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CMS-TAU-14-001 ; CERN-PH-EP-2015-261
Reconstruction and identification of τ lepton decays to hadrons and ντ at CMS
Accepted for publication in J. Instrum. J. Instrum. 11 (2016) P01019
Abstract: This paper describes the algorithms used by the CMS experiment to reconstruct and identify τhadrons+ντ decays during Run 1 of the LHC. The performance of the algorithms is studied in proton-proton collisions recorded at a centre-of-mass energy of 8 TeV, corresponding to an integrated luminosity of 19.7 fb1. The algorithms achieve an identification efficiency of 50-60%, with misidentification rates for quark and gluon jets, electrons, and muons between per mille and per cent levels.
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Figure 1:
The total material thickness (t) in units of radiation length X0, as a function of η, that a particle produced at the interaction point must traverse before it reaches the ECAL. The material used for sensors, readout electronics, mechanical structures, cooling, and services is given separately for the silicon pixel detector and for individual components of the silicon strip detector (``TEC'', ``TOB'', ``TIB and TID'') [21]. The material used for the beam pipe and for the support tube that separates the tracker from the ECAL is also shown separately.

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Figure 2-a:
Transverse momentum distributions of the visible decay products of τh decays, in (a) simulated Z/γττ events, (b) Z(2.5TeV)ττ events, and (c) of quark and gluon jets in simulated W+jets and multijet events, at the generator level.

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Figure 2-b:
Transverse momentum distributions of the visible decay products of τh decays, in (a) simulated Z/γττ events, (b) Z(2.5TeV)ττ events, and (c) of quark and gluon jets in simulated W+jets and multijet events, at the generator level.

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Figure 2-c:
Transverse momentum distributions of the visible decay products of τh decays, in (a) simulated Z/γττ events, (b) Z(2.5TeV)ττ events, and (c) of quark and gluon jets in simulated W+jets and multijet events, at the generator level.

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Figure 3-a:
Distributions in (a) reconstructed τh decay modes and (b) τh candidate masses in Z/γττ events selected in data, compared to MC expectations. The Z/γττ events are selected in the decay channel of muon and τh, as described in Section 7.1.1. The τh are required to pass the medium working point of the MVA-based τh isolation discriminant. The mass of τh candidates reconstructed in simulated Z/γττ events is corrected for small data/MC differences in the τh energy scale, discussed in Section 9. The electroweak background is dominated by W+jets production, with minor contributions arising from single top quark and diboson production. The shaded uncertainty band represents the sum of systematic and statistical uncertainties on the MC simulation.

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Figure 3-b:
Distributions in (a) reconstructed τh decay modes and (b) τh candidate masses in Z/γττ events selected in data, compared to MC expectations. The Z/γττ events are selected in the decay channel of muon and τh, as described in Section 7.1.1. The τh are required to pass the medium working point of the MVA-based τh isolation discriminant. The mass of τh candidates reconstructed in simulated Z/γττ events is corrected for small data/MC differences in the τh energy scale, discussed in Section 9. The electroweak background is dominated by W+jets production, with minor contributions arising from single top quark and diboson production. The shaded uncertainty band represents the sum of systematic and statistical uncertainties on the MC simulation.

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Figure 4-a:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-b:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-c:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-d:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-e:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-f:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-g:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 4-h:
Distributions, normalized to unity, in observables used as input variables to the MVA-based isolation discriminant, for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±. In the plot (c) of the τh decay mode, an entry at 0 represents the decay mode h±, 1 and 2 represent the decay modes h±π0 and h±π0π0, respectively, and entry 10 represents the h±hh± decay mode.

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Figure 5:
Distribution of MVA output for the τh identification discriminant that includes lifetime information for hadronic τ decays in simulated Z/γττ (blue), and jets in simulated W+jets (red) events.

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Figure 6-a:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-b:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-c:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-d:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-e:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-f:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-g:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-h:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-i:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-j:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-k:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 6-l:
Distributions, normalized to unity, in observables that are used as inputs to the MVA-based electron discriminant, for hadronic τ decays in simulated Z/γττ (blue), and electrons in simulated Z/γee (red) events. The τh candidates must have pT> 20 GeV and |η|< 2.3, and be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±.

