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| CMS-TOP-19-001 ; CERN-EP-2020-211 | ||
| Search for new physics in top quark production with additional leptons in proton-proton collisions at $\sqrt{s} = $ 13 TeV using effective field theory | ||
| CMS Collaboration | ||
| 7 December 2020 | ||
| JHEP 03 (2021) 095 | ||
| Abstract: Events containing one or more top quarks produced with additional prompt leptons are used to search for new physics within the framework of an effective field theory (EFT). The data correspond to an integrated luminosity of ${\mathcal{L}}$ of proton-proton collisions at a center-of-mass energy of 13 TeV at the LHC, collected by the CMS experiment in 2017. The selected events are required to have either two leptons with the same charge or more than two leptons; jets, including identified bottom quark jets, are also required, and the selected events are divided into categories based on the multiplicities of these objects. Sixteen dimension-six operators that can affect processes involving top quarks produced with additional charged leptons are considered in this analysis. Constructed to target EFT effects directly, the analysis applies a novel approach in which the observed yields are parameterized in terms of the Wilson coefficients (WCs) of the EFT operators. A simultaneous fit of the 16 WCs to the data is performed and two standard deviation confidence intervals for the WCs are extracted; the standard model expectations for the WC values are within these intervals for all of the WCs probed. | ||
| Links: e-print arXiv:2012.04120 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; CADI line (restricted) ; | ||
| Figures & Tables | Summary | Additional Figures | References | CMS Publications |
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| Figures | |
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Figure 1:
Example diagrams for the five signal processes considered in this analysis: ${\mathrm{t} \mathrm{\bar{t}} \mathrm{H}}$, ${\mathrm{t} \mathrm{\bar{t}} \ell \bar{\ell}}$, ${\mathrm{t} \mathrm{\bar{t}} \ell \nu}$, ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$, and ${\mathrm{t} \mathrm{H} \mathrm{q}}$. |
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Figure 1-a:
Example diagram for the ${\mathrm{t} \mathrm{\bar{t}} \mathrm{H}}$ signal process. |
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Figure 1-b:
Example diagram for the ${\mathrm{t} \mathrm{\bar{t}} \ell \bar{\ell}}$ signal process. |
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Figure 1-c:
Example diagram for the ${\mathrm{t} \mathrm{\bar{t}} \ell \nu}$ signal process. |
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Figure 1-d:
Example diagram for the ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ signal process. |
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Figure 1-e:
Example diagram for the ${\mathrm{t} \mathrm{H} \mathrm{q}}$ signal process. |
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Figure 2:
Example diagrams showing two of the vertices associated with the $ \mathcal{O}_{\mathcal{uG}} $ operator. This operator, whose definition can be found in Table 1, gives rise to vertices involving top quarks, gluons, and the Higgs boson; as illustrated here, these interactions can contribute to the ${\mathrm{t} \mathrm{\bar{t}} \mathrm{H}}$ process. |
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Figure 3:
Expected yields prefit (left) and postfit (right). The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. The jet multiplicity bins have been combined here, however, the fit is performed using all 35 event categories outlined in Section 5.4. The lower panel is the ratio of the observation over the prediction. |
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Figure 3-a:
Legends for the following figures. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Figure 3-b:
Expected yields prefit. The jet multiplicity bins have been combined here, however, the fit is performed using all 35 event categories outlined in Section 5.4. The lower panel is the ratio of the observation over the prediction. |
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Figure 3-c:
Expected yields prefit postfit. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. The jet multiplicity bins have been combined here, however, the fit is performed using all 35 event categories outlined in Section 5.4. The lower panel is the ratio of the observation over the prediction. |
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Figure 4:
Observed WC 1$\sigma $ (thick line) and 2$\sigma $ (thin line) confidence intervals (CIs). Solid lines correspond to the other WCs profiled, while dashed lines correspond to the other WCs fixed to the SM value of zero. In order to make the figure more readable, the ${{c _{\varphi \mathrm{t}}}}$ interval is scaled by 1/2, the ${{c _{\mathrm{t} G}}}$ interval is scaled by 2, the ${{c ^{-}_{\varphi Q}}}$ interval is scaled by 1/2, and the ${{c _{\mathrm{t} \varphi}}}$ interval is scaled by 1/5. |
