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| CMS-EXO-16-012 ; CERN-EP-2017-027 | ||
| Search for associated production of dark matter with a Higgs boson decaying to $\mathrm{b\overline{b}}$ or $\gamma\gamma$ at $ \sqrt{s} = $ 13 TeV | ||
| CMS Collaboration | ||
| 13 March 2017 | ||
| JHEP 10 (2017) 180 | ||
| Abstract: A search for dark matter is performed using events with large missing transverse momentum and a Higgs boson decaying either to a pair of bottom quarks or to a pair of photons. The data from proton-proton collisions at a center-of-mass energy of 13 TeV, collected with the CMS detector at the LHC, correspond to an integrated luminosity of 2.3 fb$^{-1}$. Results are interpreted in the context of a Z'-two-Higgs-doublet model, where a high-mass resonance Z' decays into a pseudoscalar boson A and a CP-even scalar Higgs boson, and the A decays to a pair of dark matter particles. No significant excesses are observed over the background prediction. Combining results from the two decay channels yields exclusion limits in the signal cross section in the $m_{\mathrm{Z'}} $-$ m_{\textrm{A}}$ phase space. The observed data exclude, for Z' coupling strength $g_{\mathrm{Z'}} = $ 0.8 and $m_{\mathrm{A}} = $ 300 GeV for example, the Z' mass range of 600 to 1860 GeV. This is the first result on a search for dark matter produced in association with a Higgs boson that includes constraints on $\mathrm{h} \to \gamma\gamma $ obtained at $ \sqrt{s} = $ 13 TeV. | ||
| Links: e-print arXiv:1703.05236 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; CADI line (restricted) ; | ||
| Figures | |
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Figure 1:
Leading order Feynman diagram of the Z'-2HDM ``simplified model''. A pseudoscalar boson A decaying into invisible dark matter is produced from the decay of an on-shell Z' resonance. This gives rise to a Higgs boson and missing transverse momentum. |
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Figure 2:
The ${p_{\mathrm {T}}^{\text {miss}}}$ distribution for ${m_{ {\mathrm {A}} }} = $ 300, 500, and 700 GeV with ${m_{\mathrm{Z'}}} = $ 1200 GeV. All other parameters of the model are fixed, as mentioned in the text. |
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Figure 3:
Post-fit distribution of the reconstructed Higgs boson candidate mass expected from SM backgrounds and observed in data for the resolved (left) and the boosted (right) regimes with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model is computed assuming ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panels show the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The first and third bins in the distribution show the mass sidebands (Z($\rightarrow \nu \overline {\nu }$)+jets) CR; the second bin shows the SR. |
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Figure 3-a:
Post-fit distribution of the reconstructed Higgs boson candidate mass expected from SM backgrounds and observed in data for the resolved regime with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model is computed assuming ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The first and third bins in the distribution show the mass sidebands (Z($\rightarrow \nu \overline {\nu }$)+jets) CR; the second bin shows the SR. |
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Figure 3-b:
Post-fit distribution of the reconstructed Higgs boson candidate mass expected from SM backgrounds and observed in data for the boosted regime with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model is computed assuming ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The first and third bins in the distribution show the mass sidebands (Z($\rightarrow \nu \overline {\nu }$)+jets) CR; the second bin shows the SR. |
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Figure 4:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}} $ expected from SM backgrounds and observed in data for the W+jets (upper left), top quark (upper right) and Z($\rightarrow \nu \overline {\nu }$)+jets (lower) CRs for the resolved regime. The bottom panels show the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 GeV. |
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Figure 4-a:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}} $ expected from SM backgrounds and observed in data for the W+jets CR for the resolved regime. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 GeV. |
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Figure 4-b:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}} $ expected from SM backgrounds and observed in data for the top quark CR for the resolved regime. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 GeV. |
