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| CMS-PAS-EXO-19-002 | ||
| Search for new physics in multilepton final states in pp collisions at $\sqrt{s}= $ 13 TeV | ||
| CMS Collaboration | ||
| March 2019 | ||
| Abstract: A search for new physics in events with three or more electrons or muons is presented. The data sample corresponds to 137 fb$^{-1}$ of integrated luminosity in pp collisions at $\sqrt{s}= $ 13 TeV collected by the CMS experiment at the CERN LHC in 2016, 2017, and 2018. The targeted signal models are pair production of type-III seesaw heavy fermions and associated production of a light scalar or pseudoscalar boson with a pair of top quarks, in final states with at least three leptons. The heavy fermions may produce non-resonant excesses in the tails of the transverse mass as well as the sum of leptonic transverse momenta and missing transverse energy, whereas light scalars or pseudoscalars may create resonant dilepton mass spectra in multilepton events with or without b quark jets. The observations are found to be consistent with expectations from standard model processes. The results exclude heavy fermions of the type-III seesaw model with masses below 880 GeV for the lepton flavor democratic scenario. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) and 0.04 (0.03) are excluded for masses in the range of 15-75 GeV and 108-340 GeV, respectively. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, JHEP 03 (2020) 051. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Leading order Feynman diagrams for the type-III seesaw (left) and $ \mathrm{t\bar{t}}\phi$ (right) signal models, depicting example production and decay modes in pp collisions. |
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Figure 1-a:
Leading order Feynman diagrams for the type-III seesaw (left) and $ \mathrm{t\bar{t}}\phi$ (right) signal models, depicting example production and decay modes in pp collisions. |
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Figure 1-b:
Leading order Feynman diagrams for the type-III seesaw (left) and $ \mathrm{t\bar{t}}\phi$ (right) signal models, depicting example production and decay modes in pp collisions. |
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Figure 2:
The $ {M_{\rm T}}$ distribution in the WZ enriched control selection (upper left), the $ {L_{\rm T}}$ distribution in the misidentifed lepton enriched control selection (upper right), the $ {L_{\rm T}}$ distribution in the $ \mathrm{t\bar{t}Z}$ enriched control selection (lower left), and the $ {S_{\rm T}}$ distribution in the ZZ enriched control selection (lower right). The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 2-a:
The $ {M_{\rm T}}$ distribution in the WZ enriched control selection (upper left), the $ {L_{\rm T}}$ distribution in the misidentifed lepton enriched control selection (upper right), the $ {L_{\rm T}}$ distribution in the $ \mathrm{t\bar{t}Z}$ enriched control selection (lower left), and the $ {S_{\rm T}}$ distribution in the ZZ enriched control selection (lower right). The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 2-b:
The $ {M_{\rm T}}$ distribution in the WZ enriched control selection (upper left), the $ {L_{\rm T}}$ distribution in the misidentifed lepton enriched control selection (upper right), the $ {L_{\rm T}}$ distribution in the $ \mathrm{t\bar{t}Z}$ enriched control selection (lower left), and the $ {S_{\rm T}}$ distribution in the ZZ enriched control selection (lower right). The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 2-c:
The $ {M_{\rm T}}$ distribution in the WZ enriched control selection (upper left), the $ {L_{\rm T}}$ distribution in the misidentifed lepton enriched control selection (upper right), the $ {L_{\rm T}}$ distribution in the $ \mathrm{t\bar{t}Z}$ enriched control selection (lower left), and the $ {S_{\rm T}}$ distribution in the ZZ enriched control selection (lower right). The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 2-d:
The $ {M_{\rm T}}$ distribution in the WZ enriched control selection (upper left), the $ {L_{\rm T}}$ distribution in the misidentifed lepton enriched control selection (upper right), the $ {L_{\rm T}}$ distribution in the $ \mathrm{t\bar{t}Z}$ enriched control selection (lower left), and the $ {S_{\rm T}}$ distribution in the ZZ enriched control selection (lower right). The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-a:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-b:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-c:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-d:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-e:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 3-f:
Type-III seesaw signal regions in 3L below-Z (upper left), on-Z (upper right), above-Z (center left), OSSF0 (center right), and in 4L OSSF1 (lower left) and OSSF2 (lower right) events. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for type-III seesaw models with $\Sigma $ masses of 300 GeV and 700 GeV are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins contain the overflow events in each distribution. |
