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| CMS-PAS-SMP-20-006 | ||
| Measurements of production cross sections of polarized same-sign W boson pairs in association with two jets in proton-proton collisions at $\sqrt{s}= $ 13 TeV | ||
| CMS Collaboration | ||
| July 2020 | ||
| Abstract: The first measurements of production cross sections of polarized same-sign $\mathrm{W}^{\pm}\mathrm{W^{\pm}}$ boson pairs in proton-proton collisions are reported. The measurements are based on a sample of proton-proton collisions at a center-of-mass energy of 13 TeV collected by the CMS detector at the LHC, corresponding to an integrated luminosity of 137 fb$^{-1}$. Events are selected by requiring exactly two leptons, electrons or muons, of the same charge, moderate missing transverse momentum, and two jets with a large rapidity separation and a large dijet mass. An observed (expected) 95% CL upper limit on the production cross section for longitudinally polarized same-sign $\mathrm{W}^{\pm}\mathrm{W^{\pm}}$ boson pairs of 1.17 (0.88) fb is reported, with the helicity eigenstates defined in the $\mathrm{W}^{\pm}\mathrm{W^{\pm}}$ center-of-mass reference frame. The electroweak production of same-sign $\mathrm{W}^{\pm}\mathrm{W^{\pm}}$ boson pairs with at least one of the W bosons longitudinally polarized, is measured with an observed (expected) significance of 2.3 (3.1) standard deviations. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, PLB 812 (2020) 136018. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Illustrative Feynman diagrams of VBS processes contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons and two forward jets. Diagrams with the triple gauge coupling vertex (left), the quartic gauge coupling vertex (center), and the t-channel Higgs boson exchange (right) are shown. |
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Figure 1-a:
Illustrative Feynman diagram of VBS processes contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons and two forward jets: a diagram with the triple gauge coupling vertex is shown. |
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Figure 1-b:
Illustrative Feynman diagram of VBS processes contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons and two forward jets: a diagram with the quartic gauge coupling vertex is shown. |
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Figure 1-c:
Illustrative Feynman diagram of VBS processes contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons and two forward jets: a diagram with the t-channel Higgs boson exchange is shown. |
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Figure 2:
Distributions of the $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ (upper left), $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ (upper right), $\Delta \phi _{\ell \ell}$ (lower left), and of the output score of the inclusive BDT (lower right) in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histograms for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process include the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histograms for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 2-a:
Distribution of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process includes the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 2-b:
Distribution of $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process includes the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 2-c:
Distribution of $\Delta \phi _{\ell \ell}$ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process includes the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 2-d:
Distribution of the output score of the inclusive BDT in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process includes the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 3:
Distributions of the output score of the signal BDT used for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross section measurements (left) and of the output score of the signal BDT used for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{X}} $ and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross section measurements (right). The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histograms for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process include the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histograms for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
png pdf |
Figure 3-a:
Distribution of the output score of the signal BDT used for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross section measurements. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process include the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
png pdf |
Figure 3-b:
Distribution of the output score of the signal BDT used for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{X}} $ and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross section measurements. The predicted yields are shown with their best fit normalizations from the simultaneous fit. The histogram for $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ process include the contributions from the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $, $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $, and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes (shown as solid lines), QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, and interference. The histogram for $ {\mathrm {t}{\mathrm{V}} \mathrm {x}} $ backgrounds includes the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} {\mathrm{V}} $ and $ {\mathrm {t}\mathrm{Z} \mathrm{q}} $ processes. The histogram for other backgrounds includes the contributions from double parton scattering and ${\mathrm{V}} {\mathrm{V}} {\mathrm{V}} $ processes. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 4:
Profile likelihood scan as a function of the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ cross section. The red (blue) line represents the expected values in the background-only hypothesis considering all systematic uncertainties (only statistical uncertainties). The green line shows the expected values for the signal-plus-background hypothesis. The observed values are represented by the black line. |
| Tables | |
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Table 1:
Summary of the selection requirements defining the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The $ { | {m_{\ell \ell}} - m_{\mathrm{Z}} |}$ requirement is applied to the dielectron final state only. |
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Table 2:
List and description of all the input variables for the signal BDT trainings. |
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Table 3:
List and description of the input variables for the inclusive BDT training. |
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Table 4:
Systematic uncertainties of the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross section measurements in units of percent. |
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Table 5:
Expected yields from various SM processes and observed data events in $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The combination of the statistical and systematic uncertainties is shown. The expected yields are shown with their best-fit normalizations from the simultaneous fit for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ cross sections. The $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {T}}} $ and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ yields are obtained from the $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ yield assuming the SM prediction for the ratio of the yields. |
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Table 6:
Measured fiducial cross sections for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes and for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{X}} $ and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes for the helicity eigenstates defined in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ center-of-mass frame. The theoretical predictions including the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown. The theoretical uncertainties include statistical, PDF, and LO scale uncertainties. $\mathcal {B}$ is the branching fraction for $\mathrm{W} \mathrm{W} \to \ell \nu \ell '\nu $ [53]. |
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Table 7:
Measured fiducial cross sections for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{\mathrm {L}}} $ and $ {\mathrm{W} ^\pm _{X}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes and for the $ {\mathrm{W} ^\pm _{\mathrm {L}}\mathrm{W} ^\pm _{X}} $ and $ {\mathrm{W} ^\pm _{\mathrm {T}}\mathrm{W} ^\pm _{\mathrm {T}}} $ processes for the helicity eigenstates defined in the parton-parton center-of-mass frame. The theoretical predictions including the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown. The theoretical uncertainties include statistical, PDF, and LO scale uncertainties. $\mathcal {B}$ is the branching fraction for $\mathrm{W} \mathrm{W} \to \ell \nu \ell '\nu $ [53]. |
| Summary |
| The first measurements of production cross sections for polarized same-sign ${\mathrm{W}^\pm\mathrm{W}^\pm} $ boson pairs in proton-proton collisions are reported. The measurements are based on a sample of proton-proton collisions at a center-of-mass energy of 13 TeV collected by the CMS detector at the LHC, corresponding to an integrated luminosity of 137 fb$^{-1}$. Events are selected by requiring exactly two leptons, electrons or muons, of the same charge, moderate missing transverse momentum, and two jets with a large rapidity separation and a large dijet mass. BDTs are used to separate between the polarized scattering processes by exploiting the kinematic differences. An observed (expected) 95% CL upper limit on the production cross section for longitudinally polarized same-sign ${\mathrm{W}^\pm\mathrm{W}^\pm} $ boson pairs of 1.17 (0.88) fb is reported with the helicity eigenstates defined in the ${\mathrm{W}^\pm\mathrm{W}^\pm} $ center-of-mass reference frame. The electroweak production of the ${\mathrm{W}^\pm\mathrm{W}^\pm} $ boson pairs where at least one of the W bosons is longitudinally polarized, is measured with an observed (expected) significance of 2.3 (3.1) standard deviations. Results are also reported with the polarizations defined in the parton-parton center-of-mass reference frame. The measured cross section values agree with the theoretical predictions within uncertainties. |
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