CMS-SMP-18-004 ; CERN-EP-2020-144 | ||
$\mathrm{W^{+}W^{-}}$ boson pair production in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
CMS Collaboration | ||
1 September 2020 | ||
Phys. Rev. D 102 (2020) 092001 | ||
Abstract: A measurement of the $\mathrm{W^{+}W^{-}}$ boson pair production cross section in proton-proton collisions at $\sqrt{s} = $ 13 TeV is presented. The data used in this study are collected with the CMS detector at the CERN LHC and correspond to an integrated luminosity of 35.9 fb$^{-1}$. The $\mathrm{W^{+}W^{-}}$ candidate events are selected by requiring two oppositely charged leptons (electrons or muons). Two methods for reducing background contributions are employed. In the first one, a sequence of requirements on kinematic quantities is applied allowing a measurement of the total production cross section: 117.6 $\pm$ 6.8 pb, which agrees well with the theoretical prediction. Fiducial cross sections are also reported for events with zero or one jet, and the change in the zero-jet fiducial cross section with the jet transverse momentum threshold is measured. Normalized differential cross sections are reported within the fiducial region. A second method for suppressing background contributions employs two random forest classifiers. The analysis based on this method includes a measurement of the total production cross section and also a measurement of the normalized jet multiplicity distribution in $\mathrm{W^{+}W^{-}}$ events. Finally, a dilepton invariant mass distribution is used to probe for physics beyond the standard model in the context of an effective field theory, and constraints on the presence of dimension-6 operators are derived. | ||
Links: e-print arXiv:2009.00119 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; CADI line (restricted) ; |
Figures & Tables | Summary | Additional Figures | References | CMS Publications |
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Figures | |
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Figure 1:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-a:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-b:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-c:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-d:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-e:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 1-f:
Kinematic distributions for events with zero jets and DF leptons in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {{p_{\mathrm {T}}} ^{\ell \, \text {max}}} $ and $ {{p_{\mathrm {T}}} ^{\ell \, \text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell \ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell \ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell \ell}} $. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Figure 2:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-a:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-b:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-c:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-d:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-e:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 2-f:
Kinematic distributions for events with exactly one jet and DF leptons in the sequential cut analysis. The quantities, error bars, and hatched areas are the same as in Fig. 1. |
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Figure 3:
Top left: score $S_{\text {DY}}$ distribution for the Drell-Yan discriminating random forest discriminant. The Drell-Yan distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ distribution peaks toward one. Top right: score $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution for the top quark random forest discriminant. The ${\mathrm{t} {}\mathrm{\bar{t}}}$ distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ peaks toward one. Bottom left: the $S_{\text {DY}}$ distribution after suppressing top quark events with $S_{{\mathrm{t} {}\mathrm{\bar{t}}}} > S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}=$ 0.6. Bottom right: the $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution after suppressing Drell-Yan events with $S_{\text {DY}} > S_{\text {DY}}^{\text {min}}=$ 0.96. The error bars on the points represent the statistical uncertainties for the data, and the hatched areas represent the combined systematic and statistical uncertainties of the predicted yield in each bin. |
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Figure 3-a:
Top left: score $S_{\text {DY}}$ distribution for the Drell-Yan discriminating random forest discriminant. The Drell-Yan distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ distribution peaks toward one. Top right: score $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution for the top quark random forest discriminant. The ${\mathrm{t} {}\mathrm{\bar{t}}}$ distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ peaks toward one. Bottom left: the $S_{\text {DY}}$ distribution after suppressing top quark events with $S_{{\mathrm{t} {}\mathrm{\bar{t}}}} > S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}=$ 0.6. Bottom right: the $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution after suppressing Drell-Yan events with $S_{\text {DY}} > S_{\text {DY}}^{\text {min}}=$ 0.96. The error bars on the points represent the statistical uncertainties for the data, and the hatched areas represent the combined systematic and statistical uncertainties of the predicted yield in each bin. |
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Figure 3-b:
Top left: score $S_{\text {DY}}$ distribution for the Drell-Yan discriminating random forest discriminant. The Drell-Yan distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ distribution peaks toward one. Top right: score $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution for the top quark random forest discriminant. The ${\mathrm{t} {}\mathrm{\bar{t}}}$ distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ peaks toward one. Bottom left: the $S_{\text {DY}}$ distribution after suppressing top quark events with $S_{{\mathrm{t} {}\mathrm{\bar{t}}}} > S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}=$ 0.6. Bottom right: the $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution after suppressing Drell-Yan events with $S_{\text {DY}} > S_{\text {DY}}^{\text {min}}=$ 0.96. The error bars on the points represent the statistical uncertainties for the data, and the hatched areas represent the combined systematic and statistical uncertainties of the predicted yield in each bin. |
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Figure 3-c:
Top left: score $S_{\text {DY}}$ distribution for the Drell-Yan discriminating random forest discriminant. The Drell-Yan distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ distribution peaks toward one. Top right: score $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution for the top quark random forest discriminant. The ${\mathrm{t} {}\mathrm{\bar{t}}}$ distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ peaks toward one. Bottom left: the $S_{\text {DY}}$ distribution after suppressing top quark events with $S_{{\mathrm{t} {}\mathrm{\bar{t}}}} > S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}=$ 0.6. Bottom right: the $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution after suppressing Drell-Yan events with $S_{\text {DY}} > S_{\text {DY}}^{\text {min}}=$ 0.96. The error bars on the points represent the statistical uncertainties for the data, and the hatched areas represent the combined systematic and statistical uncertainties of the predicted yield in each bin. |
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Figure 3-d:
Top left: score $S_{\text {DY}}$ distribution for the Drell-Yan discriminating random forest discriminant. The Drell-Yan distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ distribution peaks toward one. Top right: score $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution for the top quark random forest discriminant. The ${\mathrm{t} {}\mathrm{\bar{t}}}$ distribution peaks toward zero and the ${\mathrm{W^{+}}W^{-}}$ peaks toward one. Bottom left: the $S_{\text {DY}}$ distribution after suppressing top quark events with $S_{{\mathrm{t} {}\mathrm{\bar{t}}}} > S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}=$ 0.6. Bottom right: the $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}$ distribution after suppressing Drell-Yan events with $S_{\text {DY}} > S_{\text {DY}}^{\text {min}}=$ 0.96. The error bars on the points represent the statistical uncertainties for the data, and the hatched areas represent the combined systematic and statistical uncertainties of the predicted yield in each bin. |
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Figure 4:
Comparison of efficiencies for the sequential cut and random forest analyses as a function of ${{p_{\mathrm {T}}} ^{\mathrm{W} \mathrm{W}}}$. The sequential cut analysis includes 0- and 1-jet events from both DF and SF lepton combinations, for which the contributions from 0- and 1-jet are shown separately. The efficiency curve for $S_{{\mathrm{t} {}\mathrm{\bar{t}}}}^{\text {min}}= $ 0.2 is also shown; this value is used in measuring the jet multiplicity distribution. |
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Figure 5:
The upper panel shows the fiducial cross sections for the production of $ {\mathrm{W^{+}} \mathrm{W^{-}}} $+0-jets as the ${p_{\mathrm {T}}}$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $ {p_{\mathrm {T}}} > $ 20 GeV and $ {| \eta |} < $ 2.5 excluding the products of $\tau $ lepton decay, and $ {m_{\ell \ell}} > $ 20 GeV, $ {p_{\mathrm {T}}} ^{\ell \ell} > $ 30 GeV, and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 30 GeV. Jets must have $ {p_{\mathrm {T}}} $ above the stated threshold, $ {| \eta |} < $ 4.5, and be separated from each of the two leptons by $\Delta R > $ 0.4. The lower panel shows the ratio of the theoretical prediction to the measurement. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
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Figure 6:
The upper panels show the normalized differential cross sections with respect to the dilepton mass ${m_{\ell \ell}}$, leading lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {max}}}$, trailing lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell \ell}} $, compared to {powheg} predictions. The lower panels show the ratio of the theoretical predictions to the measured values. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 6-a:
The upper panels show the normalized differential cross sections with respect to the dilepton mass ${m_{\ell \ell}}$, leading lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {max}}}$, trailing lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell \ell}} $, compared to {powheg} predictions. The lower panels show the ratio of the theoretical predictions to the measured values. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 6-b:
The upper panels show the normalized differential cross sections with respect to the dilepton mass ${m_{\ell \ell}}$, leading lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {max}}}$, trailing lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell \ell}} $, compared to {powheg} predictions. The lower panels show the ratio of the theoretical predictions to the measured values. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 6-c:
The upper panels show the normalized differential cross sections with respect to the dilepton mass ${m_{\ell \ell}}$, leading lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {max}}}$, trailing lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell \ell}} $, compared to {powheg} predictions. The lower panels show the ratio of the theoretical predictions to the measured values. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 6-d:
The upper panels show the normalized differential cross sections with respect to the dilepton mass ${m_{\ell \ell}}$, leading lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {max}}}$, trailing lepton ${{p_{\mathrm {T}}} ^{\ell \, \text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell \ell}} $, compared to {powheg} predictions. The lower panels show the ratio of the theoretical predictions to the measured values. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 7:
The upper panel shows the fractions of events with $ {N_{\mathrm {J}}} =$ 0, 1, $\ge $2 jets. The filled circles represent the data after backgrounds are subtracted and pileup and energy resolution are taken into account. The solid lines represent the {{powheg}}+{pythia} prediction. The lower panel shows the ratio of the theoretical prediction to the measurement. The meaning of the error bars and the shaded bands is the same as in Fig. 5. |
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Figure 8:
One of the Feynman diagrams through which dimension-6 operators modify the ${\mathrm{p}} {\mathrm{p}} \to {\mathrm{W^{+}} \mathrm{W^{-}}} $ cross section. |
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Figure 9:
Comparison of the template fits to the observed ${m_{\mathrm{e} \mu}}$ distributions in the 0-jet (left) and 1-jet (right) categories. The non-SM contributions for $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2=3.2 TeV ^{-2}$, $c_{\mathrm{W}}/\Lambda ^2=$ 4.9 TeV$ ^{-2}$, and $c_{B}/\Lambda ^2=$ 15.0 TeV$ ^{-2}$ are shown, not stacked on top of the other contributions. In the plot on the right, the decrease in the non-SM contribution at low ${m_{\mathrm{e} \mu}}$ is not statistically significant and results from limited precision in the subtraction of two large yields (SM and SM+non-SM). The last bin contains all events with reconstructed $ {m_{\mathrm{e} \mu}} > $ 1 TeV. The error bars on the data points represent the statistical uncertainties for the data, and the hatched areas represent the total uncertainty for the predicted yield in each bin. |
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Figure 9-a:
Comparison of the template fits to the observed ${m_{\mathrm{e} \mu}}$ distributions in the 0-jet (left) and 1-jet (right) categories. The non-SM contributions for $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2=3.2 TeV ^{-2}$, $c_{\mathrm{W}}/\Lambda ^2=$ 4.9 TeV$ ^{-2}$, and $c_{B}/\Lambda ^2=$ 15.0 TeV$ ^{-2}$ are shown, not stacked on top of the other contributions. In the plot on the right, the decrease in the non-SM contribution at low ${m_{\mathrm{e} \mu}}$ is not statistically significant and results from limited precision in the subtraction of two large yields (SM and SM+non-SM). The last bin contains all events with reconstructed $ {m_{\mathrm{e} \mu}} > $ 1 TeV. The error bars on the data points represent the statistical uncertainties for the data, and the hatched areas represent the total uncertainty for the predicted yield in each bin. |
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Figure 9-b:
Comparison of the template fits to the observed ${m_{\mathrm{e} \mu}}$ distributions in the 0-jet (left) and 1-jet (right) categories. The non-SM contributions for $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2=3.2 TeV ^{-2}$, $c_{\mathrm{W}}/\Lambda ^2=$ 4.9 TeV$ ^{-2}$, and $c_{B}/\Lambda ^2=$ 15.0 TeV$ ^{-2}$ are shown, not stacked on top of the other contributions. In the plot on the right, the decrease in the non-SM contribution at low ${m_{\mathrm{e} \mu}}$ is not statistically significant and results from limited precision in the subtraction of two large yields (SM and SM+non-SM). The last bin contains all events with reconstructed $ {m_{\mathrm{e} \mu}} > $ 1 TeV. The error bars on the data points represent the statistical uncertainties for the data, and the hatched areas represent the total uncertainty for the predicted yield in each bin. |
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Figure 10:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-a:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-b:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-c:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-d:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-e:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
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Figure 10-f:
On the left, the expected and observed $-2\Delta \ln L$ curves for the $c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2$, $ c_{\mathrm{W}}/\Lambda ^2$, and $c_{B}/\Lambda ^2$ combining the 0- and 1-jet categories. On the right, the expected and observed 68 and 95% confidence level contours in the $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{\mathrm{W}}/\Lambda ^2)$, $(c_{\mathrm{W} \mathrm{W} \mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$, and $(c_{\mathrm{W}}/\Lambda ^2, c_{B}/\Lambda ^2)$ planes combining the 0- and 1-jet categories. |
Tables | |
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Table 1:
Summary of the event selection criteria for the sequential cut and the random forest analyses. DYMVA refers to an event classifier used in the sequential cut analysis to suppress Drell-Yan background events. RF refers to random forest classifiers. Kinematic quantities are measured in GeV. The symbol (--) means no requirement applied. |
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Table 2:
Sample composition for the sequential cut and random forest selections after the fits described in Section 7 have been executed; the uncertainties shown are based on the total uncertainty obtained from the fit. The purity is the fraction of selected events that are ${\mathrm{W^{+}}W^{-}}$ signal events. "Observed'' refers to the number of events observed in the data. |
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Table 3:
Features used for the random forest classifiers. The first classifier distinguishes Drell-Yan and ${\mathrm{W^{+}}W^{-}}$ signal events, and the second one distinguishes top quark events and signal events. |
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Table 4:
Relative systematic uncertainties in the total cross section measurement (0- and 1-jet, DF and SF) based on the sequential cut analysis. |
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Table 5:
Summary of the signal strength and total production cross section obtained in the sequential cut analysis. The uncertainty listed is the total uncertainty obtained from the fit to the yields. |
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Table 6:
Fiducial cross section for the production of $ {\mathrm{W^{+}} \mathrm{W^{-}}} $+0-jets as the ${p_{\mathrm {T}}}$ threshold for jets is varied. The fiducial region is defined by two opposite-sign leptons with $ {p_{\mathrm {T}}} > $ 20 GeV and $ {| \eta |} < $ 2.5 excluding the products of $\tau $ lepton decay, and $ {m_{\ell \ell}} > $ 20 GeV, $ {p_{\mathrm {T}}} ^{\ell \ell} > $ 30 GeV, and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 30 GeV. Jets must have $ {p_{\mathrm {T}}} $ above the stated threshold, $ {| \eta |} < $ 4.5, and be separated from each of the two leptons by $\Delta R > $ 0.4. The total uncertainty is reported. |
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Table 7:
Efficiency for the random forest selection with respect to preselected events as a function of jet multiplicity. The stated uncertainties are statistical only. |
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Table 8:
Fractions of events with $ {N_{\mathrm {J}}} =$ 0, 1, $\ge $2 jets. The first uncertainty is statistical and the second combines systematic uncertainties from the response matrix and from the background subtraction. |
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Table 9:
Expected and observed 68 and 95% confidence intervals on the measurement of the Wilson coefficients associated with the three CP-conserving, dimension-6 operators. |
Summary |
Measurements of $\mathrm{W^{+}W^{-}}$ boson pair production in proton-proton collisions at $\sqrt{s} = $ 13 TeV was performed. The analysis is based on data collected with the CMS detector at the LHC corresponding to an integrated luminosity of 35.9 fb$^{-1}$. Candidate events were selected that have two leptons (electrons or muons) with opposite charges. Two analysis methods were described. The first method imposes a sequence of requirements on kinematic quantities to suppress backgrounds, while the second uses a pair of random forest classifiers. The total production cross section is $\sigma_{\text{SC}}^{\text{tot}} = $ 117.6 $\pm$ 1.4 (stat) $\pm$ 5.5 (syst) $\pm$ 1.9 (theo) $\pm$ 3.2 (lumi) pb = 117.6 $\pm$ 6.8 pb, where the individual uncertainties are statistical, experimental systematic, theoretical, and of integrated luminosity; this measured value is consistent with the next-to-next-to-leading-order theoretical prediction 118.8 $\pm$ 3.6 pb. Fiducial cross sections are also measured including the change in the 0-jet fiducial cross section with jet transverse momentum threshold. Normalized differential cross sections are measured and compared with next-to-leading-order Monte Carlo simulations. Good agreement is observed. The normalized jet multiplicity distribution in $\mathrm{W^{+}W^{-}}$ events is measured. Finally, bounds on coefficients of dimension-6 operators in the context of an effective field theory are set using electron-muon invariant mass distributions. |
Additional Figures | |
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Additional Figure 1:
The upper panels show the normalized differential cross sections in the 0-jet category with respect to the dilepton mass ${m_{\ell\ell}}$, leading lepton ${p_{\mathrm{T}}^{\,\text {max}}}$, trailing lepton ${p_{\mathrm{T}}^{\,\text {min}}}$, and dilepton azimuthal angular separation $ {\Delta \phi _{\ell\ell}} $, compared to POWHEG predictions. The lower panels show the ratio of the theoretical predictions to the measured values. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
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Additional Figure 1-a:
