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CMS-PAS-EXO-24-006
Search for heavy resonances decaying into four leptons with high Lorentz boosts in proton-proton collisions at $ \sqrt{s} = $ 13 TeV
Abstract: A search for a high-mass resonance decaying into four-lepton final states via two intermediate bosons is presented. The search uses proton-proton collision data at a center-of-mass energy of 13 TeV collected by the CMS detector at LHC, corresponding to an integrated luminosity of 138 fb$ ^{-1} $. Signal hypotheses with a light intermediate boson may result in highly collimated decay products. Boosted electron pairs reconstructed into a single merged object are distinguished using a novel electron identification technique. A collimated muon pair may fail to reconstruct one of the tracks. In this case, the missing muon momentum is obtained from the missing transverse energy. No significant excess is observed. Model-independent upper limits on the product of cross section and branching ratio to four-leptons are set with $ \mathrm{X}\rightarrow\mathrm{YY}\rightarrow\!4\ell $ and $ \mathrm{X}\rightarrow\mathrm{Z}\mathrm{Y}\rightarrow\!4\ell $ channels for $ M_{\mathrm{X}} $ from 250 GeV to 2 TeV and $ M_{\mathrm{Y}} $ greater than 0.4 GeV at 95% confidence level.
Figures & Tables Summary References CMS Publications
Figures

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Figure 1:
Visual representations of the variable $ \alpha_{track} $, $ \Delta u_{in}^{5\times5} $ and $ \Delta v_{in}^{5\times5} $. Cyan-colored lines depict the incoming tracks of an electron pair. The Red dashed line represents the union of two 5$ \times $5 clusters around the closest crystal from the tracks. The cyan-colored star is the log-weighted CoG of the $ \textrm{U}_{5\times5} $ clusters.

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Figure 2:
The signal dielectron ID efficiency as a function of $ \Delta R $ for the cases with (left) two reconstructed electrons and (right) a $ \mathrm{e}_{\textrm{ME}} $. The ID efficiencies incorporate the effects of all prerequisite selections. For instance, the HEEP ID efficiency includes the reconstruction efficiency, and the $ \mathrm{e}_{\textrm{ME}} $ ID efficiency with two tracks includes track selection efficiency.

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Figure 2-a:
The signal dielectron ID efficiency as a function of $ \Delta R $ for the cases with (left) two reconstructed electrons and (right) a $ \mathrm{e}_{\textrm{ME}} $. The ID efficiencies incorporate the effects of all prerequisite selections. For instance, the HEEP ID efficiency includes the reconstruction efficiency, and the $ \mathrm{e}_{\textrm{ME}} $ ID efficiency with two tracks includes track selection efficiency.

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Figure 2-b:
The signal dielectron ID efficiency as a function of $ \Delta R $ for the cases with (left) two reconstructed electrons and (right) a $ \mathrm{e}_{\textrm{ME}} $. The ID efficiencies incorporate the effects of all prerequisite selections. For instance, the HEEP ID efficiency includes the reconstruction efficiency, and the $ \mathrm{e}_{\textrm{ME}} $ ID efficiency with two tracks includes track selection efficiency.

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Figure 3:
The invariant mass distribution obtained from (left) two tracks of boosted $ \mathrm{J}/\psi\rightarrow\mathrm{e}\mathrm{e} $ with $ E_{T}^{5\times5} > $ 30 GeV, and (right) dimuon and an FSR photon with $ E_{T}^{5\times5} > $ 20 GeV converted into an electron pair with only a single reconstructed track. The passing (failing) region represents $ \mathrm{e}_{\textrm{ME}} $ candidates that pass (fail) the $ \mathrm{e}_{\textrm{ME}} $ ID criteria. The signal (background) contribution is modeled with a Gaussian (exponential) function, illustrated with a red (blue) line.

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Figure 3-a:
The invariant mass distribution obtained from (left) two tracks of boosted $ \mathrm{J}/\psi\rightarrow\mathrm{e}\mathrm{e} $ with $ E_{T}^{5\times5} > $ 30 GeV, and (right) dimuon and an FSR photon with $ E_{T}^{5\times5} > $ 20 GeV converted into an electron pair with only a single reconstructed track. The passing (failing) region represents $ \mathrm{e}_{\textrm{ME}} $ candidates that pass (fail) the $ \mathrm{e}_{\textrm{ME}} $ ID criteria. The signal (background) contribution is modeled with a Gaussian (exponential) function, illustrated with a red (blue) line.

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Figure 3-b:
The invariant mass distribution obtained from (left) two tracks of boosted $ \mathrm{J}/\psi\rightarrow\mathrm{e}\mathrm{e} $ with $ E_{T}^{5\times5} > $ 30 GeV, and (right) dimuon and an FSR photon with $ E_{T}^{5\times5} > $ 20 GeV converted into an electron pair with only a single reconstructed track. The passing (failing) region represents $ \mathrm{e}_{\textrm{ME}} $ candidates that pass (fail) the $ \mathrm{e}_{\textrm{ME}} $ ID criteria. The signal (background) contribution is modeled with a Gaussian (exponential) function, illustrated with a red (blue) line.

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Figure 4:
The invariant mass distribution between the $ \textrm{U}_{5\times5} $ cluster and the kaon candidate with $ E_{T}^{5\times5} > $ 30 GeV. The signal (background) contribution is modeled with a Crystal Ball (exponential) function, represented with a red (blue) line. The subfigure on top right illustrates the distribution of simulated $ {\mathrm{B}}\rightarrow\mathrm{J}/\psi\mathrm{K}\rightarrow\mathrm{e}\mathrm{e}\mathrm{K} $ events.