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Figure 4:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-a:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-b:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-c:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-d:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-e:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 4-f:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-a:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-b:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-c:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-d:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-e:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 5-f:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L(ee) 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 6:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 6-a:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 6-b:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 6-c:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 6-d:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
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Figure 6-e:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 6-f:
Dielectron $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L(ee) $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow {\rm ee})$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-a:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-b:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-c:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-d:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-e:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 7-f:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 0B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-a:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-b:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-c:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-d:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-e:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 8-f:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 3L$(\mu \mu )$ 1B $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0 $ < {S_{\rm T}} < $ 400 GeV, 400 $ < {S_{\rm T}} < $ 800 GeV, and $ {S_{\rm T}} > $ 800 GeV, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-a:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-b:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-c:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-d:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-e:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 9-f:
Dimuon $ {M_{\rm OSSF}}^{20}$ (left column) and $ {M_{\rm OSSF}}^{300}$ (right column) distributions in 4L$(\mu \mu )$ $ \mathrm{t\bar{t}}\phi$ signal regions. Upper, center, and lower plots are with 0B 0 $ < {S_{\rm T}} < $ 400 GeV, 0B $ {S_{\rm T}} < $ 400 GeV, and 1B $ {S_{\rm T}}$-inclusive, respectively. The total SM background is shown as a stacked histogram of all contributing processes. The predictions for $ \mathrm{t\bar{t}}\phi(\rightarrow \mu \mu )$ models with a pseudoscalar (scalar) $\phi $ of 20 and 125 (70 and 300) GeV mass are also shown. The lower panels show the ratio of observed to expected events. The hatched gray band in the upper panels and the light gray bands in the lower panels represent the total (systematic and statistical) uncertainty in each bin, whereas the dark gray bands in the lower panels represent the statistical uncertainty only. The last bins do not contain the overflow events as these are outside the probed mass range. |
png pdf |
Figure 10:
The 95% confidence level upper limits on the total production cross section of heavy fermion pairs. Also shown is the theoretical prediction for the cross section of the $\Sigma $ pair production via the type III seesaw mechanism, with its uncertainty. Type-III seesaw heavy fermions are excluded for masses below 880 GeV (expected 930 GeV) in the flavor democratic scenario. |
png pdf |
Figure 11:
The 95% confidence level upper limits on the production cross section times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Also shown are the theoretical predictions for the production cross section times branching ratio of the $ \mathrm{t\bar{t}}\phi$ model, with their uncertainties, and assuming g$_{t}^2\times {\rm BR}(\phi \rightarrow \ell \ell)=$ 0.05. All $ \mathrm{t\bar{t}}\phi$ signal scenarios are excluded for production cross sections above 20 fb for $\phi $ masses in the range of 15-75 GeV, and above 5 fb for $\phi $ masses in the range of 108-340 GeV. |
png pdf |
Figure 11-a:
The 95% confidence level upper limits on the production cross section times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Also shown are the theoretical predictions for the production cross section times branching ratio of the $ \mathrm{t\bar{t}}\phi$ model, with their uncertainties, and assuming g$_{t}^2\times {\rm BR}(\phi \rightarrow \ell \ell)=$ 0.05. All $ \mathrm{t\bar{t}}\phi$ signal scenarios are excluded for production cross sections above 20 fb for $\phi $ masses in the range of 15-75 GeV, and above 5 fb for $\phi $ masses in the range of 108-340 GeV. |
png pdf |
Figure 11-b:
The 95% confidence level upper limits on the production cross section times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Also shown are the theoretical predictions for the production cross section times branching ratio of the $ \mathrm{t\bar{t}}\phi$ model, with their uncertainties, and assuming g$_{t}^2\times {\rm BR}(\phi \rightarrow \ell \ell)=$ 0.05. All $ \mathrm{t\bar{t}}\phi$ signal scenarios are excluded for production cross sections above 20 fb for $\phi $ masses in the range of 15-75 GeV, and above 5 fb for $\phi $ masses in the range of 108-340 GeV. |
png pdf |
Figure 11-c:
The 95% confidence level upper limits on the production cross section times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Also shown are the theoretical predictions for the production cross section times branching ratio of the $ \mathrm{t\bar{t}}\phi$ model, with their uncertainties, and assuming g$_{t}^2\times {\rm BR}(\phi \rightarrow \ell \ell)=$ 0.05. All $ \mathrm{t\bar{t}}\phi$ signal scenarios are excluded for production cross sections above 20 fb for $\phi $ masses in the range of 15-75 GeV, and above 5 fb for $\phi $ masses in the range of 108-340 GeV. |
png pdf |
Figure 11-d:
The 95% confidence level upper limits on the production cross section times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Also shown are the theoretical predictions for the production cross section times branching ratio of the $ \mathrm{t\bar{t}}\phi$ model, with their uncertainties, and assuming g$_{t}^2\times {\rm BR}(\phi \rightarrow \ell \ell)=$ 0.05. All $ \mathrm{t\bar{t}}\phi$ signal scenarios are excluded for production cross sections above 20 fb for $\phi $ masses in the range of 15-75 GeV, and above 5 fb for $\phi $ masses in the range of 108-340 GeV. |
png pdf |
Figure 12:
The 95% confidence level upper limits on the square of the Yukawa coupling to top quarks times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
png pdf |
Figure 12-a:
The 95% confidence level upper limits on the square of the Yukawa coupling to top quarks times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
png pdf |
Figure 12-b:
The 95% confidence level upper limits on the square of the Yukawa coupling to top quarks times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
png pdf |
Figure 12-c:
The 95% confidence level upper limits on the square of the Yukawa coupling to top quarks times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
png pdf |
Figure 12-d:
The 95% confidence level upper limits on the square of the Yukawa coupling to top quarks times branching ratio for a scalar $\phi $ boson in dielectron (upper left) and dimuon (lower left) channels, and for a pseudoscalar $\phi $ boson in dielectron (upper right) and dimuon (lower right) channels, where $\phi $ is produced in association with a top quark pair. Assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
| Tables | |
png pdf |
Table 1:
Multilepton signal region definitions for the signal models. All events containing a same-flavor lepton pair with mass below 12 GeV, and 3L events containing an OSSF lepton pair with mass below 76 GeV when the trilepton mass is within a Z boson mass window (91 $\pm$ 15 GeV) are vetoed. |
png pdf |
Table 2:
Sources of systematic uncertainties, affected background and signal processes, relative variation on the affected processes, and correlation model across years in signal regions. |
png pdf |
Table 3:
Acceptance times efficiency values in 3 and 4 lepton channels for the signal models at various mass hypotheses. |
| Summary |
| In summary, we performed a search for new physics in multilepton events in 137 fb$^{-1}$ of pp collision data collected by the CMS detector. The observations are found to be consistent with the expectations from standard model processes, with no statistically significant signal-like excess in any of the probed channels. The results are used to constrain the allowed parameter space of the targeted signal models. At 95% confidence level, we exclude heavy fermions of the type-III seesaw model with masses below 880 GeV in the lepton flavor democratic scenario. Similarly, assuming a Yukawa coupling of unity strength to top quarks, the branching ratio of new scalar (pseudoscalar) bosons to dielectrons and dimuons above 0.003 (0.03) are excluded for masses in the range of 15-75 GeV, and above 0.04 (0.03) for masses in the range of 108-340 GeV. |
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