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Figure 4-c:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}} $ expected from SM backgrounds and observed in data for the Z($\rightarrow \nu \overline {\nu }$)+jets CR for the resolved regime. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 GeV. |
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Figure 5:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the single-lepton CR and Z($\rightarrow \nu \overline {\nu }$)+jets CRs for the boosted regime. The bottom panels show the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 500 GeV. |
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Figure 5-a:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the single-lepton CR. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 500 GeV. |
png pdf |
Figure 5-b:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the Z($\rightarrow \nu \overline {\nu }$)+jets CRs for the boosted regime. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 500 GeV. |
png pdf |
Figure 6:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the resolved (left) and the boosted (right) regimes in the signal region with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model uses ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panels show the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 (500) GeV for the resolved (boosted) regime. |
png pdf |
Figure 6-a:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the resolved regime in the signal region with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model uses ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 (500) GeV for the resolved (boosted) regime. |
png pdf |
Figure 6-b:
Post-fit distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ expected from SM backgrounds and observed in data for the boosted regime in the signal region with three different ${m_{\mathrm{Z'}}}$ signal points overlaid. The cross section for the signal model uses ${g_{\mathrm{Z'}}} = $ 0.8. The bottom panel shows the data-to-simulation ratios for pre-fit (red markers) and post-fit (black markers) background predictions with a hatched band corresponding to the uncertainty due to the finite size of simulated samples and a gray band that adds the systematic uncertainty onto the post-fit background prediction. The last bin includes all events with $ {p_{\mathrm {T}}^{\text {miss}}} > $ 350 (500) GeV for the resolved (boosted) regime. |
png pdf |
Figure 7:
Distribution of $m_{\gamma \gamma }$ (left) in events passing all selection criteria except the $m_{\gamma \gamma }$ and ${p_{\mathrm {T}}^{\text {miss}}}$ requirement. Distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ (right) for events passing all selection criteria including 120 GeV $ < m_{\gamma \gamma } < $ 130 GeV except ${p_{\mathrm {T}}^{\text {miss}}}$ requirement. For both plots, the product of signal cross section and branching fraction is set to 1 fb and the total simulated background is normalized to the total number of events in data. |
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Figure 7-a:
Distribution of $m_{\gamma \gamma }$ in events passing all selection criteria except the $m_{\gamma \gamma }$ and ${p_{\mathrm {T}}^{\text {miss}}}$ requirement. The product of signal cross section and branching fraction is set to 1 fb and the total simulated background is normalized to the total number of events in data. |
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Figure 7-b:
Distribution of ${p_{\mathrm {T}}^{\text {miss}}}$ for events passing all selection criteria including 120 GeV $ < m_{\gamma \gamma } < $ 130 GeV except ${p_{\mathrm {T}}^{\text {miss}}}$ requirement. The product of signal cross section and branching fraction is set to 1 fb and the total simulated background is normalized to the total number of events in data. |
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Figure 8:
Fit to the diphoton invariant mass distribution in the low-$ {p_{\mathrm {T}}^{\text {miss}}}$ CR in data used to evaluate $\alpha $. The function used is a power law with one free parameter. The uncertainties in the background shapes associated with the statistical uncertainties of the fit are shown by the one and two standard deviation bands. |
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Figure 9:
The expected and observed 95% CL limits on dark matter production cross sections for $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ and $ {\mathrm{h} \rightarrow \gamma \gamma } $ for ${m_{ {\mathrm {A}} }} = $ 300 GeV (left). The exclusion region is shown for two ${g_{\mathrm{Z'}}}$ values. The dark green and light yellow bands show the 68% and 95% uncertainties on the expected limit. The expected and observed 95% CL limits on the signal strength are shown for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV (right). The theoretical cross section ($\sigma _{\mathrm {th}}$) used for the right hand plot is calculated using ${g_{\mathrm{Z'}}} = $ 0.8. |
