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CMS-PAS-EXO-23-010
Search for nonresonant new physics in high-mass dilepton events in association with b-tagged jets
Abstract: A search for nonresonant new physics phenomena in high-mass dilepton events produced in association with b-tagged jets is performed using the data collected by the CMS experiment at the CERN LHC at a center-of-mass energy of 13 TeV. The analysis considers two EFT-based models with 6-dimensional operators involving four fermion contact interactions between two leptons (electrons and muons) and b or s quarks ($ \mathrm{bb\ell\ell} $ and $ \mathrm{bs\ell\ell} $). The analysis considers two lepton flavor combinations ($ \mathrm{ee} $ and $ \mu\mu $) and classifies events as having 0, 1, and $ \geq 2 \mathrm{b} $-tagged jets in the final state. No significant excess is observed over the smoothly falling standard model background. Upper limits on the product of production cross section and branching fraction of the new physics are set. These translate into lower limits on the energy scale $ \Lambda $ of 8.3 to 9.0 TeV in the $ \mathrm{bb\ell\ell} $ model, depending on model parameters, and on the ratio of energy scale and coupling $ \Lambda/g_{*} $ of 2.0 to 2.6 TeV in the $ \mathrm{bs\ell\ell} $ model. The latter represent the most stringent limits on this model to date. Lepton flavor universality is also tested by comparing the dielectron and dimuon mass spectra for different b-tagged jet multiplicities.
Figures & Tables Summary References CMS Publications
Figures

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Figure 1:
Representative Feynman diagrams for the production of dileptons via the $ \mathrm{b}\bar{\mathrm{b}}\ell^{+}\ell^{-} $ operator at the LHC, in association with 0 (left), 1 (center), and 2 (right) b quarks.

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Figure 2:
Representative Feynman diagrams for the production of dileptons via the $ \mathrm{b} \mathrm{s}\ell^{+}\ell^{-} $ operator at the LHC within the EFT approach.

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Figure 2-a:
Representative Feynman diagrams for the production of dileptons via the $ \mathrm{b} \mathrm{s}\ell^{+}\ell^{-} $ operator at the LHC within the EFT approach.

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Figure 2-b:
Representative Feynman diagrams for the production of dileptons via the $ \mathrm{b} \mathrm{s}\ell^{+}\ell^{-} $ operator at the LHC within the EFT approach.

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Figure 3:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 0 b jet (left) and $ \mu\mu $ + 0 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 3-a:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 0 b jet (left) and $ \mu\mu $ + 0 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 3-b:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 0 b jet (left) and $ \mu\mu $ + 0 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 4:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 1 b jet (left) and $ \mu\mu $ + 1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 4-a:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 1 b jet (left) and $ \mu\mu $ + 1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 4-b:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + 1 b jet (left) and $ \mu\mu $ + 1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 5:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + $ > $1 b jet (left) and $ \mu\mu $ + $ > $1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 5-a:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + $ > $1 b jet (left) and $ \mu\mu $ + $ > $1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 5-b:
Observed $ m_{\ell\ell} $ for the data, and the post-fit backgrounds (stacked histograms), in the signal region for $ \mathrm{e}\mathrm{e} $ + $ > $1 b jet (left) and $ \mu\mu $ + $ > $1 b jet (right) channels. The lower panels show ratios of the data to the pre-fit background prediction and post-fit background yield as red open squares and blue points, respectively. The dashed band in the lower panels indicates the systematic component of the post-fit uncertainty. The solid lines in the upper panel corresponds to the $ \mathrm{b}\mathrm{b}\ell\ell $ signal expectation, for $ \Lambda = $ 6 TeV and 18 TeV.

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Figure 6:
Ratio of the differential dilepton production cross section in the dimuon and dielectron channels as a function of dilepton mass in 0b final state (left) and 1b + 2b final state (right). The ratio is obtained after correcting the reconstructed mass spectra to particle level. The error bars include both statistical and systematic uncertainties.

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Figure 6-a:
Ratio of the differential dilepton production cross section in the dimuon and dielectron channels as a function of dilepton mass in 0b final state (left) and 1b + 2b final state (right). The ratio is obtained after correcting the reconstructed mass spectra to particle level. The error bars include both statistical and systematic uncertainties.

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Figure 6-b:
Ratio of the differential dilepton production cross section in the dimuon and dielectron channels as a function of dilepton mass in 0b final state (left) and 1b + 2b final state (right). The ratio is obtained after correcting the reconstructed mass spectra to particle level. The error bars include both statistical and systematic uncertainties.

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Figure 7:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mathrm{e}\mathrm{e} $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 7-a:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mathrm{e}\mathrm{e} $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 7-b:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mathrm{e}\mathrm{e} $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 7-c:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mathrm{e}\mathrm{e} $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 7-d:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mathrm{e}\mathrm{e} $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 8:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mu\mu $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 8-a:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mu\mu $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 8-b:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mu\mu $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 8-c:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mu\mu $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 8-d:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{b}\ell\ell $ signal with different chirality condition in $ \mu\mu $ channel with $ \geq $ 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal.