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Figure 5:
The observed and expected number of events in the resolved signal region before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 6:
The observed and expected number of events in the (left) $ \mathrm{e}_{\textrm{ME}}\ell\ell $ and (right) $ \ell\ell\mup_{\mathrm{T}}^\text{miss} $ channels ($ \ell = \mathrm{e},\mu $) before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 6-a:
The observed and expected number of events in the (left) $ \mathrm{e}_{\textrm{ME}}\ell\ell $ and (right) $ \ell\ell\mup_{\mathrm{T}}^\text{miss} $ channels ($ \ell = \mathrm{e},\mu $) before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 6-b:
The observed and expected number of events in the (left) $ \mathrm{e}_{\textrm{ME}}\ell\ell $ and (right) $ \ell\ell\mup_{\mathrm{T}}^\text{miss} $ channels ($ \ell = \mathrm{e},\mu $) before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 7:
The observed and expected number of events in the (left) 2 $ \mathrm{e}_{\textrm{ME}} $ and (right) $ \mathrm{e}_{\textrm{ME}}\mup_{\mathrm{T}}^\text{miss} $ signal regions before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 7-a:
The observed and expected number of events in the (left) 2 $ \mathrm{e}_{\textrm{ME}} $ and (right) $ \mathrm{e}_{\textrm{ME}}\mup_{\mathrm{T}}^\text{miss} $ signal regions before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 7-b:
The observed and expected number of events in the (left) 2 $ \mathrm{e}_{\textrm{ME}} $ and (right) $ \mathrm{e}_{\textrm{ME}}\mup_{\mathrm{T}}^\text{miss} $ signal regions before the likelihood fit. The shaded band represents background systematic uncertainties. The red histogram shows simulated $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ signal events, normalized to the cross section times branching ratio of 10 fb.

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Figure 8:
The observed and expected limit on the cross section times branching ratio as a function of $ M_{\textrm{X}} $ with the $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ decay mode. The $ M_{\textrm{Y}} $ ranges from 0.4 GeV to 100 GeV. The branching ratio of $ \textrm{B}(\textrm{Y}\rightarrow\mathrm{e}\mathrm{e}) $ is assumed to be equal to the $ \textrm{B}(\textrm{Y}\rightarrow\mu\mu) $.

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Figure 9:
The observed and expected limit on the cross section times branching ratio as a function of $ M_{\textrm{X}} $ with the $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ decay mode. The $ M_{\textrm{Y}} $ ranges from 0.4 GeV to 100 GeV. The branching ratio of $ \textrm{B}(\textrm{Y}\rightarrow\mathrm{e}\mathrm{e}) $ is assumed to be equal to the $ \textrm{B}(\textrm{Y}\rightarrow\mu\mu) $.

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Figure 10:
The 2-dimensional observed upper limit on the cross section times branching ratio with 95% CL as a function of $ M_{\textrm{X}} $ and $ M_{\textrm{Y}} $ for the (left) $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ and (right) $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal hypotheses.

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Figure 10-a:
The 2-dimensional observed upper limit on the cross section times branching ratio with 95% CL as a function of $ M_{\textrm{X}} $ and $ M_{\textrm{Y}} $ for the (left) $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ and (right) $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal hypotheses.

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Figure 10-b:
The 2-dimensional observed upper limit on the cross section times branching ratio with 95% CL as a function of $ M_{\textrm{X}} $ and $ M_{\textrm{Y}} $ for the (left) $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ and (right) $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal hypotheses.
Tables

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Table 1:
The list of signal regions, where each signal region consists of the reconstructed objects listed in the table. The e and $ \mu $ represent reconstructed resolved lepton objects.
Summary
A model-independent search for a high-mass resonance decaying into four-lepton final states via two intermediate bosons has been presented for $ \textrm{X}\rightarrow\textrm{YY}\rightarrow\!4\ell $ and $ \textrm{X}\rightarrow\mathrm{Z}\textrm{Y}\rightarrow\!4\ell $ signal hypotheses. The search uses pp collision data at a center-of-mass energy of 13 TeV collected by the CMS detector at LHC, corresponding to an integrated luminosity of 138 fb$ ^{-1} $. A combination of heavy $ M_{\textrm{X}} $ and light $ M_{\textrm{Y}} $ can lead to a significant Lorentz boost, which can result in boosted signatures such as $ \mathrm{e}_{\textrm{ME}} $ and $ \mu_{\textrm{CM}} $. A dedicated $ \mathrm{e}_{\textrm{ME}} $ ID is developed using the compatibility between the tracks and $ \textrm{U}_{5\times5} $ cluster. Signal event candidates with a $ \mu_{\textrm{CM}} $ are analyzed using $ {\vec p}_{\mathrm{T}}^{\kern1pt\text{miss}} $ as a proxy. No significant excess is observed. The maximum global (local) observed significance is 1.85$ \sigma $ (2.37$ \sigma $) at $ M_{\textrm{X}} = $ 550 GeV and $ M_{\textrm{Y}} = $ 0.8 GeV. The 95% CL upper limits on the product of cross section and branching ratio to four-lepton final states are set in the range $ M_{\textrm{X}} > $ 250 GeV and $ M_{\textrm{Y}} > $ 0.4 GeV.
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Compact Muon Solenoid
LHC, CERN