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CMS-PAS-SMP-20-016
Measurement of the electroweak production of Z$\gamma$ and two jets in proton-proton collisions at $\sqrt{s} = $ 13 TeV and constraints on dimension 8 operators
Abstract: A measurement of the electroweak (EW) production of a Z boson, a photon, and two jets (Z$\gamma$jj) in proton-proton collisions and constraints on anomalous quartic gauge couplings are presented. Proton-proton collision data corresponding to an integrated luminosity of 137 fb$^{-1}$, collected with the CMS detector at the LHC, at a center of mass collision energy of $\sqrt{s}=$ 13 TeV are used. The signal is extracted by requiring a large dijet invariant mass ($m_{jj}$) and a large pseudorapidity separation between the two jets ($|\Delta\eta_{jj}|$). The fiducial cross section measured for the EW production is $\sigma_{\text{EW}} = $ 5.21 $\pm$ 0.76 fb = 5.21 $\pm$ 0.52 (stat) $\pm$ 0.56 (syst) fb. The observed and expected signal significance is higher than 5 standard deviations. Differential cross sections as functions of the photon, leptons and jets leading transverse momenta distributions and the $m_{jj}$-$|\Delta\eta_{jj}|$ two-dimensional distribution are measured. Exclusion limits on the dimension-eight operators $M_{0-7}$ and $T_{0-2,5-9}$ in the effective field theory framework at 95% confidence level are reported.
Figures & Tables Summary References CMS Publications
Figures

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Figure 1:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-a:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-b:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-c:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-d:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-e:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 1-f:
Representative Feynman diagrams for Z$\gamma $jj production. The diagrams (except lower right) involve only EW vertices: (upper left) bremsstrahlung, (upper center) multiperipheral, (upper right) VBF with TGCs, (lower left) VBS via W boson, (lower center) VBS with QGC, while the lower right diagram represents a QCD-induced contribution.

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Figure 2:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {barrel}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 2-a:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {barrel}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 2-b:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {barrel}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 3:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {endcap}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 3-a:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {endcap}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 3-b:
The pre-fit $m_{jj}$ distributions for the dilepton + $\gamma _{\text {endcap}}$ events are shown on the left for the dielectron and on the right for the dimuon categories with three years combined data-taking. The data are compared to the sum of the signal and the background contribution. The black points with error bars represent the data and their uncertainties, while the hatched bands represent the statistical uncertainty on the combined signal and background expectations. The last bin includes overflow events. The bottom pad shows the ratio of the data to the expectation. The last bin includes overflow events.

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Figure 4:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ >$ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 4-a:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ >$ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 4-b:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ >$ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 5:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ > $ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 5-a:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ > $ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 5-b:
The post-fit 2D distributions of the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$ in bins of $|\Delta \eta _{\mathrm {jj}}|$. The horizontal axis is split into bins of $|\Delta \eta _{\mathrm {jj}}|$ of [2.5, 4.5], (4.5, 6.0], and $ > $ 6.0. The data are compared to the signal and background in the predictions. The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 6:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 6-a:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 6-b:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {barrel}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 7:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 7-a:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 7-b:
The post-fit distributions in the control region for the dielectron (left) and dimuon (right) + $\gamma _{\text {endcap}}$ categories as a function of $m_\mathrm {jj}$. The horizontal axis is split into bins of $m_{jj}$ of [150, 300), [300, 400), and [400,500). The black points with error bars represent the data and statistical uncertainties of data, the hatched bands represent the full uncertainties of the predictions.

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Figure 8:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW Z$\gamma $jj.

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Figure 8-a:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW Z$\gamma $jj.

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Figure 8-b:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW Z$\gamma $jj.

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Figure 8-c:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW Z$\gamma $jj.

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Figure 8-d:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW Z$\gamma $jj.

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Figure 9:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW+QCD Z$\gamma $jj.

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Figure 9-a:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW+QCD Z$\gamma $jj.

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Figure 9-b:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW+QCD Z$\gamma $jj.

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Figure 9-c:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW+QCD Z$\gamma $jj.

