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CMS-PAS-B2G-16-028
Search for third-generation scalar leptoquarks decaying to a top quark and a $\tau$ lepton at $\sqrt{s}= $ 13 TeV
Abstract: A search for pair production of heavy scalar leptoquarks (LQs) decaying into a top quark and a $\tau$ lepton is presented. The search considers final states with an electron or a muon, one or two $\tau$ leptons decaying to hadrons, and additional jets. The data collected in proton-proton collisions in 2016 at $\sqrt{s}= $ 13 TeV with the CMS detector at the LHC, corresponding to an integrated luminosity of 35.9 fb$^{-1}$ are used. No evidence for pair production of leptoquarks is found. Upper limits on the production cross section are set as a function of LQ mass, assuming a branching fraction of unity for the decay $\mathrm{LQ}\to \mathrm{t} \tau$, excluding masses below 900 GeV at 95% confidence level. These results provide the most stringent exclusion limits on the production of scalar leptoquarks in the top quark and $\tau$ lepton decay channel to date.
Figures Summary References CMS Publications
Figures

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Figure 1-a:
Shape comparison between the signal region A and the corresponding control region, as a function of ${p_{\mathrm {T}}^{\mathrm{t}}}$, for simulated ${\mathrm{t} {}\mathrm{\bar{t}}}$ and W+jets events. Events with an opposite-sign $\mu {\tau _{\mathrm {h}}} $ pair are shown on the left, while those with a same-sign $\mu {\tau _{\mathrm {h}}} $ pair are shown on the right. The full selection is applied and the $ {S_{\text {T}}} $ categories are combined. All histograms are normalized to the total number of entries. The gray band in the ratio plot corresponds to the statistical uncertainty in the simulated samples.

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Figure 1-b:
Shape comparison between the signal region A and the corresponding control region, as a function of ${p_{\mathrm {T}}^{\mathrm{t}}}$, for simulated ${\mathrm{t} {}\mathrm{\bar{t}}}$ and W+jets events. Events with an opposite-sign $\mu {\tau _{\mathrm {h}}} $ pair are shown on the left, while those with a same-sign $\mu {\tau _{\mathrm {h}}} $ pair are shown on the right. The full selection is applied and the $ {S_{\text {T}}} $ categories are combined. All histograms are normalized to the total number of entries. The gray band in the ratio plot corresponds to the statistical uncertainty in the simulated samples.

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Figure 2:
Strategy for the background estimation in category B. The $ {{\mathrm{t} {}\mathrm{\bar{t}}} _{\mathrm {f}}} $ background in the signal region is derived from the control region $ {\mathrm {CR}_{\mathrm {B1}}} $. The $ {{\mathrm{t} {}\mathrm{\bar{t}}} _{\mathrm {p+f}}} $ background in the signal region is derived from the control region $ {\mathrm {CR}_{\mathrm {B2}}} $. To obtain an estimate of the $ {{\mathrm{t} {}\mathrm{\bar{t}}} _{\mathrm {f}}} $ background in the control region $ {\mathrm {CR}_{\mathrm {B2}}} $, the control region $ {\mathrm {CR}_{\mathrm {B1}}} $ is used.

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Figure 3-a:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the electron channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 3-b:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the electron channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 3-c:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the electron channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 3-d:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the electron channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 4-a:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the muon channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 4-b:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the muon channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 4-c:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the muon channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 4-d:
Distributions of $ {p_{\mathrm {T}}^{\mathrm{t}}} $ for events in the muon channel passing the full selection in category A. The events are separated into OS (top), SS (bottom), low $ {S_{\text {T}}} $ (left) and high $ {S_{\text {T}}} $ (right) categories. The hatched areas represent the total uncertainties of the SM background. In the bottom panel, the ratio of data to SM background is shown together with statistical (dark gray) and total (light gray) uncertainties of the total SM background.

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Figure 5-a:
Upper limits at 95% confidence level on the cross section times branching fraction squared (top) and the leptoquark mass as a function of the branching ratio (bottom) on the pair production of scalar leptoquarks decaying to a top quark and a $\tau $ lepton. The results include all search categories in the $\ell $+$ {\tau _{\mathrm {h}}} $+jets channels. In the top plot, the theory curve corresponds to the NLO cross section with uncertainties from PDF and scale variations [34].

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Figure 5-b:
Upper limits at 95% confidence level on the cross section times branching fraction squared (top) and the leptoquark mass as a function of the branching ratio (bottom) on the pair production of scalar leptoquarks decaying to a top quark and a $\tau $ lepton. The results include all search categories in the $\ell $+$ {\tau _{\mathrm {h}}} $+jets channels. In the top plot, the theory curve corresponds to the NLO cross section with uncertainties from PDF and scale variations [34].
Summary
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Compact Muon Solenoid
LHC, CERN