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| CMS-HIG-17-022 ; CERN-EP-2018-038 | ||
| Search for $ {\mathrm{t\bar{t}} \mathrm{H}} $ production in the all-jet final state in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
| CMS Collaboration | ||
| 19 March 2018 | ||
| JHEP 06 (2018) 101 | ||
| Abstract: A search is presented for the associated production of a Higgs boson with a top quark pair in the all-jet final state. Events containing seven or more jets are selected from a sample of proton-proton collisions at $\sqrt{s} = $ 13 TeV collected with the CMS detector at the LHC in 2016, corresponding to an integrated luminosity of 35.9 fb$^{-1}$. To separate the $ {\mathrm{t\bar{t}} \mathrm{H}} $ signal from the irreducible $ {\mathrm{t\bar{t}} + \mathrm{ b \bar{b} }}$ background, the analysis assigns leading order matrix element signal and background probability densities to each event. A likelihood-ratio statistic based on these probability densities is used to extract the signal. The results are provided in terms of an observed $ {\mathrm{t\bar{t}} \mathrm{H}} $ signal strength relative to the standard model production cross section $\mu=\sigma/\sigma_\mathrm{SM}$, assuming a Higgs boson mass of 125 GeV. The best fit value is ${\hat{\mu}} = $ 0.9 $\pm$ 0.7 (stat) $\pm$ 1.3 (syst) = 0.9 $\pm$ 1.5 (tot), and the observed and expected upper limits are, respectively, $\mu < $ 3.8 and $ < $ 3.1 at 95% confidence levels. | ||
| Links: e-print arXiv:1803.06986 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; CADI line (restricted) ; | ||
| Figures & Tables | Summary | Additional Figures | References | CMS Publications |
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| Figures | |
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Figure 1:
An example of an LO Feynman diagram for $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ production, including the subsequent decay of the top quark-antiquark pair, as well as that of the Higgs boson into a bottom quark-antiquark pair. |
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Figure 2:
Distribution in $ {H_{\mathrm {T}}} $ (left) and jet multiplicity (right) in data (black points) and in simulation (stacked histograms), after implementing the preselection. The simulated backgrounds are first scaled to the integrated luminosity of the data, and then the simulated QCD multijet background is rescaled to match the yield in data. The contribution from $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ signal (blue line) is scaled to the total background yield (equivalent to the yield in data) to enhance readability. The hatched bands reflect the total statistical and systematic uncertainties in the background prediction, prior to the fit to data, which are dominated by the systematic uncertainties in the simulated multijet background. The last bin includes event overflows. The ratios of data to background are given below the main panels. |
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Figure 2-a:
Distribution in $ {H_{\mathrm {T}}} $ in data (black points) and in simulation (stacked histograms), after implementing the preselection. The simulated backgrounds are first scaled to the integrated luminosity of the data, and then the simulated QCD multijet background is rescaled to match the yield in data. The contribution from $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ signal (blue line) is scaled to the total background yield (equivalent to the yield in data) to enhance readability. The hatched bands reflect the total statistical and systematic uncertainties in the background prediction, prior to the fit to data, which are dominated by the systematic uncertainties in the simulated multijet background. The last bin includes event overflows. The ratio of data to background are given below the main panel. |
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Figure 2-b:
Distribution in jet multiplicity in data (black points) and in simulation (stacked histograms), after implementing the preselection. The simulated backgrounds are first scaled to the integrated luminosity of the data, and then the simulated QCD multijet background is rescaled to match the yield in data. The contribution from $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ signal (blue line) is scaled to the total background yield (equivalent to the yield in data) to enhance readability. The hatched bands reflect the total statistical and systematic uncertainties in the background prediction, prior to the fit to data, which are dominated by the systematic uncertainties in the simulated multijet background. The last bin includes event overflows. The ratio of data to background are given below the main panel. |
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Figure 3:
Comparison of the distributions in the quark-gluon likelihood ratio in data (black points) and in simulation (stacked histograms), after preselection, excluding the first 3 b-tagged jets. The simulated backgrounds are first scaled to the integrated luminosity of the data, and then the simulated multijet background is rescaled to match the yield in data. The contribution from signal (blue line) is scaled to the total background yield (equivalent to the yield in data) to enhance readability. The hatched bands reflect the total statistical and systematic uncertainties in the background prediction, prior to the fit to data, which are dominated by the systematic uncertainties in the simulated multijet background. The ratio of data to background is given below the main panel. |
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Figure 4:
Distributions in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category. The MEM discriminant (upper left), $ {H_{\mathrm {T}}} $ (upper right), $ {p_{\mathrm {T}}} $ of the leading jet (middle left), minimum $\Delta R$ between b jets (middle right), invariant mass of the closest b jet pair (lower left), and minimum mass of all jet pairs (lower right). The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panels. The numbers in parenthesis in the legends represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-a:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: the MEM discriminant. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-b:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: $ {H_{\mathrm {T}}} $. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-c:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: $ {p_{\mathrm {T}}} $ of the leading jet. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-d:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: minimum $\Delta R$ between b jets. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-e:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: invariant mass of the closest b jet pair. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 4-f:
Distribution in data, in simulated backgrounds, and in the estimated multijet background for the ($\geq $9j, $\geq $4b) VR category: minimum mass of all jet pairs. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), which are given along with their corresponding statistical $p$-values. The differences between data and the total estimates divided by the quadratic sum of the statistical and systematic uncertainties in the data and in the estimates (pulls) are given below the main panel. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. The last bin includes event overflows. |
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Figure 5:
Examples of LO Feynman diagrams for the partonic processes of $ {\mathrm {g}} {\mathrm {g}}\to {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ and $ {\mathrm {g}} {\mathrm {g}}\to {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $. |
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Figure 5-a:
Example of LO Feynman diagram for the partonic processes of $ {\mathrm {g}} {\mathrm {g}}\to {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $. |
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Figure 5-b:
Example of LO Feynman diagram for the partonic processes of $ {\mathrm {g}} {\mathrm {g}}\to {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $. |
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Figure 6:
Distributions in the fitted MEM discriminant for each analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions in data are indicated by the black points. The ratios of data to background appear below the main panels. |
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Figure 6-a:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 6-b:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 6-c:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 6-d:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 6-e:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 6-f:
Distribution in the fitted MEM discriminant for one analysis category. The contributions expected from signal and background processes (filled histograms) are shown stacked. The $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {\mathrm {b}}} $ and $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} 2 {\mathrm {b}}} $ background process are shown combined with $ {{{\mathrm {t}\overline {\mathrm {t}}}} \text {+} {{\mathrm {b}} {\overline {\mathrm {b}}}}} $, the single t and ${{{\mathrm {t}\overline {\mathrm {t}}}} \text {+V}}$ processes are shown combined as "Other t'', and the V+jets and diboson processes are shown combined as "Electroweak''. The signal distributions (lines) for a Higgs boson mass of $ {m_{{\mathrm {H}}}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distribution in data is indicated by the black points. The ratios of data to background appear below the main panel. |
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Figure 7:
Best fit values in the signal strength modifiers $ {\hat{\mu}} $, and their 68% CL intervals as split into the statistical and systematic components (left), and median expected and observed 95% CL upper limits on $\mu $ (right). The expected limits are displayed with their 68% and 95% CL intervals, as well as with the expectation for an injected SM signal of $\mu = $ 1. |
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Figure 7-a:
Best fit values in the signal strength modifiers $ {\hat{\mu}} $, and their 68% CL intervals as split into the statistical and systematic components. |
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Figure 7-b:
Median expected and observed 95% CL upper limits on $\mu $. The expected limits are displayed with their 68% and 95% CL intervals, as well as with the expectation for an injected SM signal of $\mu = $ 1. |
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Figure 8:
Distribution in $\log_{10}(\text {S}/\text {B})$, where S and B indicate the respective bin-by-bin yields of the signal and background expected in the MEM discriminant distributions, obtained from a combined fit with the constraint in the cross section of $\mu =$ 1. |
| Tables | |
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Table 1:
Definition and description of the four orthogonal regions in the analysis. |
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Table 2:
Selected MEM hypotheses for each event topology. The 4W2H1T hypothesis assumes 1 b quark from a top quark is lost, 3W2H2T assumes that 1 quark from a W boson is lost, and 4W2H2T represents the fully reconstructed hypothesis requiring at least 8 jets. |
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Table 3:
Expected numbers of $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ signal and background events, and the observed event yields for the six analysis categories, following the fit to data. The signal contributions are given at the best fit value. The quoted uncertainties contain all the contributions described in Section 7 added in quadrature, considering all correlations among the processes. |