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Figure 9-d:
Unfolded differential cross section as a function of the leading lepton $p_{\mathrm{T}}$, leading photon $p_{\mathrm{T}}$, leading jet $p_{\mathrm{T}}$ and $m_{jj}$-$|\Delta \eta _{jj}|$ for EW+QCD Z$\gamma $jj.

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Figure 10:
The $m_{\mathrm{Z} \gamma}$ distribution for events satisfying the aQGC region selection, which is used to set constraints on the anomalous coupling parameters. The bins of $m_{\mathrm{Z} \gamma}$ are [100, 400, 600, 800, 1000, 1200, 2000) GeV, where the last bin includes overflow. The red line represents a nonzero $F_{\mathrm {T,8}}$ value and the blue line represents a nonzero $F_{\mathrm {T,9}}$ value, which would significantly enhance the yields at high $m_{\mathrm{Z} \gamma}$. The hatched bands represent the statistical uncertainties in the predictions.
Tables

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Table 1:
Summary of the five sets of event-selection criteria used to define events in the control region selection, EW signal extraction, fiducial cross section measurement region, and region used to search for aQGC contributions.

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Table 2:
The impact of the systematic uncertainties on the EW signal strength measurement.

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Table 3:
Post-fit signal and background yields and observed event counts in data after the selection in the search for EW signal. The $\gamma _{\text {barrel}}$ and $\gamma _{\text {endcap}}$ represent events with photons in the ECAL barrel and endcaps, respectively.

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Table 4:
The signal strengths and differential cross section from expectation and fit calculated as part of the unfolding of $p_{\mathrm{T}}^{\gamma}$, $p_{\mathrm{T}}^{j_1}$, $p_{\mathrm{T}}^{\ell _1}$ observables for EW Z$\gamma $jj.

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Table 5:
The signal strengths and differential cross section from expectation and fit calculated as part of the unfolding of 2D $m_{jj}$-$|\Delta \eta _{jj}|$ observables for EW Z$\gamma $jj.

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Table 6:
The signal strengths and differential cross section from expectation and fit calculated as part of the unfolding of $p_{\mathrm{T}}^{\gamma}$, $p_{\mathrm{T}}^{j_1}$, $p_{\mathrm{T}}^{\ell _1}$ observables for EW+QCD Z$\gamma $jj.

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Table 7:
The signal strengths and differential cross section from expectation and fit calculated as part of the unfolding of 2D $m_{jj}$-$|\Delta \eta _{jj}|$ observables for EW+QCD Z$\gamma $jj.

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Table 8:
The 95% CL expected and observed exclusion limits for $F_{\mathrm {M}_{0-7}}$ and $F_{\mathrm {T}_{0-2,5-9}}$ parameters. The observed limits without considering the systematic uncertainties are also reported. The last column presents the scattering energy values for which the amplitude would violate unitarity for the observed value of the aQGC parameter.
Summary
This note presents a measurement of the electroweak (EW) production of a Z boson, a photon, and two jets (Z$\gamma$jj) in $\sqrt{s}=$13 TeV data corresponding to 137$^{-1}$ fb of proton-proton collisions recorded by the CMS detector. Events were selected by requiring two opposite sign leptons with the same flavor from Z boson decaying, one identified photon, and two jets that have a large separation in pseudorapidity and a large dijet mass. The cross section for EW Z$\gamma$jj production is 5.21 $\pm$ 0.52 (stat) $\pm$ 0.56 (syst) fb $=$ 5.21 $\pm$ 0.76 fb, and the fiducial cross section of EW and QCD-induced production is 14.7 $\pm$ 0.80 (stat) $\pm$ 1.26 (syst) fb $=$ 14.7 $\pm$ 1.53 fb. The observed and expected signal significance is higher than 5 SD. Differential cross sections are measured for several observables and compared to standard model predictions computed at leading order. Within the uncertainties, the measurements agree with the predictions. Constraints set on the dimension-eight operators $M_{0-7}$, $T_{0-2,5-9}$ in effective field theory are either competitive with or more stringent than those previously obtained.
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Compact Muon Solenoid
LHC, CERN