices where the Higgs-charm coupling modifier $ \kappa_\mathrm{c} $ is involved. |
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Figure 2:
Diagram illustrating H boson production in association with a charm quark in the absence of charm Yukawa coupling. The crossed vertex represents the top quark loop. |
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Figure 3:
The area-normalized distributions of the two BDT classifiers: $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right). The $ \mathit{D}_\text{bkg} $ classifier effectively separates the non H boson background ( $ \mathrm{t} \overline{\mathrm{t}} $, single top, diboson, and V+jets, denoted as other background) contributions from the cH production, but it is not sufficient for suppressing the $ {\mathrm{H}-\text{bkg}} $ ($ \mathrm{g}\mathrm{g}\mathrm{H} $, VBF, VH, $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{H} $, and $ \mathrm{b}\mathrm{H} $) contributions. The dedicated BDT classifier, $ \mathit{D}_{\mathrm{H}-\text{bkg}} $, is capable of distinguishing between other H boson production processes and cH production. |
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Figure 3-a:
The area-normalized distributions of the two BDT classifiers: $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right). The $ \mathit{D}_\text{bkg} $ classifier effectively separates the non H boson background ( $ \mathrm{t} \overline{\mathrm{t}} $, single top, diboson, and V+jets, denoted as other background) contributions from the cH production, but it is not sufficient for suppressing the $ {\mathrm{H}-\text{bkg}} $ ($ \mathrm{g}\mathrm{g}\mathrm{H} $, VBF, VH, $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{H} $, and $ \mathrm{b}\mathrm{H} $) contributions. The dedicated BDT classifier, $ \mathit{D}_{\mathrm{H}-\text{bkg}} $, is capable of distinguishing between other H boson production processes and cH production. |
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Figure 3-b:
The area-normalized distributions of the two BDT classifiers: $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right). The $ \mathit{D}_\text{bkg} $ classifier effectively separates the non H boson background ( $ \mathrm{t} \overline{\mathrm{t}} $, single top, diboson, and V+jets, denoted as other background) contributions from the cH production, but it is not sufficient for suppressing the $ {\mathrm{H}-\text{bkg}} $ ($ \mathrm{g}\mathrm{g}\mathrm{H} $, VBF, VH, $ {\mathrm{t}\overline{\mathrm{t}}} \mathrm{H} $, and $ \mathrm{b}\mathrm{H} $) contributions. The dedicated BDT classifier, $ \mathit{D}_{\mathrm{H}-\text{bkg}} $, is capable of distinguishing between other H boson production processes and cH production. |
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Figure 4:
Distributions of $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right) for different H boson production processes. The event counts correspond to the expected yields for 138 fb$ ^{-1} $. The splitting of $ {\mathrm{H}-\text{bkg}} $ into three components is based on the flavor of the additional jet associated with the H boson. The yield of the $ \mathrm{b}\mathrm{H} $ process is scaled by a factor of 10, and cH by a factor of 100. |
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Figure 4-a:
Distributions of $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right) for different H boson production processes. The event counts correspond to the expected yields for 138 fb$ ^{-1} $. The splitting of $ {\mathrm{H}-\text{bkg}} $ into three components is based on the flavor of the additional jet associated with the H boson. The yield of the $ \mathrm{b}\mathrm{H} $ process is scaled by a factor of 10, and cH by a factor of 100. |
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Figure 4-b:
Distributions of $ \mathit{D}_\text{bkg} $ (left) and $ \mathit{D}_{\mathrm{H}-\text{bkg}} $ (right) for different H boson production processes. The event counts correspond to the expected yields for 138 fb$ ^{-1} $. The splitting of $ {\mathrm{H}-\text{bkg}} $ into three components is based on the flavor of the additional jet associated with the H boson. The yield of the $ \mathrm{b}\mathrm{H} $ process is scaled by a factor of 10, and cH by a factor of 100. |
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Figure 5:
Observed and expected distributions of one-parameter-of-interest scenario after performing the fit in signal and control regions. The upper left plot shows the distribution of events as a function of $ \log(S/B) $ in the $ N_{\mathrm{c}-\text{j}}= $ 1 signal region, while the upper right shows the $ N_{\mathrm{c}-\text{j}} > $ 1 signal region, where $ S $ and $ B $ are the signal and background yields, respectively. The lower left plot shows the distribution of $ \mathit{D}_\text{bkg} $ used in the high-$ m_{\ell\ell} $ control region, while the normalization factor of the top CR is shown in the lower right. Within each plot, the upper panel provides the number of events from simulation and data in logarithmic scale, the middle panel displays the fractional contribution of each background component to the total expected yield in each bin, and the lower panel provides the ratio of data to simulated background events. The red lines represent background plus signal with $ \mu_{\mathrm{c}\mathrm{H}}= $ 390 divided by background. The hashed area shows the sum of systematic and statistical uncertainties. |
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Figure 5-a:
Observed and expected distributions of one-parameter-of-interest scenario after performing the fit in signal and control regions. The upper left plot shows the distribution of events as a function of $ \log(S/B) $ in the $ N_{\mathrm{c}-\text{j}}= $ 1 signal region, while the upper right shows the $ N_{\mathrm{c}-\text{j}} > $ 1 signal region, where $ S $ and $ B $ are the signal and background yields, respectively. The lower left plot shows the distribution of $ \mathit{D}_\text{bkg} $ used in the high-$ m_{\ell\ell} $ control region, while the normalization factor of the top CR is shown in the lower right. Within each plot, the upper panel provides the number of events from simulation and data in logarithmic scale, the middle panel displays the fractional contribution of each background component to the total expected yield in each bin, and the lower panel provides the ratio of data to simulated background events. The red lines represent background plus signal with $ \mu_{\mathrm{c}\mathrm{H}}= $ 390 divided by background. The hashed area shows the sum of systematic and statistical uncertainties. |
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png pdf |
Figure 5-b:
Observed and expected distributions of one-parameter-of-interest scenario after performing the fit in signal and control regions. The upper left plot shows the distribution of events as a function of $ \log(S/B) $ in the $ N_{\mathrm{c}-\text{j}}= $ 1 signal region, while the upper right shows the $ N_{\mathrm{c}-\text{j}} > $ 1 signal region, where $ S $ and $ B $ are the signal and background yields, respectively. The lower left plot shows the distribution of $ \mathit{D}_\text{bkg} $ used in the high-$ m_{\ell\ell} $ control region, while the normalization factor of the top CR is shown in the lower right. Within each plot, the upper panel provides the number of events from simulation and data in logarithmic scale, the middle panel displays the fractional contribution of each background component to the total expected yield in each bin, and the lower panel provides the ratio of data to simulated background events. The red lines represent background plus signal with $ \mu_{\mathrm{c}\mathrm{H}}= $ 390 divided by background. The hashed area shows the sum of systematic and statistical uncertainties. |
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png pdf |
Figure 5-c:
Observed and expected distributions of one-parameter-of-interest scenario after performing the fit in signal and control regions. The upper left plot shows the distribution of events as a function of $ \log(S/B) $ in the $ N_{\mathrm{c}-\text{j}}= $ 1 signal region, while the upper right shows the $ N_{\mathrm{c}-\text{j}} > $ 1 signal region, where $ S $ and $ B $ are the signal and background yields, respectively. The lower left plot shows the distribution of $ \mathit{D}_\text{bkg} $ used in the high-$ m_{\ell\ell} $ control region, while the normalization factor of the top CR is shown in the lower right. Within each plot, the upper panel provides the number of events from simulation and data in logarithmic scale, the middle panel displays the fractional contribution of each background component to the total expected yield in each bin, and the lower panel provides the ratio of data to simulated background events. The red lines represent background plus signal with $ \mu_{\mathrm{c}\mathrm{H}}= $ 390 divided by background. The hashed area shows the sum of systematic and statistical uncertainties. |
|
png pdf |
Figure 5-d:
Observed and expected distributions of one-parameter-of-interest scenario after performing the fit in signal and control regions. The upper left plot shows the distribution of events as a function of $ \log(S/B) $ in the $ N_{\mathrm{c}-\text{j}}= $ 1 signal region, while the upper right shows the $ N_{\mathrm{c}-\text{j}} > $ 1 signal region, where $ S $ and $ B $ are the signal and background yields, respectively. The lower left plot shows the distribution of $ \mathit{D}_\text{bkg} $ used in the high-$ m_{\ell\ell} $ control region, while the normalization factor of the top CR is shown in the lower right. Within each plot, the upper panel provides the number of events from simulation and data in logarithmic scale, the middle panel displays the fractional contribution of each background component to the total expected yield in each bin, and the lower panel provides the ratio of data to simulated background events. The red lines represent background plus signal with $ \mu_{\mathrm{c}\mathrm{H}}= $ 390 divided by background. The hashed area shows the sum of systematic and statistical uncertainties. |
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png pdf |
Figure 6:
Upper limits of $ \mu_{\mathrm{c}\mathrm{H}} $ at 95% CL for each data-taking period, and the combination of the periods. The light blue (red) bars show the 1 (2) standard deviation expected result of the 1POI fit with fixing the $ {\mathrm{H}+\mathrm{c}-\text{bkg}} $ contribution to the SM prediction. The green (yellow) bars show the 1 (2) standard deviation expected result of the 2POI fit with floating $ {\mathrm{H}+\mathrm{c}-\text{bkg}} $ contribution. The blue circles represent the median of the expected limit, while the black circles represent the observed limit. |
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Figure 7:
Two-dimensional likelihood contour of $ \mu_{\mathrm{c}\mathrm{H}} $ and $ \mu_{{\mathrm{H}+\mathrm{c}-\text{bkg}}} $. The color scale represents twice the negative log likelihood difference with respect to the best fit point. The observed 95% CL(dashed) and 68% CL (solid) contours are shown in black lines, and the best fit point as a black cross. The SM expectation is marked by a red diamond. The kink in the contour arises from a local minimum in the likelihood, driven by the shape uncertainty associated with the flavor scheme used in the cH process modeling. |
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Figure 8:
Upper limits of $ \mu_{\mathrm{c}\mathrm{H}} $ at 95% CL of the combined analysis with the previous result in the diphoton channel [21] using the 1POI fit. The light blue (red) bars show the 1 (2) standard deviation range of the expected results. The blue circles represent the median of the expected limit, while the black circles represent the observed limit. |
| Tables | |
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Table 1:
Definitions of the SRs and CRs. Two SRs are defined according to c jet multiplicity in selected events. Events with dilepton invariant mass above 72 GeV are considered as CRs. Events with an inverted transverse masses requirement that have at least two c jets are considered in top CR and the remaining events are tagged as high-$ m_{\ell\ell} $ CR. |
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Table 2:
Summary of input variables used in the BDT trainings. |
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Table 3:
Relative impact (in percent) of individual uncertainty sources on the measurement of $ \mu_{\mathrm{c}\mathrm{H}} $ expressed as the change in the one standard deviation when each source is fixed. Statistical uncertainties are derived by fixing all constrained nuisance parameters. |
| Summary |
| The first search for the associated production of a charm quark and a Higgs boson (cH) with the Higgs boson decays to a pair of W bosons has been presented. Decays of W bosons to $ \mathrm{e}\nu\mu\nu $ are considered. The search is based on the data collected from 2016 to 2018 with the CMS detector at the LHC, corresponding to an integrated luminosity of 138 fb$ ^{-1} $. The observed (expected) upper limit at 95% confidence level (CL) on the ratio of the measured production cross section with respect to the value expected from the standard model (SM) for cH production $ \mu_{\mathrm{c}\mathrm{H}} $ is set at 1065 (506 ) times the SM prediction. This search provides an alternative probe of the Yukawa coupling between the Higgs boson and charm quark. When combined with the previous search for cH in the diphoton decay channel, the limits are interpreted as observed (expected) constraints on the Yukawa coupling modifier of the Higgs boson to the charm quark, yielding $ |\kappa_\mathrm{c}| < $ 47 (51 ) at 95% CL. |
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