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Table 4:
Expected numbers of $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ signal and background events in the last three bins of the MEM discriminant for the six analysis categories, following the fit to data. The signal contributions are given at the best fit value. The quoted uncertainties contain all the contributions described in Section 7 added in quadrature, considering all correlations among the processes. Also given are the signal (S) to total background (B) ratios for the SM $ {{{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}}} $ expectation ($\mu = $ 1). |
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Table 5:
Summary of the systematic uncertainties affecting the signal and background expectations. The second column indicates the range in yield of the affected processes, caused by changing the nuisance parameters by their uncertainties. The third column indicates whether the uncertainties impact the distribution in the MEM discriminant. A check mark indicates that the uncertainty applies to the stated processes. An asterisk (*) indicates that the uncertainty affects the multijet distribution indirectly, because of the subtraction of directly affected backgrounds in the CR in data. |
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Table 6:
Best fit value of the signal-strength modifier $ {\hat{\mu}} $ and the median expected and observed 95% CL upper limits (UL) on $\mu $ in each of the six analysis categories, as well as the combined results. The best fit values are shown with their total uncertainties and the breakdown into the statistical and systematic components. The expected limits are given together with their 68% CL intervals. |
| Summary |
|
A search for the associated production of a Higgs boson with a top quark pair is performed using proton-proton collision data collected by the CMS experiment at a centre-of-mass energy of 13 TeV, corresponding to an integrated luminosity of 35.9 fb$^{-1}$. Events are selected to be compatible with the $ {\mathrm{H} \to \mathrm{b\bar{b}}} $ decay and the all-jet final state of the $ \mathrm{t\bar{t}} $ pair, and are divided into six categories according to their reconstructed jet and b jet multiplicities. The result of the search is presented in terms of the signal strength modifier $\mu$ for $ {\mathrm{t\bar{t}} \mathrm{H}} $ production, defined as the ratio of the measured $ {\mathrm{t\bar{t}} \mathrm{H}} $ production cross section to the one expected for a standard model Higgs boson with a mass of 125 GeV. From a combined fit of signal and background templates to the data in all event categories, observed and expected upper limits of $\mu < $ 3.8 and $ < $ 3.1, respectively, are obtained at 95% confidence levels. These limits correspond to a best fit value of ${\hat{\mu}} = $ 0.9 $\pm$ 0.7 (stat) $\pm$ 1.3 (syst) = 0.9 $\pm$ 1.5 (tot), which is compatible with the standard model expectation. |
| Additional Figures | |
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Additional Figure 1:
Trigger efficiencies of the OR of the dedicated triggers described in Section 4 as a function of the 6th jet ${p_{\mathrm {T}}}$. Events are selected using single-muon triggers, and shown after the preselection described in Section 4. |
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Additional Figure 2:
Trigger efficiencies of the OR of the dedicated triggers described in Section 4 as a function of the $ {H_{\mathrm {T}}} $. Events are selected using single-muon triggers, and shown after the preselection described in Section 4. |
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Additional Figure 3:
Trigger efficiencies of the OR of the dedicated triggers described in Section 4 as a function of the number of CSVM jets (right). Events are selected using single-muon triggers, and shown after the preselection described in Section 4. |
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Additional Figure 4:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-a:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-b:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-c:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-d:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-e:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 4-f:
Performance of the MEM discriminator in terms of signal $ {\text {t}\overline {\text {t}}\text {H}} (\text {bb})$ vs. background (${\text {t}\overline {\text {t}}\text {+jets}}$ and multijet) efficiencies. The final discriminator hypothesis is shown in each category, as reported in Table 2. The area under the curve (labelled AUC) for each background process is shown in the legend. |
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Additional Figure 5:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-a:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-b:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-c:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-d:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-e:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 5-f:
The distributions of the MEM discriminant in signal, multijet background, and the ${\mathrm{t} \mathrm{\bar{t}}}$ background subprocesses, normalized to unity. The final discriminator hypothesis is shown for each category, as reported in Table 2. |
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Additional Figure 6:
Expected fraction of signal and background processes contributing to the analysis categories. |
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Additional Figure 7:
Predicted (histograms) and observed (data points) event yields in each analysis category after the combined fit to data, corresponding to an integrated luminosity of 35.9 fb$^{-1}$. The plots show the baseline categories defined in Section 6. The expected contributions from different background processes (filled histograms) are stacked, showing the total fitted uncertainty (striped error bands), and the expected signal distribution (line) for a Higgs boson mass of $ {m_\mathrm {H}} = $ 125 GeV, but scaled to the total background yield for ease of readability. The ratios of data to background are given below the main panels, with the full uncertainties. |
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Additional Figure 7-a:
Predicted (histograms) and observed (data points) event yields in each analysis category after the combined fit to data, corresponding to an integrated luminosity of 35.9 fb$^{-1}$. The plot shows one of the baseline category defined in Section 6. The expected contributions from different background processes (filled histograms) are stacked, showing the total fitted uncertainty (striped error bands), and the expected signal distribution (line) for a Higgs boson mass of $ {m_\mathrm {H}} = $ 125 GeV, but scaled to the total background yield for ease of readability. The ratios of data to background are given below the main panels, with the full uncertainties. |
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Additional Figure 7-b:
Predicted (histograms) and observed (data points) event yields in each analysis category after the combined fit to data, corresponding to an integrated luminosity of 35.9 fb$^{-1}$. The plot shows one of the baseline category defined in Section 6. The expected contributions from different background processes (filled histograms) are stacked, showing the total fitted uncertainty (striped error bands), and the expected signal distribution (line) for a Higgs boson mass of $ {m_\mathrm {H}} = $ 125 GeV, but scaled to the total background yield for ease of readability. The ratios of data to background are given below the main panels, with the full uncertainties. |
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Additional Figure 8:
The $ {p_{\mathrm {T}}} $ of the leading jet after the preselection. Simulated events are used for the QCD multijet background, but its total yield is rescaled to match the data. The signal contribution is scaled to the total background yield (equivalent to the yield in data) to improve readability. The last bin includes overflow events. |
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Additional Figure 9:
The b-tagged jet multiplicity after the preselection. Simulated events are used for the QCD multijet background, but its total yield is rescaled to match the data. The signal contribution is scaled to the total background yield (equivalent to the yield in data) to improve readability. The last bin includes overflow events. |
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Additional Figure 10:
The QGL of the leading jet in $ {p_{\mathrm {T}}} $ after the preselection. Simulated events are used for the QCD multijet background, but its total yield is rescaled to match the data. The signal contribution is scaled to the total background yield (equivalent to the yield in data) to improve readability. |
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Additional Figure 11:
The QGLR calculated excluding the first 4 b-tagged jets after the preselection. Simulated events are used for the QCD multijet background, but its total yield is rescaled to match the data. The signal contribution is scaled to the total background yield (equivalent to the yield in data) to improve readability. |
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Additional Figure 12:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
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Additional Figure 12-a:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
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Additional Figure 12-b:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 12-c:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 12-d:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 12-e:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 12-f:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 100 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-a:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-b:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-c:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-d:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-e:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 13-f:
Distributions in the MEM discriminant for each analysis category, after the fit to data. The fitted contributions expected from signal and background processes (filled histograms) are shown stacked. The signal distributions (lines) for an H mass of $ {m_\mathrm {H}} = $ 125 GeV are multiplied by a factor of 500 and superimposed on the data. The distributions observed in data (data points) are also shown. The ratios of data to background are given below the main panels. |
png pdf |
Additional Figure 14:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-a:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-b:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-c:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-d:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-e:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
png pdf |
Additional Figure 14-f:
Distributions in the MEM discriminant in data, simulated backgrounds, and the estimated multijet background in the validation region of each category. The level of agreement between data and estimation is expressed in terms of a $\chi ^2$ divided by the number of degrees of freedom (dof), and the corresponding p-values are also shown. The differences between data and the total estimates divided by the total statistical and systematic uncertainties in the data and estimates added in quadrature (pulls) are given below the main panels. The numbers in parenthesis in the legend represent the total yields for the corresponding entries. |
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