The upper panel shows the normalized differential cross section in the 0-jet category with respect to the dilepton mass ${m_{\ell\ell}}$, compared to POWHEG predictions. The lower panel shows the ratio of the theoretical predictions to the measured values. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
png pdf |
Additional Figure 1-b:
The upper panel shows the normalized differential cross section in the 0-jet category with respect to the leading lepton ${p_{\mathrm{T}}^{\,\text {max}}}$, compared to POWHEG predictions. The lower panel shows the ratio of the theoretical predictions to the measured values. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
png pdf |
Additional Figure 1-c:
The upper panel shows the normalized differential cross section in the 0-jet category with respect to the trailing lepton ${p_{\mathrm{T}}^{\,\text {min}}}$, compared to POWHEG predictions. The lower panel shows the ratio of the theoretical predictions to the measured values. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
png pdf |
Additional Figure 1-d:
The upper panel shows the normalized differential cross section in the 0-jet category with respect to the dilepton azimuthal angular separation $ {\Delta \phi _{\ell\ell}} $, compared to POWHEG predictions. The lower panel shows the ratio of the theoretical predictions to the measured values. In both the upper and lower panels, the error bars on the data points represent the total uncertainty of the measurement, and the shaded band depicts the uncertainty of the MC prediction. |
png pdf |
Additional Figure 2:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-a:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-b:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-c:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-d:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-e:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 2-f:
Kinematic distributions for events with zero jets and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-a:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-b:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-c:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-d:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-e:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 3-f:
Kinematic distributions for events with one jet and DF leptons in the b-tagged control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-a:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-b:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-c:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-d:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-e:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 4-f:
Kinematic distributions for events with zero jets and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-a:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-b:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-c:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-d:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-e:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 5-f:
Kinematic distributions for events with one jet and DF leptons in the same-sign control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-a:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-b:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-c:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-d:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-e:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 6-f:
Kinematic distributions for events with zero jets and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distributions show the leading and trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $ and $ {p_{\mathrm{T}}^{\,\text {min}}} $), the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$, the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $, the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$, and the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-a:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the leading lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {max}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-b:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the trailing lepton ${p_{\mathrm {T}}}$ ($ {p_{\mathrm{T}}^{\,\text {min}}} $). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-c:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the dilepton transverse momentum $ {p_{\mathrm {T}}} ^{\ell\ell}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-d:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the azimuthal angle between the two leptons $ {\Delta \phi _{\ell\ell}} $. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-e:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the missing transverse momentum ${{p_{\mathrm {T}}} ^\text {miss}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
png pdf |
Additional Figure 7-f:
Kinematic distributions for events with one jet and DF leptons in the $ {\mathrm {Z}} \to \tau ^+\tau ^-$ control region in the sequential cut analysis. The distribution shows the dilepton invariant mass $ {m_{\ell\ell}}$. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The error bars on the data points represent the statistical uncertainty of the data, and the hatched areas represent the combined systematic and statistical uncertainty of the predicted yield in each bin. The last bin includes the overflow. |
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Compact Muon Solenoid LHC, CERN |