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Figure 7-a:
a: Correlation between generated and reconstructed τh decay modes for τh decays in Z/γττ events, simulated for pileup conditions characteristic of the LHC Run 1 data-taking period. b: Fraction of generated τh reconstructed in the correct decay mode as function of Nvtx. Reconstructed τh candidates are required to be matched to hadronic τ decays at the generator-level within ΔR<0.3, to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, and pass pT> 20 GeV, |η|< 2.3, and the loose WP of the cutoff-based τh isolation discriminant.

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Figure 7-b:
a: Correlation between generated and reconstructed τh decay modes for τh decays in Z/γττ events, simulated for pileup conditions characteristic of the LHC Run 1 data-taking period. b: Fraction of generated τh reconstructed in the correct decay mode as function of Nvtx. Reconstructed τh candidates are required to be matched to hadronic τ decays at the generator-level within ΔR<0.3, to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, and pass pT> 20 GeV, |η|< 2.3, and the loose WP of the cutoff-based τh isolation discriminant.

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Figure 8-a:
The τh energy response (a) and relative resolution (b) as function of generator-level visible τ pT in simulated Zττ events for different pileup conditions: Nvtx12, 13Nvtx17, and Nvtx18. Reconstructed τh candidates are required to be matched to hadronic τ decays at the generator-level within ΔR<0.3, to be reconstructed in one of the decay modes h±, h±π0, h±π0π0 or h±hh±, and to pass pT> 20 GeV, |η|< 2.3, and the loose WP of the cutoff-based τh isolation discriminant.

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Figure 8-b:
The τh energy response (a) and relative resolution (b) as function of generator-level visible τ pT in simulated Zττ events for different pileup conditions: Nvtx12, 13Nvtx17, and Nvtx18. Reconstructed τh candidates are required to be matched to hadronic τ decays at the generator-level within ΔR<0.3, to be reconstructed in one of the decay modes h±, h±π0, h±π0π0 or h±hh±, and to pass pT> 20 GeV, |η|< 2.3, and the loose WP of the cutoff-based τh isolation discriminant.

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Figure 9-a:
Efficiency for τh decays in simulated Z/γττ (a,c) and Zττ (b,d) events to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, to satisfy the conditions pT> 20 GeV and |η|< 2.3, and to pass: the loose, medium and tight WP of the cutoff-based τh isolation discriminant (a,b) and the very loose, loose, medium and tight WP of the MVA-based tau isolation discriminant (c,d). The efficiency is shown as a function of the generator-level pT of the visible τ decay products in τh decays that are within |η|< 2.3.

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Figure 9-b:
Efficiency for τh decays in simulated Z/γττ (a,c) and Zττ (b,d) events to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, to satisfy the conditions pT> 20 GeV and |η|< 2.3, and to pass: the loose, medium and tight WP of the cutoff-based τh isolation discriminant (a,b) and the very loose, loose, medium and tight WP of the MVA-based tau isolation discriminant (c,d). The efficiency is shown as a function of the generator-level pT of the visible τ decay products in τh decays that are within |η|< 2.3.

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Figure 9-c:
Efficiency for τh decays in simulated Z/γττ (a,c) and Zττ (b,d) events to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, to satisfy the conditions pT> 20 GeV and |η|< 2.3, and to pass: the loose, medium and tight WP of the cutoff-based τh isolation discriminant (a,b) and the very loose, loose, medium and tight WP of the MVA-based tau isolation discriminant (c,d). The efficiency is shown as a function of the generator-level pT of the visible τ decay products in τh decays that are within |η|< 2.3.

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Figure 9-d:
Efficiency for τh decays in simulated Z/γττ (a,c) and Zττ (b,d) events to be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh±, to satisfy the conditions pT> 20 GeV and |η|< 2.3, and to pass: the loose, medium and tight WP of the cutoff-based τh isolation discriminant (a,b) and the very loose, loose, medium and tight WP of the MVA-based tau isolation discriminant (c,d). The efficiency is shown as a function of the generator-level pT of the visible τ decay products in τh decays that are within |η|< 2.3.

