CMS-SMP-19-012 ; CERN-EP-2020-064 | ||
Measurements of production cross sections of WZ and same-sign WW boson pairs in association with two jets in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
CMS Collaboration | ||
4 May 2020 | ||
Phys. Lett. B 809 (2020) 135710 | ||
Abstract: Measurements of production cross sections of WZ and same-sign WW boson pairs in association with two jets in proton-proton collisions at $\sqrt{s} = $ 13 TeV at the LHC are reported. The data sample corresponds to an integrated luminosity of 137 fb$^{-1}$, collected with the CMS detector during 2016-2018. The measurements are performed in the leptonic decay modes $\mathrm{W}^\pm\mathrm{Z} \to \ell^\pm\nu\ell'^\pm\ell'^\mp$ and ${\mathrm{W}^\pm\mathrm{W}^\pm} \to \ell^\pm\nu\ell'^\pm\nu$, where $\ell, \ell' = $ e, $\mu$. Differential fiducial cross sections as functions of the invariant masses of the jet and charged lepton pairs, as well as of the leading-lepton transverse momentum, are measured for ${\mathrm{W}^\pm\mathrm{W}^\pm} $ production and are consistent with the standard model predictions. The dependence of differential cross sections on the invariant mass of the jet pair is also measured for WZ production. An observation of electroweak production of WZ boson pairs is reported with an observed (expected) significance of 6.8 (5.3) standard deviations. Constraints are obtained on the structure of quartic vector boson interactions in the framework of effective field theory. | ||
Links: e-print arXiv:2005.01173 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; CADI line (restricted) ; |
Figures & Tables | Summary | Additional Figures | References | CMS Publications |
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Figures | |
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Figure 1:
Representative Feynman diagrams of a VBS process contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ (left) and $ {\mathrm{W} \mathrm{Z}} $ (right) boson pairs decaying to leptons, and two forward jets. New physics (represented by a dashed circle) in the EW sector can modify the quartic gauge couplings. |
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Figure 1-a:
Representative Feynman diagram of a VBS process contributing to the EW-induced production of events containing $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons, and two forward jets. New physics (represented by a dashed circle) in the EW sector can modify the quartic gauge couplings. |
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Figure 1-b:
Representative Feynman diagram of a VBS process contributing to the EW-induced production of events containing $ {\mathrm{W} \mathrm{Z}} $ boson pairs decaying to leptons, and two forward jets. New physics (represented by a dashed circle) in the EW sector can modify the quartic gauge couplings. |
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Figure 2:
Representative Feynman diagrams of the QCD-induced production of $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ (left) and $ {\mathrm{W} \mathrm{Z}} $ (right) boson pairs decaying to leptons, and two jets. |
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Figure 2-a:
Representative Feynman diagram of the QCD-induced production of $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ boson pairs decaying to leptons, and two jets. |
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Figure 2-b:
Representative Feynman diagram of the QCD-induced production of $ {\mathrm{W} \mathrm{Z}} $ boson pairs decaying to leptons, and two jets. |
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Figure 3:
Distributions of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ (upper left) and $ {m_{\ell \ell}} $ (upper right) in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR, and the distributions of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ (lower left) and BDT score (lower right) in the $ {\mathrm{W} \mathrm{Z}} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The histograms for $ {\mathrm{t} \mathrm{V} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} \mathrm{V} $ and $ {\mathrm{t} \mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and $\mathrm{V} \mathrm{V} \mathrm{V} $ processes. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 3-a:
Distribution of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The histograms for $ {\mathrm{t} \mathrm{V} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} \mathrm{V} $ and $ {\mathrm{t} \mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and $\mathrm{V} \mathrm{V} \mathrm{V} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 3-b:
Distribution of $ {m_{\ell \ell}} $ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The histograms for $ {\mathrm{t} \mathrm{V} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} \mathrm{V} $ and $ {\mathrm{t} \mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and $\mathrm{V} \mathrm{V} \mathrm{V} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 3-c:
Distribution of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ in the $ {\mathrm{W} \mathrm{Z}} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The histograms for $ {\mathrm{t} \mathrm{V} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} \mathrm{V} $ and $ {\mathrm{t} \mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and $\mathrm{V} \mathrm{V} \mathrm{V} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 3-d:
Distribution of BDT score in the $ {\mathrm{W} \mathrm{Z}} $ SR. The predicted yields are shown with their best fit normalizations from the simultaneous fit. Vertical bars on data points represent the statistical uncertainty in the data. The histograms for $ {\mathrm{t} \mathrm{V} \mathrm {x}} $ backgrounds include the contributions from ${\mathrm{t} {}\mathrm{\bar{t}}} \mathrm{V} $ and $ {\mathrm{t} \mathrm{Z} \mathrm{q}} $ processes. The histograms for other backgrounds include the contributions from double parton scattering and $\mathrm{V} \mathrm{V} \mathrm{V} $ processes. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties in the predicted yields. |
