CMS-HIG-19-014 ; CERN-EP-2022-019 | ||
Search for Higgs boson decays to a Z boson and a photon in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
CMS Collaboration | ||
27 April 2022 | ||
JHEP 05 (2023) 233 | ||
Abstract: Results are presented from a search for the Higgs boson decay H $\to$ Z$\gamma$, where Z $\to \ell^{+}\ell^{-}$ with ${\ell} =$ e or $\mu$. The search is performed using a sample of proton-proton (pp) collision data at a center-of-mass energy of 13 TeV, recorded by the CMS experiment at the LHC, corresponding to an integrated luminosity of 138 fb$^{-1}$. Events are assigned to mutually exclusive categories, which exploit differences in both event topology and kinematics of distinct Higgs production mechanisms to enhance signal sensitivity. The signal strength $\mu$, defined as the product of the cross section and the branching fraction [${{\sigma(pp\to\mathrm{H})} {\mathcal{B}(\mathrm{H \to Z\gamma})} } $] relative to the standard model prediction, is extracted from a simultaneous fit to the ${{\ell^{+}\ell^{-}} \gamma}$ invariant mass distributions in all categories and is found to be $\mu=$ 2.4 $\pm$ 0.9 for a Higgs boson mass of 125.38 GeV. The statistical significance of the observed excess of events is 2.7 standard deviations. This measurement corresponds to ${{\sigma(pp\to\mathrm{H})} {\mathcal{B}(\mathrm{H \to Z\gamma})} } =$ 0.21 $\pm$ 0.08 pb. The observed (expected) upper limit at 95% confidence level on $\mu$ is 4.1 (1.8). The ratio of branching fractions ${{\mathcal{B}(\mathrm{H \to Z\gamma})} /{\mathcal{B}({\mathrm{H}\to\gamma\gamma} )} }$ is measured to be 1.5$^{+0.7}_{-0.6}$, which agrees with the standard model prediction of 0.69 $\pm$ 0.04 at the 1.5 standard deviation level. | ||
Links: e-print arXiv:2204.12945 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; Physics Briefing ; CADI line (restricted) ; |
Figures | |
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Figure 1:
Feynman diagrams for H $\to$ Z$\gamma$ decay. |
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Figure 2:
The ${\mathcal {D}_{\text {VBF}}}$ (left) and ${\mathcal {D_{\text {kin}}}}$ (right) distributions for signal, simulated background, and data. The ${\mathcal {D}_{\text {VBF}}}$ distribution includes only dijet-tagged events, and the ${\mathcal {D_{\text {kin}}}}$ distribution includes only untagged events. The sum of contributions from all signal production mechanisms is shown by the blue line, while the contribution from only the VBF mechanism is shown by the red line. Both contributions are scaled by a factor of 10. The uncertainty band incorporates all statistical and systematic uncertainties in the expected background. The dashed lines indicate the boundaries for the dijet and untagged categories. The gray shaded region in the ${\mathcal {D_{\text {kin}}}}$ distribution is excluded from the analysis. |
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Figure 2-a:
The ${\mathcal {D}_{\text {VBF}}}$ ${\mathcal {D_{\text {kin}}}}$ distribution for signal, simulated background, and data. |
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Figure 2-b:
The ${\mathcal {D}_{\text {VBF}}}$ ${\mathcal {D_{\text {kin}}}}$ distribution for signal, simulated background, and data. The distribution includes only untagged events. The sum of contributions from all signal production mechanisms is shown by the blue line, scaled by a factor of 10. The uncertainty band incorporates all statistical and systematic uncertainties in the expected background. The dashed lines indicate the boundaries for the dijet and untagged categories. The gray shaded region is excluded from the analysis. |
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Figure 3:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the lepton-tagged (upper left), dijet 1 (upper right), dijet 2 (lower left), and dijet 3 (lower right) categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 3-a:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the lepton-tagged category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 3-b:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the dijet 1 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 3-c:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the dijet 2 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 3-d:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the dijet 3 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 4:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the untagged 1 (upper left), untagged 2 (upper right), untagged 3 (lower left), and untagged 4 (lower right) categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 4-a:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the untagged 1 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 4-b:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the untagged 2 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 4-c:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the untagged 3 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 4-d:
Fits to the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ data distribution in the untagged 4 category. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 5:
Sum over all categories of the data points and signal-plus-background model after the simultaneous fit to each ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ distribution. The contribution from each category is weighted by $S/(S+B)$, as defined in the text. In the upper panel, the red solid line shows the signal-plus-background fit. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal weighted by $S/(S+B)$ and scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown. |
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Figure 6:
Observed signal strength ($\mu $) for an SM Higgs boson with $ {m_{\mathrm{H}}} = $ 125.38 GeV. The labels "untagged combined," "dijet combined," and "combined" represent the results obtained from simultaneous fits of the untagged categories, dijet categories, and full set of categories, respectively. The black solid line shows $\mu =$ 1, and the red dashed line shows the best fit value $\hat{\mu}= $ 2.4 $\pm$ 0.9 of all categories combined. The category compatibility $p$-value, described in the text, is 0.02, corresponding to 2.3 standard deviations. |
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Figure 7:
Upper limit (95% CL) on the signal strength ($\mu $) relative to the SM prediction, as a function of the assumed value of the Higgs boson mass used in the fit. |
Tables | |
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Table 1:
Summary of the category definitions. The lepton-tagged category requires at least one additional electron or muon. Dijet categories are defined by regions of ${\mathcal {D}_{\text {VBF}}}$ and untagged categories are defined by regions of ${\mathcal {D_{\text {kin}}}}$. |
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Table 2:
Yields and approximate significance ($S/\sqrt {B}$) for each category, where $S$ and $B$ are the expected number of signal and background events in the narrowest ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ interval containing 95% of the expected signal distribution. Also shown is the ${m_{{{\ell^{+} \ell^{-}} \gamma}}}$ resolution, computed using the narrowest interval containing 68% of the expected signal distribution. |
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Table 3:
Sources of systematic uncertainty affecting the simulated signal. The normalization effect on the expected yield, or the effect on the signal shape parameters, is given as indicated, with the values averaged over all event categories. The third column shows the uncertainties that have a correlated effect across the three data-taking periods. |
Summary |
A search is performed for a standard model (SM) Higgs boson decaying into a lepton pair (${\mathrm{e^{+}}\mathrm{e^{-}}}$ or ${\mu^{+}\mu^{-}} $) and a photon with ${m_{{\ell^{+}\ell^{-}} }} > $ 50 GeV. The analysis is performed using a sample of proton-proton (pp) collision data at $\sqrt{s} = $ 13 TeV, corresponding to an integrated luminosity of 138 fb$^{-1}$. The main contribution to this final state is from Higgs boson decays to a Z boson and a photon ($\mathrm{H \to Z\gamma}\to{{\ell^{+}\ell^{-}} \gamma} $). The best fit value of the signal strength $\hat{\mu}$ for ${m_{\mathrm{H}}} =$ 125.38 GeV is $\hat{\mu}=$ 2.4$^{+0.8}_{-0.9}$ (stat) $^{+0.3}_{-0.2}$ (syst) $=$ 2.4 $\pm$ 0.9. This measurement corresponds to ${{\sigma(pp\to\mathrm{H})} {\mathcal{B}(\mathrm{H \to Z\gamma})} } =$ 0.21 $\pm$ 0.08 pb. The measured value is 1.6 standard deviations higher than the SM prediction. The observed (expected) local significance is 2.7 (1.2) standard deviations, where the expected significance is determined for the SM hypothesis. The observed (expected) upper limit at 95% confidence level on $\mu$ is 4.1 (1.8). In addition, a combined fit with the ${\mathrm{H}\to\gamma\gamma}$ analysis of the same data set [18] is performed to measure the ratio ${{\mathcal{B}(\mathrm{H \to Z\gamma})} /{\mathcal{B}({\mathrm{H}\to\gamma\gamma} )} } =$ 1.5$^{+0.7}_{-0.6} $, which is consistent with the ratio of 0.69 $\pm$ 0.04 predicted by the SM at the 1.5 standard deviation level. |
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