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Figure 10-a:
a,b: Distribution in the visible mass of Z/γττμτh candidate events, in which the reconstructed τh candidate contains (a) a single or (b) three charged particles. c,d: Distribution in (c) transverse impact parameter for events in which the τh candidate contains one charged particle and (d) in the distance between the τ production and decay vertex for events in which the τh candidate contains three charged particles. The Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``DY others''.

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Figure 10-b:
a,b: Distribution in the visible mass of Z/γττμτh candidate events, in which the reconstructed τh candidate contains (a) a single or (b) three charged particles. c,d: Distribution in (c) transverse impact parameter for events in which the τh candidate contains one charged particle and (d) in the distance between the τ production and decay vertex for events in which the τh candidate contains three charged particles. The Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``DY others''.

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Figure 10-c:
a,b: Distribution in the visible mass of Z/γττμτh candidate events, in which the reconstructed τh candidate contains (a) a single or (b) three charged particles. c,d: Distribution in (c) transverse impact parameter for events in which the τh candidate contains one charged particle and (d) in the distance between the τ production and decay vertex for events in which the τh candidate contains three charged particles. The Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``DY others''.

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Figure 10-d:
a,b: Distribution in the visible mass of Z/γττμτh candidate events, in which the reconstructed τh candidate contains (a) a single or (b) three charged particles. c,d: Distribution in (c) transverse impact parameter for events in which the τh candidate contains one charged particle and (d) in the distance between the τ production and decay vertex for events in which the τh candidate contains three charged particles. The Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``DY others''.

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Figure 11-a:
Distribution in the pT of τh candidates in (a) Z/γττ and (b) t¯t events in data and in simulations. The Z/γ (=e, μ, τ) and t¯t events in which either the reconstructed muon or the reconstructed τh candidate is misidentified are denoted in the MC simulation by ``DY others'' and ``t¯t others'', respectively.

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Figure 11-b:
Distribution in the pT of τh candidates in (a) Z/γττ and (b) t¯t events in data and in simulations. The Z/γ (=e, μ, τ) and t¯t events in which either the reconstructed muon or the reconstructed τh candidate is misidentified are denoted in the MC simulation by ``DY others'' and ``t¯t others'', respectively.

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Figure 12-a:
Jet pT distribution in (a) multijet and (b) W+jets events observed in data, compared to the MC expectation. The uncertainty in the MC expectation is dominated by the uncertainty in the jet energy scale.

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Figure 12-b:
Jet pT distribution in (a) multijet and (b) W+jets events observed in data, compared to the MC expectation. The uncertainty in the MC expectation is dominated by the uncertainty in the jet energy scale.

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Figure 13-a:
Distribution in mvis observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected mvis distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 13-b:
Distribution in mvis observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected mvis distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 13-c:
Distribution in mvis observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected mvis distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 13-d:
Distribution in mvis observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected mvis distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 14-a:
Distribution in Ntracks observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected Ntracks distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 14-b:
Distribution in Ntracks observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected Ntracks distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 14-c:
Distribution in Ntracks observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected Ntracks distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 14-d:
Distribution in Ntracks observed in the pass (a,c) and fail (b,d) samples of Z/γττ candidate events used to measure the τh identification efficiency, compared to the MC expectation, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants. Z/γ (=e, μ, τ) events in which either the reconstructed muon or the reconstructed τh candidate is due to a misidentification are denoted by ``DY others''. The expected Ntracks distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, described in Section 7.3. The ``Uncertainty'' bands represent the statistical and systematic uncertainties added in quadrature.

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Figure 15-a:
Tau identification efficiency measured in Z/γττμτh events as function of pT and η, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 15-b:
Tau identification efficiency measured in Z/γττμτh events as function of pT and η, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 15-c:
Tau identification efficiency measured in Z/γττμτh events as function of pT and η, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 15-d:
Tau identification efficiency measured in Z/γττμτh events as function of pT and η, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 16-a:
Tau identification efficiency measured in Z/γττμτh events as a function of the number of reconstructed vertices Nvtx, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 16-b:
Tau identification efficiency measured in Z/γττμτh events as a function of the number of reconstructed vertices Nvtx, for the cutoff-based and MVA-based τh isolation discriminants, compared to the MC expectation. The efficiency is computed relative to τh candidates passing the loose τh candidate selection described in Section 8.1.