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Figure 4:
The measured absolute (left) and normalized (right) $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $ (upper), $ {m_{\ell \ell}} $ (middle), and $ {{p_{\mathrm {T}}} ^{\text {max}}} $ (lower). The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-a:
The measured absolute $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-b:
The measured normalized $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-c:
The measured absolute $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {m_{\ell \ell}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-d:
The measured normalized $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {m_{\ell \ell}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-e:
The measured absolute $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {{p_{\mathrm {T}}} ^{\text {max}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 4-f:
The measured normalized $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ cross section measurements in bins of $ {{p_{\mathrm {T}}} ^{\text {max}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown (dashed blue). |
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Figure 5:
The measured absolute (left) and normalized (right) $ {\mathrm{W} \mathrm{Z}} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are shown (dashed blue). The MadGraph 5_aMC@NLO predictions in the EW total cross sections are also shown ((dark cyan). |
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Figure 5-a:
The measured absolute $ {\mathrm{W} \mathrm{Z}} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are shown (dashed blue). The MadGraph 5_aMC@NLO predictions in the EW total cross sections are also shown ((dark cyan). |
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Figure 5-b:
The measured normalized $ {\mathrm{W} \mathrm{Z}} $ cross section measurements in bins of $ {m_{{\mathrm {j}} {\mathrm {j}}}} $. The ratios of the predictions to the data are also shown. The measurements are compared with the predictions from MadGraph 5_aMC@NLO at LO. The shaded bands around the data points correspond to the measurement uncertainty. The error bars around the predictions correspond to the combined statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are shown (dashed blue). The MadGraph 5_aMC@NLO predictions in the EW total cross sections are also shown ((dark cyan). |
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Figure 6:
Distributions of $ {m_{\mathrm {T}}} (\mathrm{W} \mathrm{W})$ (left) in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR and $ {m_{\mathrm {T}}} (\mathrm{W} \mathrm{Z})$ (right) in the $ {\mathrm{W} \mathrm{Z}} $ SR. The gray bands include uncertainties from the predicted yields. The SM predicted yields are shown with their best fit normalizations from the corresponding fits. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to the total SM prediction. The solid lines show the signal predictions for two illustrative aQGC parameters. |
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Figure 6-a:
Distribution of $ {m_{\mathrm {T}}} (\mathrm{W} \mathrm{W})$ in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. The gray bands include uncertainties from the predicted yields. The SM predicted yields are shown with their best fit normalizations from the corresponding fits. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to the total SM prediction. The solid lines show the signal predictions for two illustrative aQGC parameters. |
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Figure 6-b:
Distribution of $ {m_{\mathrm {T}}} (\mathrm{W} \mathrm{Z})$ (right) in the $ {\mathrm{W} \mathrm{Z}} $ SR. The gray bands include uncertainties from the predicted yields. The SM predicted yields are shown with their best fit normalizations from the corresponding fits. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to the total SM prediction. The solid lines show the signal predictions for two illustrative aQGC parameters. |
Tables | |
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Table 1:
Summary of the selection requirements defining the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ SRs. The looser lepton $ {p_{\mathrm {T}}} $ requirement on the $ {\mathrm{W} \mathrm{Z}} $ selection refers to the trailing lepton from the Z boson decays. The $ {| {m_{\ell \ell}} - m_{\mathrm{Z}} |}$ requirement is applied to the dielectron final state only in the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ SR. |
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Table 2:
Relative systematic uncertainties in the EW $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ cross section measurements in units of percent. |
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Table 3:
List and description of all the input variables used in the BDT analysis for the $ {\mathrm{W} \mathrm{Z}} $ SR. |
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Table 4:
Expected yields from SM processes and observed data events in $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ SRs. The combination of the statistical and systematic uncertainties is shown. The expected yields are shown before the fit to the data (pre-fit) and with their best fit normalizations from the simultaneous fit (post-fit). The pre-fit uncertainties consider the expected values before the simultaneous fit to the data. |
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Table 5:
The measured inclusive cross sections for the EW $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, EW+QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $, EW $ {\mathrm{W} \mathrm{Z}} $, EW+QCD $ {\mathrm{W} \mathrm{Z}} $, and QCD $ {\mathrm{W} \mathrm{Z}} $ processes and the theoretical predictions with MadGraph 5_aMC@NLO at LO. The EW processes include the corresponding interference contributions. The theoretical uncertainties include statistical, PDF, and scale uncertainties. Predictions with applying the $\mathcal {O}({\alpha _S} \alpha ^6)$ and $\mathcal {O}(\alpha ^7)$ corrections to the MadGraph 5_aMC@NLO LO cross sections, as described in the text, are also shown. The predictions of the QCD $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ processes do not include additional corrections. All reported values are in fb. |
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Table 6:
Observed and expected lower and upper 95% CL limits on the parameters of the quartic operators T0, T1, T2, M0, M1, M6, M7, S0, and S1 in $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ channels, obtained without using any unitarization procedure. The last two columns show the observed and expected limits for the combination of the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ channels. Results are obtained by setting all other aQGCs parameters to zero. |
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Table 7:
Observed and expected lower and upper 95% CL limits on the parameters of the quartic operators T0, T1, T2, M0, M1, M6, M7, S0, and S1 in $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ channels by cutting the EFT expansion at the unitarity limit. The last two columns show the observed and expected limits for the combination of the $ {\mathrm{W} ^\pm \mathrm{W} ^\pm} $ and $ {\mathrm{W} \mathrm{Z}} $ channels. Results are obtained by setting all other aQGCs parameters to zero. |
Summary |
The production cross sections of WZ and same-sign WW boson pairs in association with two jets are measured in proton-proton collisions at a center-of-mass energy of 13 TeV. The data sample corresponds to an integrated luminosity of 137 fb$^{-1}$, collected with the CMS detector during 2016-18. The measurements are performed in the leptonic decay modes $\mathrm{W}^\pm\mathrm{Z} \to \ell^\pm\nu\ell'^\pm\ell'^\mp$ and ${\mathrm{W}^\pm\mathrm{W}^\pm} \to \ell^\pm\nu\ell'^\pm\nu$, where $\ell, \ell' = $ e, $\mu$. An observation of electroweak production of WZ boson pairs is reported with an observed (expected) significance of 6.8 (5.3) standard deviations. Differential cross sections as functions of the invariant masses of the jet and charged lepton pairs, as well as the leading-lepton transverse momentum, are measured for ${\mathrm{W}^\pm\mathrm{W}^\pm} $ production and are compared to the standard model predictions. Differential cross sections as a function of the invariant mass of the jet pair are also measured for WZ production. Stringent limits are set in the framework of effective field theory, with and without consideration of tree-level unitarity violation, on the dimension-8 operators T0, T1, T2, M0, M1, M6, M7, S0, and S1. |
Additional Figures | |
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Additional Figure 1:
Distributions of $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ (upper left), the $ {p_{\mathrm {T}}} $ of the two leading jets (upper right), the jet multiplicity by counting jets with $ {p_{\mathrm {T}}} > $ 30 GeV and $| \eta | < $ 4.7 (center left), $z_{\ell \ell}^{*}$ (center right), $ {{p_{\mathrm {T}}} ^{\mathrm {max}}} $ (bottom left), and $ {{| \Delta \eta _{{\mathrm {j}} {\mathrm {j}}} |}} $ (bottom right) in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-a:
Distribution of $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-b:
Distribution of $ {p_{\mathrm {T}}} $ of the two leading jets in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-c:
Distribution of the jet multiplicity by counting jets with $ {p_{\mathrm {T}}} > $ 30 GeV and $| \eta | < $ 4.7 in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-d:
Distribution of $z_{\ell \ell}^{*}$ in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-e:
Distribution of $ {{p_{\mathrm {T}}} ^{\mathrm {max}}} $ in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 1-f:
Distribution of $ {{| \Delta \eta _{{\mathrm {j}} {\mathrm {j}}} |}} $ in the $ {{\mathrm {W}}^\pm {\mathrm {W}}^\pm} $ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2:
Distributions of $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ (upper left), the $ {p_{\mathrm {T}}} $ of the two leading jets (upper right), the jet multiplicity by counting jets with $ {p_{\mathrm {T}}} > $ 30 GeV and $| \eta | < $ 4.7 (center left), $z_{3\ell}^{*}$ (center right), and $ {{p_{\mathrm {T}}} ^{\mathrm {max}}} $ (bottom) in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2-a:
Distribution of $ {\Delta \phi _{{\mathrm {j}} {\mathrm {j}}}} $ in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2-b:
Distribution of $ {p_{\mathrm {T}}} $ of the two leading jets in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2-c:
Distribution of the jet multiplicity by counting jets with $ {p_{\mathrm {T}}} > $ 30 GeV and $| \eta | < $ 4.7 in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2-d:
Distribution of $z_{3\ell}^{*}$ in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Additional Figure 2-e:
Distribution of $ {{p_{\mathrm {T}}} ^{\mathrm {max}}} $ in the WZ SR. The predicted yields are shown with their best-fit normalizations from the simultaneous fit. The overflow is included in the last bin. The bottom panel shows the ratio of the number of events observed in data to that of the total SM prediction. The gray bands represent the uncertainties from the predicted yields. |
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Compact Muon Solenoid LHC, CERN |