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Figure 5:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{-(\ell)}_{Q\ell}}}$ and ${{c ^{(\ell)}_{Q\mathrm{e}}}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. |
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Figure 5-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{-(\ell)}_{Q\ell}}}$ and ${{c ^{(\ell)}_{Q\mathrm{e}}}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. |
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Figure 5-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{-(\ell)}_{Q\ell}}}$ and ${{c ^{(\ell)}_{Q\mathrm{e}}}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. |
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Figure 6:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\varphi \mathrm{t} \mathrm{b}}}}$ and ${c ^{3(\ell)}_{Q\ell}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. |
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Figure 6-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\varphi \mathrm{t} \mathrm{b}}}}$ and ${c ^{3(\ell)}_{Q\ell}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. |
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Figure 6-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\varphi \mathrm{t} \mathrm{b}}}}$ and ${c ^{3(\ell)}_{Q\ell}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. |
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Figure 7:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{3}_{\varphi Q}}}$ and ${{c _{\mathrm{b} \mathrm{W}}}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. |
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Figure 7-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{3}_{\varphi Q}}}$ and ${{c _{\mathrm{b} \mathrm{W}}}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. |
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Figure 7-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c ^{3}_{\varphi Q}}}$ and ${{c _{\mathrm{b} \mathrm{W}}}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. |
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Figure 8:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} G}}}$ and ${{c ^{-}_{\varphi Q}}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 8-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} G}}}$ and ${{c ^{-}_{\varphi Q}}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 8-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} G}}}$ and ${{c ^{-}_{\varphi Q}}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 9:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \varphi}}}$ and ${{c _{\varphi \mathrm{t}}}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 9-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \varphi}}}$ and ${{c _{\varphi \mathrm{t}}}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 9-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \varphi}}}$ and ${{c _{\varphi \mathrm{t}}}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. The range on the right plot is modified to emphasize the 1$\sigma $ contour. |
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Figure 10:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \mathrm{Z}}}}$ and ${{c _{\mathrm{t} \mathrm{W}}}}$ with the other WCs profiled (left), and fixed to their SM values (right). Diamond markers are shown for the SM prediction. |
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Figure 10-a:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \mathrm{Z}}}}$ and ${{c _{\mathrm{t} \mathrm{W}}}}$ with the other WCs profiled. Diamond markers are shown for the SM prediction. |
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Figure 10-b:
The observed 1$\sigma $, 2$\sigma $, and 3$\sigma $ confidence contours of a 2D scan for ${{c _{\mathrm{t} \mathrm{Z}}}}$ and ${{c _{\mathrm{t} \mathrm{W}}}}$ with the other WCs fixed to their SM values. Diamond markers are shown for the SM prediction. |
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Figure 11:
Plots showing the relative change in the expected yield for the signal processes in each event category. The "$\Delta $Yield/prefit'' is the difference in expected yield before fit (prefit) and after fit (postfit), normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given WC within the corresponding 2$\sigma $ confidence interval. The values in upper right of each plot are to indicate the variation for ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ in the 4$\ell $ category. |
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Figure 11-a:
Legends for the following figures. |
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Figure 11-b:
Plots showing the relative change in the expected yield for the ${{c _{\mathrm{t} G}}}$ signal process. The "$\Delta $Yield/prefit'' is the difference in expected yield before fit (prefit) and after fit (postfit), normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given WC within the corresponding 2$\sigma $ confidence interval. The values in upper right of the plot are to indicate the variation for ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ in the 4$\ell $ category. |
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Figure 11-c:
Plots showing the relative change in the expected yield for the ${{c ^{-}_{\varphi Q}}}$ signal process. The "$\Delta $Yield/prefit'' is the difference in expected yield before fit (prefit) and after fit (postfit), normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given WC within the corresponding 2$\sigma $ confidence interval. The values in upper right of the plot are to indicate the variation for ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ in the 4$\ell $ category. |
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Figure 11-d:
Plots showing the relative change in the expected yield for the ${{c _{\mathrm{t} \mathrm{W}}}}$ signal process. The "$\Delta $Yield/prefit'' is the difference in expected yield before fit (prefit) and after fit (postfit), normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given WC within the corresponding 2$\sigma $ confidence interval. The values in upper right of the plot are to indicate the variation for ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ in the 4$\ell $ category. |
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Figure 11-e:
Plots showing the relative change in the expected yield for the ${{c _{\mathrm{t} \mathrm{Z}}}}$ signal process. The "$\Delta $Yield/prefit'' is the difference in expected yield before fit (prefit) and after fit (postfit), normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given WC within the corresponding 2$\sigma $ confidence interval. The values in upper right of the plot are to indicate the variation for ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$ in the 4$\ell $ category. |
| Tables | |
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Table 1:
List of operators that have effects on ${\mathrm{t} \mathrm{\bar{t}} \mathrm{H}}$, ${\mathrm{t} \mathrm{\bar{t}} \ell \bar{\ell}}$, ${\mathrm{t} \mathrm{\bar{t}} \ell \nu}$, ${\mathrm{t} \ell \bar{\ell} \mathrm{q}}$, and ${\mathrm{t} \mathrm{H} \mathrm{q}}$ processes at order $1/\Lambda ^2$ that are considered in this analysis. The couplings are assumed to involve only third-generation quarks. The quantity $T^A=\frac {1}{2}\lambda ^A$ denotes the eight Gell-Mann matrices, and $\tau ^I$ are the Pauli matrices. The field $\varphi $ is the Higgs boson doublet, and $\tilde{\varphi}=\varepsilon \varphi ^*$, where $\varepsilon \equiv i\tau ^2$. The $\ell $ and q represent the left-handed lepton and quark doublets, respectively, while e represents the right-handed lepton, and u and d represent the right-handed quark singlets. Furthermore, $(\varphi ^{\dagger}i\overleftrightarrow {D}_\mu \varphi) \equiv \varphi ^\dagger (iD_\mu \varphi)-(iD_\mu \varphi ^\dagger)\varphi $ and $(\varphi ^{\dagger}i\overleftrightarrow {D}^I_\mu \varphi) \equiv \varphi ^{\dagger}\tau ^I(iD_\mu \varphi)-(iD_\mu \varphi ^\dagger)\tau ^I\varphi $. The W boson field strength is $\mathrm{W} _{\mu \nu}^I=\partial _\mu \mathrm{W} _\nu ^I-\partial _\nu \mathrm{W} ^I_\mu +g\varepsilon _{IJK}\mathrm{W} ^J_\mu \mathrm{W} ^K_\nu $, and $G_{\mu \nu}^A=\partial _\mu G_\nu ^A-\partial _\nu G^A_\mu +g_sf^{ABC}G^B_\mu G^C_\nu $ is the gluon field strength. The abbreviations ${s_{\mathrm {W}}}$ and ${c_{\mathrm {W}}}$ denote the sine and cosine of the weak mixing angle (in the unitary gauge), respectively. The leading processes affected by the operators are also listed (the details of the criteria used for this determination are described in the text). |
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Table 2:
Requirements for the different event categories. Requirements separated by commas indicate a division into subcategories. The b jet requirement on individual jets varies based on the lepton category, as described in the text. |
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Table 3:
Cross section (rate) uncertainties used for the fit. Each column in the table is an independent source of uncertainty. Uncertainties in the same column for different processes (different rows) are fully correlated. |
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Table 4:
Summary for the systematic uncertainties. Here "shape" means that the systematic uncertainty causes a change in the relative expected yield of the jet and/or b jet bins. Except where noted, each row in this table will be treated as a single, independent NP. Impacts of various systematic variations on a subset of WCs are also quoted. Percentages represent the change in a WC divided by the symmetrized 2$\sigma $ confidence interval. A value of 100% indicates the particular systematic variation adds an uncertainty equal to the WC interval. The percentages for the b and c jet tags are the sum of all their respective subcategories. |