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Figure 17-a:
Distribution in the transverse mass of the muon and EmissT in the pass region (a,c) and in the dimuon region (b,d) in t¯t events used to measure the τh identification efficiency, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants, respectively. The t¯t events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``t¯t others''. The expected mT distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 17-b:
Distribution in the transverse mass of the muon and EmissT in the pass region (a,c) and in the dimuon region (b,d) in t¯t events used to measure the τh identification efficiency, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants, respectively. The t¯t events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``t¯t others''. The expected mT distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 17-c:
Distribution in the transverse mass of the muon and EmissT in the pass region (a,c) and in the dimuon region (b,d) in t¯t events used to measure the τh identification efficiency, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants, respectively. The t¯t events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``t¯t others''. The expected mT distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 17-d:
Distribution in the transverse mass of the muon and EmissT in the pass region (a,c) and in the dimuon region (b,d) in t¯t events used to measure the τh identification efficiency, for the loose WP of the cutoff-based (a,b) and MVA-based (c,d) τh isolation discriminants, respectively. The t¯t events in which either the reconstructed muon or the reconstructed τh candidate are misidentified are denoted by ``t¯t others''. The expected mT distribution is shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 18-a:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 18-b:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 18-c:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 18-d:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 18-e:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 18-f:
Distribution in mτh, observed in events containing τh candidates of 20 <pT< 30 GeV, reconstructed in the decay modes h±π0s (a,b,c) and h±hh± (d,e,f), compared to the sum of Z/γττ signal plus background expectation. The mτh shape templates for the Z/γττ signal are shown for τES variations of 6 (a,d), 0% (b,e) and +6 (c,f). For clarity, the symbols pTτ and mτ are used instead of pTτh and mτh in these plots.

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Figure 19-a:
Energy scale corrections for τh measured in Z/γττ events, using the distribution in (a) visible mass of muon and τh and (b) of the τh candidate mass, for τh reconstructed in different decay modes and in different ranges of τh candidate pT.

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Figure 19-b:
Energy scale corrections for τh measured in Z/γττ events, using the distribution in (a) visible mass of muon and τh and (b) of the τh candidate mass, for τh reconstructed in different decay modes and in different ranges of τh candidate pT.

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Figure 20-a:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet pT. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 20-b:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet pT. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 20-c:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet pT. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 20-d:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet pT. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 21-a:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet η. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 21-b:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet η. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 21-c:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet η. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 21-d:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of jet η. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 22-a:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of Nvtx. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 22-b:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of Nvtx. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 22-c:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of Nvtx. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 22-d:
Probabilities for quark and gluon jets in W+jets (a,b) and multijet (c,d) events to pass the cutoff-based (a,c) and MVA-based (b,d) τh isolation discriminant, as a function of Nvtx. The misidentification rates measured in the data are compared to the MC expectation.

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Figure 23-a:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 23-b:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 23-c:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 23-d:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 23-e:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 23-f:
Distribution in the visible mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the electron discriminant in the barrel (a,b) and endcap (d,e) regions. The distributions observed in Z/γee candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe electron are misidentified are denoted by ``DY others''. The t¯t, single top quark, and diboson backgrounds yield a negligible contribution to the selected event sample and, while present in the fit, are omitted from the legend. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 24:
Probability for electrons in Z/γee events to pass different WP of the discriminant against electrons. The eτh misidentification rates measured in data are compared to the MC expectation, separately for electrons in the barrel (|η|< 1.46) and in the endcap (|η|> 1.56) regions of the electromagnetic calorimeter.

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Figure 25-a:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 25-b:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 25-c:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 25-d:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 25-e:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 25-f:
Distribution in the mass of the tag and probe pair in the pass (a,d) and fail (b,e) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|< 1.2 (a,b) and 1.2 |η| 1.7 (d,e). The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 26-a:
Distribution in the mass of the tag and probe pair in the pass (a) and fail (b) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|> 1.7. The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 26-b:
Distribution in the mass of the tag and probe pair in the pass (a) and fail (b) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|> 1.7. The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 26-c:
Distribution in the mass of the tag and probe pair in the pass (a) and fail (b) regions, for the loose WP of the cutoff-based muon discriminant in the region |η|> 1.7. The distributions in Z/γμμ candidate events selected in data are compared to the MC expectation, shown for the values of nuisance parameters obtained from the likelihood fit to the data, as described in Section 7.3. The Z/γ (=e, μ, τ) events in which either the tag or the probe muon are misidentified are denoted by ``DY others''. The ``Uncertainty'' band represents the statistical and systematic uncertainties added in quadrature.

