CMS-PAS-HIG-19-002

CMS-PAS-HIG-19-002
Measurements of differential Higgs boson production cross sections in the leptonic WW decay mode at $\sqrt{s} =$ 13 TeV
CMS Collaboration
September 2019

Abstract: Measurements of differential production cross sections of the Higgs boson in pp collisions at $\sqrt{s} =$ 13 TeV are performed using events where the Higgs boson decays into a pair of W bosons which subsequently decay into an electron, a muon, and a pair of neutrinos. The analysis is based on data collected by the CMS detector at the LHC in 2016, 2017, and 2018, and corresponds to an integrated luminosity of 137 fb $^{-1}$ . Production cross sections with respect to the transverse momentum of the Higgs boson and the number of hadronic jets are considered. Higgs boson signal spectra are extracted and simultaneously unfolded to correct for selection efficiency and resolution effects by means of maximum likelihood fits to the observed event distributions.
Links: CDS record (PDF) ; CADI line (restricted) ; These preliminary results are superseded in this paper, JHEP 03 (2021) 003. The superseded preliminary plots can be found here.

Figures & Tables	Summary	References	CMS Publications

Figures
png pdf	Figure 1: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 1-a: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 1-b: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 1-c: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 1-d: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 1-e: Postfit ${m^{\ell \ell}}$ distributions for ${N_{\text {jet}}} =$ 0 (top left), ${N_{\text {jet}}} =$ 1 (top center), ${N_{\text {jet}}} =$ 2 (top right), ${N_{\text {jet}}} =$ 3 (bottom left), and ${N_{\text {jet}}} \geq$ 4 (bottom right). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-a: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-b: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-c: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-d: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-e: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 2-f: Postfit ${m^{\ell \ell}}$ distributions for 0 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 20 GeV (top row), 20 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 45 GeV (middle row), and 45 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 80 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-a: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-b: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-c: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-d: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-e: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 3-f: Postfit ${m^{\ell \ell}}$ distributions for 80 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 120 GeV (top row), 120 $< {{p_{\mathrm {T}}} ^{\mathrm{H}}} <$ 200 GeV (middle row), and ${{p_{\mathrm {T}}} ^{\mathrm{H}}} \geq$ 200 GeV (bottom row). Distributions are also split according to the ${{p_{\mathrm {T}}} ^{\ell _{2}}}$ categorization, i.e. ${{p_{\mathrm {T}}} ^{\ell _{2}}} <$ 20 GeV (left column) and ${{p_{\mathrm {T}}} ^{\ell _{2}}} >$ 20 GeV (right column). The contribution of the background (stacked histograms) and signal (stacked and superimposed red histograms) processes is also shown. The systematic uncertainties affecting signal and background contributions are also shown as a dashed gray band.
png pdf	Figure 4: Correlation between signal strength modifiers in fiducial ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 2.5.
png pdf	Figure 4-a: Correlation between signal strength modifiers in fiducial ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 2.5.
png pdf	Figure 4-b: Correlation between signal strength modifiers in fiducial ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 2.5.
png pdf	Figure 5: Correlation between signal strength modifiers in fiducial ${N_{\text {jet}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 9.52.
png pdf	Figure 5-a: Correlation between signal strength modifiers in fiducial ${N_{\text {jet}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 9.52.
png pdf	Figure 5-b: Correlation between signal strength modifiers in fiducial ${N_{\text {jet}}}$ bins obtained from unregularized (left) and regularized (right) fit to the combined data sets. Regularization strength is $\delta =$ 9.52.
png pdf	Figure 6: Observed differential fiducial cross sections in bins of ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ (left) and ${N_{\text {jet}}}$ (right), overlaid with the predictions from nominal and alternative signal models. The uncertainty bands on the theoretical predictions correspond to quadratic sums of renormalization and factorization scale uncertainties, PDF uncertainties, and simulation statistical uncertainties. The filled histogram in the ratio plot shows the relative contributions of the Higgs boson production modes in each bin.
png pdf	Figure 6-a: Observed differential fiducial cross sections in bins of ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ (left) and ${N_{\text {jet}}}$ (right), overlaid with the predictions from nominal and alternative signal models. The uncertainty bands on the theoretical predictions correspond to quadratic sums of renormalization and factorization scale uncertainties, PDF uncertainties, and simulation statistical uncertainties. The filled histogram in the ratio plot shows the relative contributions of the Higgs boson production modes in each bin.
png pdf	Figure 6-b: Observed differential fiducial cross sections in bins of ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ (left) and ${N_{\text {jet}}}$ (right), overlaid with the predictions from nominal and alternative signal models. The uncertainty bands on the theoretical predictions correspond to quadratic sums of renormalization and factorization scale uncertainties, PDF uncertainties, and simulation statistical uncertainties. The filled histogram in the ratio plot shows the relative contributions of the Higgs boson production modes in each bin.

Tables
png pdf	Table 1: Selection criteria for the signal candidate events and the control samples. Preselection is the common criteria for all three selections. Observable ${{p_{\mathrm {T}}} ^{\ell _{1}}}$ is the magnitude of the transverse momentum of the leading lepton. See text for the definitions of the other observables in the table.
png pdf	Table 2: Fiducial region definition.
png pdf	Table 3: Observed signal strength modifiers and resulting differential cross sections in fiducial ${{p_{\mathrm {T}}} ^{\mathrm{H}}}$ bins. The cross section values are the products of ${\sigma ^{\text {SM}}}$ and the regularized $\mu$ .
png pdf	Table 4: Observed signal strength modifiers and resulting differential cross sections in fiducial ${N_{\text {jet}}}$ bins. The cross section values are the products of ${\sigma ^{\text {SM}}}$ and the regularized $\mu$ .

Summary

Differential and integrated fiducial cross sections for the Higgs boson production have been measured using the

${\mathrm{H}\to\mathrm{W}{}\mathrm{W}\to\mathrm{e}\nu\mu\nu}$ decay. The measurements have been performed with pp collision data sets recorded by the CMS detector at a center-of-mass energy of 13 TeV in 2016, 2017, and 2018, corresponding to a total integrated luminosity of 137 fb

$^{-1}$ . Differential cross sections with respect to the Higgs boson transverse momentum and the number of jets produced in association are considered, in a fiducial phase space defined to match the experimental kinematic acceptance. The cross sections are extracted through a simultaneous template fit to kinematic distributions of the signal candidate events finely categorized to maximize the sensitivity to Higgs boson production. The measurements are compared to SM theoretical calculations using POWHEG and MadGraph5+MCatNLO generators. The integrated fiducial cross section is measured to be 85.0

$^{+9.9}_{-9.3}$ fb, consistent with the SM expectation.

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