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Figure 9:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.

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Figure 9-a:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.

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Figure 9-b:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 0 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.

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Figure 10:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 1 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.

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Figure 10-a:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 1 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.

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Figure 10-b:
Upper limits at 95% CL on the product of the production cross section and the branching fraction for $ \mathrm{b}\mathrm{s}\ell\ell $ signal in $ \mathrm{e}\mathrm{e} $ channel (left) and $ \mu\mu $ channel (right) with 1 b-tagged jets. The shaded bands correspond to the 68 and 95% quantiles for the expected limits. The red line corresponds to the theoretical predictions for the $ \mathrm{b}\mathrm{s}\ell\ell $ signal.
Tables

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Table 1:
Overview of the signal and control regions.

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Table 2:
Measured $ SF_{t\bar{t}} $ in OS $ \mathrm{e}\mu $ control region for BB region. The errors are statistical uncertainty in data and MC yields.

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Table 3:
Measured $ SF_{t\bar{t}} $ in OS $ \mathrm{e}\mu $ control region for BE region. The errors are statistical uncertainty in data and MC yields.

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Table 4:
Observed scale factor and corresponding uncertainty in the $ Z $ boson control region for BB region in $ \mathrm{e}\mathrm{e} $ channel.

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Table 5:
Observed scale factor and corresponding uncertainty in the $ Z $ boson control region for BE region in $ \mathrm{e}\mathrm{e} $ channel.

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Table 6:
Observed scale factor and corresponding uncertainty in the $ Z $ boson control region for BB region in $ \mu\mu $ channel.

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Table 7:
Observed scale factor and corresponding uncertainty in the $ Z $ boson control region for BE region in $ \mu\mu $ channel.

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Table 8:
Scale of different systematic uncertainties for DY+jets background in the last two mass bins for $ \mathrm{e}\mathrm{e} $ channel.

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Table 9:
Scale of different systematic uncertainties for DY+jets background in the last two mass bins for $ \mu\mu $ channel.

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Table 10:
Event yields for $ \mathrm{e}\mathrm{e} $ channel in 0b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 11:
Event yields for $ \mathrm{e}\mathrm{e} $ channel in 1b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 12:
Event yields for $ \mathrm{e}\mathrm{e} $ channel in 2b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 13:
Event yields for $ \mu\mu $ channel in 0b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 14:
Event yields for $ \mu\mu $ channel in 1b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 15:
Event yields for $ \mu\mu $ channel in 2b final state. The uncertainties given with the yields include both statistical and systematic contributions.

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Table 16:
Lower limits at 95% CL on the energy scale $ \Lambda $ in the $ \mathrm{b}\mathrm{b}\ell\ell $ signal model in TeV for constructive left-left (ConLL), left-right (ConLR), right-left (ConRL), and right-right (ConRR) chirality structures in the dielectron and dimuon channels and the combination of the two.

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Table 17:
Lower limits at 95% CL on $ \Lambda/g_{*} $ in the $ \mathrm{b}\mathrm{s}\ell\ell $ signal model in TeV for 0 b channel. Shown are the expected and observed limits in the dielectron and dimuon channels and the combination of the two.

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Table 18:
Lower limits at 95% CL on $ \Lambda/g_{*} $ in the $ \mathrm{b}\mathrm{s}\ell\ell $ signal model in TeV for 1 b channel. Shown are the expected and observed limits in the dielectron and dimuon channels and the combination of the two.

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Table 19:
Lower limits at 95% CL on $ \Lambda/g_{*} $ in the $ \mathrm{b}\mathrm{s}\ell\ell $ signal model in TeV for combined (0b+1b) channel. Shown are the expected and observed limits in the dielectron and dimuon channels and the combination of the two.
Summary
A search for new physics in the high mass dilepton final state produced in association with b-jets has been performed, focusing on nonresonant phenomena. Two models of nonresonant signatures have been considered. In case of a four-fermion contact interaction in $ \mathrm{b}\mathrm{b}\ell\ell $ production, lower limits on the scale of new physics ($ \Lambda $) range are set depending on the helicity structure of the interaction and the sign of its interference with the SM DY background. The observed limit is found to be around 8.3--9.0 TeV for the $ \mathrm{b}\mathrm{b}\ell\ell $ signal based on different chirality conditions. In the $ \mathrm{b}\mathrm{s}\ell\ell $ model, lower limits on the ratio of the energy scale of new physics to the coupling ($ \Lambda/g_{*} $) are set ranging from 1.9 to 2.2 TeV depending on the channel and 2.4 TeV for the combination of all the channels, using all data collected during the Run 2 data taking period. The limits on the $ \mathrm{b}\mathrm{s}\ell\ell $ model are the most stringent to date. Besides this, the dielectron and dimuon invariant mass spectra are corrected for the detector effects and, are compared at the TeV scale. No significant deviation in the lepton flavor ratio from the SM expectation is observed.
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Compact Muon Solenoid
LHC, CERN