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Table 5:
The 2$\sigma $ confidence intervals on the WCs. The intervals are found by scanning over a single WC while either treating the other 15 profiled, or fixing the other 15 to the SM value of zero. |
| Summary |
|
A search for new physics has been performed in the production of at least one top quark in association with additional leptons, jets, and b jets, in the context of an effective field theory. The events were produced in proton-proton collisions corresponding to an integrated luminosity of ${\mathcal{L}}$. The expected yield in each category was parameterized in terms of 16 Wilson coefficients (WCs) associated with effective field theory operators relevant to the dominant processes in the data. A simultaneous fit was performed of the 16 WCs to the data. For each WC, an interval over which the model predictions agree with the observed yields at the 2 standard deviation level was extracted by either keeping the other WCs fixed to zero or treating the other WCs as unconstrained nuisance parameters. Two-dimensional contours were produced for some of the WCs, to illustrate correlations between various WCs. The results from fitting the WCs in the dimension-six model to the data were consistent with the standard model at the level of 2 standard deviations. |
| Additional Figures | |
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Additional Figure 1:
Observed Wilson Coefficient (WC) 1$\sigma$ (thick line) and 2$\sigma$ (thin line) confidence intervals (CIs) for the Asimov data. Solid lines correspond to the other WCs profiled, while dashed lines correspond to the other WCs fixed to the SM value of zero. In order to make the this figure more readable, the ${{c _{\varphi \mathrm{t}}}}$ interval is scaled by 1/2, the ${{c _{\mathrm{t} G}}}$ interval is scaled by 2, the ${{c ^{-}_{\varphi Q}}}$ interval is scaled by 1/2, and the ${{c _{\mathrm{t} \varphi}}}$ interval is scaled by 1/5. In some cases, intervals have two degenerate, or near degenerate, negative log-likelihood minima, but in all cases a minimum exists at zero (SM), as expected. |
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Additional Figure 2:
The 1D likelihood scans of each of the 16 Wilson coefficients (WCs) for ${{c ^{-}_{\varphi Q}}}$, ${{c _{\varphi \mathrm{t}}}}$, ${{c _{\mathrm{t} G}}}$, ${{c _{\mathrm{t} \mathrm{W}}}}$, and ${{c _{\mathrm{t} \mathrm{Z}}}}$. These fits were made by either profiling the other WCs, or by fixing the other coefficients to their SM value of 0. These two results are overlaid with lines at the 1$\sigma$ and 2$\sigma$ uncertainty value for both. |
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Additional Figure 2-a:
Legend for the following figures. These fits were made by either profiling the other WCs, or by fixing the other coefficients to their SM value of 0. These two results are overlaid with lines at the 1$\sigma$ and 2$\sigma$ uncertainty value for both. |
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Additional Figure 2-b:
The 1D likelihood scans of each of the 16 Wilson coefficients (WCs) for ${{c ^{-}_{\varphi Q}}}$. |
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Additional Figure 2-c:
The 1D likelihood scans of each of the 16 Wilson coefficients (WCs) for ${{c _{\varphi \mathrm{t}}}}$. |
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Additional Figure 2-d:
The 1D likelihood scans of each of the 16 Wilson coefficients (WCs) for ${{c _{\mathrm{t} G}}}$. |
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Additional Figure 2-e:
The 1D likelihood scans of each of the 16 Wilson coefficients (WCs) for ${{c _{\mathrm{t} \mathrm{Z}}}}$. |
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Additional Figure 3:
Plots showing the relative change in the expected yield for the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The values in upper right of each plot are to indicate the variation for $\mathrm{t\ell\overline{\ell}q}$ in the 4$\ell$ category. |
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Additional Figure 3-a:
Legends for the following figures. |
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Additional Figure 3-b:
Plots showing the relative change in the expected yield for the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{b} \mathrm{W}}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot are to indicates the variation for $\mathrm{t\ell\overline{\ell}q}$ in the 4$\ell$ category. |
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Additional Figure 3-c:
Plot showing the relative change in the expected yield for the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{t} \varphi }}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot are to indicates the variation for $\mathrm{t\ell\overline{\ell}q}$ in the 4$\ell$ category. |
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Additional Figure 4:
Plots showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for a given Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The values in upper right of each plot are to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-a:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{b} \mathrm{W}}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-b:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c ^{-}_{\varphi Q}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-c:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{t} \mathrm{G}}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-d:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{t} \mathrm{W}}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-e:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{t} \mathrm{Z}}}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 4-f:
Plot showing the relative change in the expected yield for the sum of the signal processes in each event category. The ``$\Delta$Yield'' refers to the change in expected yield before fitting (prefit) and after (postfit). The yield difference is normalized to the prefit yield of the process in the corresponding category. The vertical bars represent the maximum variation for the ${{c _{\mathrm{t} \varphi }}}$ Wilson Coefficient within the corresponding 2$\sigma$ confidence interval. The value in upper right of the plot is to indicate the variation for $\mathrm{t \ell\ell q}$ in the 4$\ell$ category. |
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Additional Figure 5:
Expected yields when setting the Wilson Coefficients (WCs) to the SM value of zero and all nuisance parameters to their best fit values. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 5-a:
Legend for the figure. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 5-b:
Expected yields when setting the Wilson Coefficients (WCs) to the SM value of zero and all nuisance parameters to their best fit values. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 6:
Expected yields when setting the Wilson Coefficients (WCs) to 1/6 (left) and 2/6 (right) of their final values on the first row, 3/6 (left) and 4/6 (right) of their final values on the second row, and 5/6 of their final values on the last row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 6-a:
Legend for the following figures. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 6-b:
Expected yields when setting the Wilson Coefficients (WCs) to 1/6 of their final values on the first row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 6-c:
Expected yields when setting the Wilson Coefficients (WCs) to 2/6 of their final values on the first row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 6-d:
Expected yields when setting the Wilson Coefficients (WCs) to 3/6 of their final values on the first row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 6-e:
Expected yields when setting the Wilson Coefficients (WCs) to 4/6 of their final values on the first row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 6-f:
Expected yields when setting the Wilson Coefficients (WCs) to 5/6 of their final values on the first row. The nuisance parameters are all kept at their final postfit values. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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Additional Figure 7:
Expected yields when setting the Wilson Coefficients (WCs) to the SM value of zero and all nuisance parameters to their initial values (no correlations are accounted for) for all 35 analysis bins. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 7-a:
Legend for the figure. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 7-b:
Expected yields when setting the Wilson Coefficients (WCs) to the SM value of zero and all nuisance parameters to their initial values (no correlations are accounted for) for all 35 analysis bins. |
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Additional Figure 8:
Expected yields when setting the Wilson Coefficients (WCs) to their best fit vales for all 35 analysis bins. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 8-a:
Legend for the figure. "Conv." refers to the photon conversion background, "Charge misid." is the lepton charge mismeasurement background, and "Misid. leptons" is the background from misidentified leptons. |
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Additional Figure 8-b:
Expected yields when setting the Wilson Coefficients (WCs) to their best fit vales for all 35 analysis bins. The postfit values of the WCs are obtained from performing the fit over all WCs simultaneously. |
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