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Figure 9-a:
The expected and observed 95% CL limits on dark matter production cross sections for $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ and $ {\mathrm{h} \rightarrow \gamma \gamma } $ for ${m_{ {\mathrm {A}} }} = $ 300 GeV. The exclusion region is shown for two ${g_{\mathrm{Z'}}}$ values. The dark green and light yellow bands show the 68% and 95% uncertainties on the expected limit. |
png pdf |
Figure 9-b:
The expected and observed 95% CL limits on the signal strength are shown for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV. The theoretical cross section ($\sigma _{\mathrm {th}}$) is calculated using ${g_{\mathrm{Z'}}} = $ 0.8. |
png pdf |
Figure 10:
The observed (expected) 95% CL limit on the signal strength for the $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ (left) and $ {\mathrm{h} \rightarrow \gamma \gamma } $ (right) decay channels for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV and ${m_{ {\mathrm {A}} }} = $ 600-2500 GeV. The theoretical cross section is calculated using $g_{{\mathrm{Z'}} } = $ 0.8. For $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $, the results for the resolved analysis are shown with white background whereas the boosted analysis points are shown in black crossed background. |
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Figure 10-a:
The observed (expected) 95% CL limit on the signal strength for the $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ decay channel for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV and ${m_{ {\mathrm {A}} }} = $ 600-2500 GeV. The theoretical cross section is calculated using $g_{{\mathrm{Z'}} } = $ 0.8. The results for the resolved analysis are shown with white background whereas the boosted analysis points are shown in black crossed background. |
png pdf |
Figure 10-b:
The observed (expected) 95% CL limit on the signal strength for the $ {\mathrm{h} \rightarrow \gamma \gamma } $ decay channel for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV and ${m_{ {\mathrm {A}} }} = $ 600-2500 GeV. The theoretical cross section is calculated using $g_{{\mathrm{Z'}} } = $ 0.8. |
png pdf |
Figure 11:
The observed (expected) 95% CL limit on the signal strength for the combination of $ {\mathrm{h} \rightarrow \gamma \gamma } $ and $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ decay channels for ${m_{ {\mathrm {A}} }} = $ 300-800 GeV and ${m_{ {\mathrm {A}} }} = $ 600-2500 GeV. The theoretical cross section is calculated using $g_{{\mathrm{Z'}} } = $ 0.8. |
| Tables | |
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Table 1:
The product of acceptance and efficiency for signal in the SR, after full event selection for the $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ (upper) and the $ {\mathrm{h} \rightarrow \gamma \gamma } $ (lower) decay channels. |
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Table 2:
Post-fit background event yields and observed numbers of events in data for 2.3 fb$^{-1}$ in both the resolved and the boosted regimes for the $ {\mathrm{h} \rightarrow \mathrm{ b \bar{b} } } $ analysis. The expected numbers of signal events for $m_{\mathrm {A}} = $ 300 GeV, scaled to the nominal cross section with $ {g_{\mathrm{Z'}}} = $ 0.8, are also reported. |
| Summary |
|
A search has been performed for dark matter produced in association with a Higgs boson. The analysis is based on 2.3 fb$^{-1}$ of proton-proton collision data collected by the CMS experiment at $ \sqrt{s} = $ 13 TeV. This analysis focuses on a Z'-2HDM ``simplified model'' through an interaction between a Z' that decays into a pseudoscalar boson A that in turn decays to two dark matter candidates and a CP-even scalar Higgs boson. The particular case studied is where the Higgs boson decays to two b quarks or two photons. No significant deviation is observed from the standard model background. The search is interpreted in terms of dark matter production that places constraints on the parameter space of the Z'-2HDM model. With optimized selections, limits on the signal cross section are calculated for various values of ${m_{\mathrm{ Z'}}}$ and ${m_{\mathrm{A}}} $. For ${m_{\mathrm{A}}} = $ 300 GeV, the observed data exclude the Z' mass range of 600 to 1860 GeV, for ${g_{\mathrm{ Z' }}} =$ 0.8, and 770 to 2040 GeV using the constrained value of ${g_{\mathrm{ Z' }}} $. This is the first result on a search for dark matter produced in association with a Higgs boson that includes constraints on $\mathrm{h} \to \gamma\gamma $ obtained at $ \sqrt{s} = $ 13 TeV. It is also the first to combine results from the ${\mathrm{h} \rightarrow\mathrm{ b }\mathrm{ \bar{b} }} $ and $\mathrm{h} \to \gamma\gamma $ decay channels. |
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