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Figure 27-a:
Probability for muons in Z/γμμ events to pass different WP of the (a) cut-based and (b) MVA-based discriminants against muons. The μτh misidentification rates measured in data are compared to the MC simulation in the regions |η|<1.2, 1.2 |η| 1.7, and |η|> 1.7.

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Figure 27-b:
Probability for muons in Z/γμμ events to pass different WP of the (a) cut-based and (b) MVA-based discriminants against muons. The μτh misidentification rates measured in data are compared to the MC simulation in the regions |η|<1.2, 1.2 |η| 1.7, and |η|> 1.7.
Tables

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Table 1:
Approximate branching fractions (B) of different τ decay modes [18]. The generic symbol h represents a charged hadron (either a pion or a kaon). Charge conjugation invariance is assumed in this paper.

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Table 2:
Expected efficiencies and misidentification rates of various τh identification discriminants, averaged over pT and η, for pileup conditions characteristic of the LHC Run 1 data-taking period. The DM-finding criterion refers to the requirement that the τh candidate be reconstructed in one of the decay modes h±, h±π0, h±π0π0, or h±hh± (cf. Section 5.1).

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Table 3:
Data-to-MC ratios of the efficiency for τh decays to pass different identification discriminants, measured in Z/γττμτh events. The results obtained using the observables mvis and Ntracks are quoted in separate columns.

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Table 4:
Data-to-MC ratios of the efficiency for τh decays in t¯tb¯bμτh events to pass different τh identification discriminants.

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Table 5:
Energy scale corrections for τh measured in Z/γττ events, using the distribution in mvis and mτh, for τh reconstructed in different decay modes and τh pT bins. The τES corrections measured for the combination of all τh decay modes and pT bins are also given in the table. It is obtained by means of an independent fit and hence may be different from the average of τES corrections measured for individual decay modes.

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Table 6:
Probability for electrons to pass different WP of the discriminant against electrons. The eτh misidentification rates measured in Z/γee events are compared to the MC expectation, separately for electrons in the ECAL barrel and endcap regions.

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Table 7:
Probability for muons to pass different WP of the cutoff-based and MVA-based discriminants against muons. The μτh misidentification rates measured in Z/γμμ events are compared to the MC predictions in the regions |η|< 1.2, 1.2 |η| 1.7, and |η|> 1.7.
Summary
The algorithms used by the CMS experiment for reconstruction and identification of hadronic τ decays in Run 1 data from the LHC have been presented, and their performance validated with proton-proton collision data recorded at s= 8 TeV, corresponding to an integrated luminosity of 19.7 fb1.
The algorithms achieve a τh identification efficiency of typically 50-60%, and misidentification rates for quark and gluon jets, electrons, and muons that vary between the per mille and per cent level.
The reconstruction of different τh decay modes and their energies is demonstrated to be robust against pileup. The τh identification efficiency measured in the data agrees with the MC expectation within the uncertainty of the measurement of about 4.5%. The measured jetτh misidentification rates are about 20% higher than predicted for low-pT jets and 20% lower for high-pT jets. The probabilities for electrons and muons to pass the τh identification criteria, including dedicated discriminants that were developed to reduce the eτh and μτh misidentification rates, have been measured with a precision that ranges from a few % and 25%, for loose and tight working points, respectively. The measured misidentification rate for electrons exceeds the MC expectation by up to a factor 1.7.
The differences observed between data and MC simulation in the probabilities for jets, electrons, and muons to be misidentified as τh decays have been taken into account in physics analyses by applying appropriate MC-to-data correction factors.
The procedures developed for studying τh decays have provided a powerful tool for precision measurements as well as for the search for new phenomena beyond the standard model in Run 2 of the LHC.
Compact Muon Solenoid
LHC, CERN