CMS-PAS-HIG-18-007 | ||
Search for the standard model Higgs boson decaying to a pair of $\tau$ leptons and produced in association with a W or a Z boson in proton-proton collisions at $\sqrt{s}=$ 13 TeV | ||
CMS Collaboration | ||
June 2018 | ||
Abstract: A search for the standard model Higgs boson produced in association with a W or a Z boson decaying leptonically is performed using a data sample of proton-proton collisions collected at $\sqrt{s} = $ 13 TeV by the CMS experiment at the LHC corresponding to an integrated luminosity of 35.9 fb$^{-1}$. The Higgs boson is sought in its decay to a pair of $\tau$ leptons. A significance of 2.3 standard deviations is observed (1.0 expected) for a Higgs boson mass of 125 GeV. The signal strength, $\mu = $ 2.5$^{+1.4} _{-1.3}$, is measured relative to the expectation for the standard model Higgs boson. These results are combined with a previous analysis performed on the same data set targeting the gluon fusion and vector boson fusion production modes with the Higgs boson decaying to a pair of $\tau$ leptons. The combined results provide increased sensitivity to the Higgs boson couplings to fermions and vector bosons, which are measured to be compatible with standard model predictions within one standard deviation. | ||
Links:
CDS record (PDF) ;
inSPIRE record ;
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These preliminary results are superseded in this paper, JHEP 06 (2019) 093. The superseded preliminary plots can be found here. |
Figures | |
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Figure 1:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for (top left) $\ell \ell {\mathrm {e}} {{\tau} _\mathrm {h}} $, (top right) $\ell \ell {{\mu}} {{\tau} _\mathrm {h}} $, (bottom left) $\ell \ell {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $, and (bottom right) $\ell \ell {\mathrm {e}} {{\mu}}$. The uncertainties include statistical and systematic sources. The left half of each distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half of each distribution is the High-$L_{T}^{\textrm {Higgs}}$ region. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distributions the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 1-a:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for (top left) $\ell \ell {\mathrm {e}} {{\tau} _\mathrm {h}} $, (top right) $\ell \ell {{\mu}} {{\tau} _\mathrm {h}} $, (bottom left) $\ell \ell {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $, and (bottom right) $\ell \ell {\mathrm {e}} {{\mu}}$. The uncertainties include statistical and systematic sources. The left half of each distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half of each distribution is the High-$L_{T}^{\textrm {Higgs}}$ region. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distributions the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 1-b:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for (top left) $\ell \ell {\mathrm {e}} {{\tau} _\mathrm {h}} $, (top right) $\ell \ell {{\mu}} {{\tau} _\mathrm {h}} $, (bottom left) $\ell \ell {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $, and (bottom right) $\ell \ell {\mathrm {e}} {{\mu}}$. The uncertainties include statistical and systematic sources. The left half of each distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half of each distribution is the High-$L_{T}^{\textrm {Higgs}}$ region. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distributions the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 1-c:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for (top left) $\ell \ell {\mathrm {e}} {{\tau} _\mathrm {h}} $, (top right) $\ell \ell {{\mu}} {{\tau} _\mathrm {h}} $, (bottom left) $\ell \ell {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $, and (bottom right) $\ell \ell {\mathrm {e}} {{\mu}}$. The uncertainties include statistical and systematic sources. The left half of each distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half of each distribution is the High-$L_{T}^{\textrm {Higgs}}$ region. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distributions the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 1-d:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for (top left) $\ell \ell {\mathrm {e}} {{\tau} _\mathrm {h}} $, (top right) $\ell \ell {{\mu}} {{\tau} _\mathrm {h}} $, (bottom left) $\ell \ell {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $, and (bottom right) $\ell \ell {\mathrm {e}} {{\mu}}$. The uncertainties include statistical and systematic sources. The left half of each distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half of each distribution is the High-$L_{T}^{\textrm {Higgs}}$ region. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distributions the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 2:
The postfit $ {m_{{\tau} {\tau}}} $ distributions used to extract the signal shown for all 8 $ {\mathrm {Z}} {\mathrm {H}} $ channels combined. The uncertainties include statistical and systematic sources. The left half of the distribution is the Low-$L_{T}^{\textrm {Higgs}}$ region while the right half corresponds to the High-$L_{T}^{\textrm {Higgs}}$ region. The definitions of the $L_{T}^{\textrm {Higgs}}$ regions in this distribution are the same as those used in Fig. 1 and are final state dependent. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In this distribution the $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes more than 99% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 3:
Postfit mass distributions in the $ {\mathrm {e}} {{\mu}} {{\tau} _\mathrm {h}} $ (top left), $ {{\mu}} {{\mu}} {{\tau} _\mathrm {h}} $ (top right), $ {\mathrm {e}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom left), and $ {{\mu}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom right) final states. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ processes contributes between 91-93% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 3-a:
Postfit mass distributions in the $ {\mathrm {e}} {{\mu}} {{\tau} _\mathrm {h}} $ (top left), $ {{\mu}} {{\mu}} {{\tau} _\mathrm {h}} $ (top right), $ {\mathrm {e}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom left), and $ {{\mu}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom right) final states. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ processes contributes between 91-93% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 3-b:
Postfit mass distributions in the $ {\mathrm {e}} {{\mu}} {{\tau} _\mathrm {h}} $ (top left), $ {{\mu}} {{\mu}} {{\tau} _\mathrm {h}} $ (top right), $ {\mathrm {e}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom left), and $ {{\mu}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom right) final states. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ processes contributes between 91-93% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 3-c:
Postfit mass distributions in the $ {\mathrm {e}} {{\mu}} {{\tau} _\mathrm {h}} $ (top left), $ {{\mu}} {{\mu}} {{\tau} _\mathrm {h}} $ (top right), $ {\mathrm {e}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom left), and $ {{\mu}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom right) final states. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ processes contributes between 91-93% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
png pdf |
Figure 3-d:
Postfit mass distributions in the $ {\mathrm {e}} {{\mu}} {{\tau} _\mathrm {h}} $ (top left), $ {{\mu}} {{\mu}} {{\tau} _\mathrm {h}} $ (top right), $ {\mathrm {e}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom left), and $ {{\mu}} {{\tau} _\mathrm {h}} {{\tau} _\mathrm {h}} $ (bottom right) final states. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In these distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ processes contributes between 91-93% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 4:
Postfit mass distributions of the four $ {\mathrm {W}} {\mathrm {H}} $ final states combined together. The uncertainties include statistical and systematic sources. The $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ signal processes are summed together and shown as $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ with a best-fit $\mu = 2.5$. $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ is shown both as a stacked filled histogram and an open overlaid histogram. In this distribution the $ {\mathrm {W}} {\mathrm {H}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $ process contributes 92% of the total of $ {\text {VH}} $, $ {{\mathrm {H}} \to {\tau} {\tau}} $. |
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Figure 5:
Distribution of the decimal logarithm of the ratio between the expected signal and the sum of expected signal, corresponding to the best fit value $\mu =2.5$, and expected background in each bin of the mass distributions used to extract the results, in all final states combined. The background contributions are separated based on the production process, $ {\mathrm {W}} {\mathrm {H}} $ or $ {\mathrm {Z}} {\mathrm {H}} $. The inset shows the corresponding difference between the observed data and expected background distributions divided by the background expectation, as well as the signal expectation divided by the background expectation. |
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Figure 6:
Best-fit signal strength per Higgs boson production process, for $ {m_{{\mathrm {H}}}} = 125.09$ GeV, using a combination of the $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $ targeted analysis detailed in this paper with the CMS analysis performed in the same data set for the same decay mode but targeting the gluon fusion and vector boson fusion productions [18,19]. The constraints from the combined global fit are used to extract each of the individual best fit signal strengths. The combined best fit signal strength is $\mu = 1.24 ^{+0.29} _{-0.27}$. |
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Figure 7:
Scan of the negative log-likelihood difference as a function of $\kappa _V$ and $\kappa _f$, for $ {m_{{\mathrm {H}}}} = 125.09$ GeV. All nuisance parameters are profiled for each point. This scan is a combination of the $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $ targeted analysis detailed in this paper with the CMS analysis performed in the same data set for the same decay mode but targeting the gluon fusion and vector boson fusion productions [18,19]. The results for the gluon fusion and vector boson fusion analysis are shown as the overlaid dashed lines. For this scan, the included $ {{\mathrm {H}} \to {\mathrm {W}} {\mathrm {W}}} $ and $ {{\mathrm {H}} \to {\mathrm {Z}} {\mathrm {Z}}} $ processes are treated as signal. |
Tables | |
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Table 1:
Kinematic selection requirements for $ {\mathrm {W}} {\mathrm {H}} $ and $ {\mathrm {Z}} {\mathrm {H}} $ events. The trigger requirement is defined by a combination of trigger candidates with ${p_{\mathrm {T}}}$ over a given threshold (in GeV), indicated inside parentheses. The pseudorapidity thresholds come from trigger and object reconstruction constraints. |
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Table 2:
Sources of systematic uncertainty. |
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Table 3:
Background and signal expectations for the $ {\mathrm {W}} {\mathrm {H}} $ channels, together with the number of observed events, for the post-fit signal region distributions. The signal yields are the number of expected signal events for a Higgs boson with a mass $ {m_{{\mathrm {H}}}} = $ 125.09 GeV. The background uncertainty accounts for all sources of background uncertainty, systematic as well as statistical, after the global fit. The contribution from "Rare'' includes events from triboson, $ {{\mathrm {t}\overline {\mathrm {t}}}} + {\mathrm {W}}$/$ {\mathrm {Z}} $, $ {{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}} $ production, and other rare processes. |
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Table 4:
Background and signal expectations for the $ {\mathrm {Z}} {\mathrm {H}} $ channels, together with the number of observed events, for the post-fit signal region distributions. The $ {\mathrm {Z}} {\mathrm {H}} $ final states are each grouped according to the Higgs boson decay products. $\ell \ell $ covers both $ {\mathrm {Z}} \to {{\mu}} {{\mu}}$ and $ {\mathrm {Z}} \to {\mathrm {e}} {\mathrm {e}}$ events. The signal yields are the number of expected signal events for a Higgs boson with a mass $ {m_{{\mathrm {H}}}} = $ 125.09 GeV. The background uncertainty accounts for all sources of background uncertainty, systematic as well as statistical, after the global fit. The contribution from "Rare'' includes events from triboson, $ {{\mathrm {t}\overline {\mathrm {t}}}} + {\mathrm {W}}$/$ {\mathrm {Z}} $, $ {{\mathrm {t}\overline {\mathrm {t}}}} {\mathrm {H}} $ production, and other rare processes. |
Summary |
A search for the standard model Higgs boson in $\mathrm{W}\mathrm{H}$ and $\mathrm{Z}\mathrm{H}$ associated production processes is presented based on data collected in proton-proton collisions by the CMS detector in 2016 at a center-of-mass energy of 13 TeV. Event categories are split into three-lepton final states targeting $\mathrm{W}\mathrm{H}$ production, and four-lepton final states targeting $\mathrm{Z}\mathrm{H}$ production. The best-fit signal strength is $\mu = $ 2.54$ ^{+1.35} _{-1.26}$ ($\mu = $ 1.00$ ^{+1.08} _{-0.97}$ expected) for a significance of 2.3 standard deviations (1.0 expected). Combining this analysis with the analysis targeting Higgs boson decays to $\tau$ leptons in gluon fusion and vector boson fusion productions performed at a center-of-mass energy of 13 TeV with the CMS experiment, the tightest constraints on the ${\mathrm{H}\to\tau\tau} $ decay are set. The best-fit signal strength is $\mu = $ 1.24$ ^{+0.29} _{-0.27}$, and the observed significance is 5.5 standard deviations (4.8 expected). The combination further constrains the coupling of the Higgs boson to vector bosons resulting in measured couplings which are consistent with SM predictions within one standard deviation. |
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